WO2005081944A3 - Ion source with controlled superposition of electrostatic and gas flow fields - Google Patents

Ion source with controlled superposition of electrostatic and gas flow fields Download PDF

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Publication number
WO2005081944A3
WO2005081944A3 PCT/US2005/005662 US2005005662W WO2005081944A3 WO 2005081944 A3 WO2005081944 A3 WO 2005081944A3 US 2005005662 W US2005005662 W US 2005005662W WO 2005081944 A3 WO2005081944 A3 WO 2005081944A3
Authority
WO
WIPO (PCT)
Prior art keywords
ion source
electrostatic
gas flow
flow fields
controlled superposition
Prior art date
Application number
PCT/US2005/005662
Other languages
French (fr)
Other versions
WO2005081944A2 (en
Inventor
Andreas Hieke
Original Assignee
Ciphergen Biosystems Inc
Andreas Hieke
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ciphergen Biosystems Inc, Andreas Hieke filed Critical Ciphergen Biosystems Inc
Priority to EP05723516A priority Critical patent/EP1735806A4/en
Priority to CA002604820A priority patent/CA2604820A1/en
Publication of WO2005081944A2 publication Critical patent/WO2005081944A2/en
Publication of WO2005081944A3 publication Critical patent/WO2005081944A3/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/0481—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for collisional cooling
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/062—Ion guides
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]

Abstract

Ion source devices with controlled superposition of electrostatic and gas flow fields to effect rapid collisional cooling with improved ion collection and collimation, analytical apparatus comprising such ion source devices, and methods for use are presented.
PCT/US2005/005662 2004-02-23 2005-02-22 Ion source with controlled superposition of electrostatic and gas flow fields WO2005081944A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP05723516A EP1735806A4 (en) 2004-02-23 2005-02-22 Ion source with controlled superposition of electrostatic and gas flow fields
CA002604820A CA2604820A1 (en) 2004-02-23 2005-02-22 Ion source with controlled superposition of electrostatic and gas flow fields

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US54725904P 2004-02-23 2004-02-23
US60/547,259 2004-02-23

Publications (2)

Publication Number Publication Date
WO2005081944A2 WO2005081944A2 (en) 2005-09-09
WO2005081944A3 true WO2005081944A3 (en) 2006-10-05

Family

ID=34910878

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2005/005662 WO2005081944A2 (en) 2004-02-23 2005-02-22 Ion source with controlled superposition of electrostatic and gas flow fields

Country Status (4)

Country Link
US (1) US7138642B2 (en)
EP (1) EP1735806A4 (en)
CA (1) CA2604820A1 (en)
WO (1) WO2005081944A2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8003934B2 (en) * 2004-02-23 2011-08-23 Andreas Hieke Methods and apparatus for ion sources, ion control and ion measurement for macromolecules
CA2604820A1 (en) * 2004-02-23 2005-09-09 Gemio Technologies, Inc. Ion source with controlled superposition of electrostatic and gas flow fields
US7994474B2 (en) * 2004-02-23 2011-08-09 Andreas Hieke Laser desorption ionization ion source with charge injection
US8378293B1 (en) * 2011-09-09 2013-02-19 Agilent Technologies, Inc. In-situ conditioning in mass spectrometer systems
CN103077879A (en) * 2013-01-10 2013-05-01 大连理工大学 Device and method for focusing electrospray diffusion ions
US10580632B2 (en) 2017-12-18 2020-03-03 Agilent Technologies, Inc. In-situ conditioning in mass spectrometry systems

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US6674071B2 (en) * 2001-12-06 2004-01-06 Bruker Daltonik Gmbh Ion-guide systems

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US6331702B1 (en) 1999-01-25 2001-12-18 University Of Manitoba Spectrometer provided with pulsed ion source and transmission device to damp ion motion and method of use
US6107628A (en) * 1998-06-03 2000-08-22 Battelle Memorial Institute Method and apparatus for directing ions and other charged particles generated at near atmospheric pressures into a region under vacuum
US6849847B1 (en) 1998-06-12 2005-02-01 Agilent Technologies, Inc. Ambient pressure matrix-assisted laser desorption ionization (MALDI) apparatus and method of analysis
DE19911801C1 (en) 1999-03-17 2001-01-11 Bruker Daltonik Gmbh Method and device for matrix-assisted laser desorption ionization of substances
WO2000077822A2 (en) 1999-06-11 2000-12-21 Perseptive Biosystems, Inc. Method and apparatus for determining molecular weight of labile molecules
US6153880A (en) 1999-09-30 2000-11-28 Agilent Technologies, Inc. Method and apparatus for performance improvement of mass spectrometers using dynamic ion optics
US6545268B1 (en) 2000-04-10 2003-04-08 Perseptive Biosystems Preparation of ion pulse for time-of-flight and for tandem time-of-flight mass analysis
US6803565B2 (en) * 2001-05-18 2004-10-12 Battelle Memorial Institute Ionization source utilizing a multi-capillary inlet and method of operation
EP1402561A4 (en) 2001-05-25 2007-06-06 Analytica Of Branford Inc Atmospheric and vacuum pressure maldi ion source
US6946653B2 (en) 2001-11-27 2005-09-20 Ciphergen Biosystems, Inc. Methods and apparatus for improved laser desorption ionization tandem mass spectrometry
NZ537145A (en) * 2002-06-15 2006-09-29 Nfab Ltd Charged particle beam generator
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US20040089803A1 (en) * 2002-11-12 2004-05-13 Biospect, Inc. Directing and focusing of charged particles with conductive traces on a pliable substrate
US6979816B2 (en) * 2003-03-25 2005-12-27 Battelle Memorial Institute Multi-source ion funnel
US20040195503A1 (en) * 2003-04-04 2004-10-07 Taeman Kim Ion guide for mass spectrometers
CA2431603C (en) * 2003-06-10 2012-03-27 Micromass Uk Limited Mass spectrometer
US6967325B2 (en) * 2003-10-30 2005-11-22 Battelle Memorial Institute High performance ion mobility spectrometry using hourglass electrodynamic funnel and internal ion funnel
US20050194543A1 (en) * 2004-02-23 2005-09-08 Ciphergen Biosystems, Inc. Methods and apparatus for controlling ion current in an ion transmission device
CA2604820A1 (en) * 2004-02-23 2005-09-09 Gemio Technologies, Inc. Ion source with controlled superposition of electrostatic and gas flow fields
KR100575654B1 (en) * 2004-05-18 2006-05-03 엘지전자 주식회사 Nano technology applied carbon fiber negative ion generator
JP4384542B2 (en) * 2004-05-24 2009-12-16 株式会社日立ハイテクノロジーズ Mass spectrometer

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6583408B2 (en) * 2001-05-18 2003-06-24 Battelle Memorial Institute Ionization source utilizing a jet disturber in combination with an ion funnel and method of operation
US6674071B2 (en) * 2001-12-06 2004-01-06 Bruker Daltonik Gmbh Ion-guide systems

Also Published As

Publication number Publication date
US7138642B2 (en) 2006-11-21
US20050194542A1 (en) 2005-09-08
CA2604820A1 (en) 2005-09-09
EP1735806A2 (en) 2006-12-27
WO2005081944A2 (en) 2005-09-09
EP1735806A4 (en) 2009-08-19

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