GB1392599A
(en)
|
1971-07-28 |
1975-04-30 |
Mullard Ltd |
Semiconductor memory elements
|
US3881180A
(en)
|
1971-11-30 |
1975-04-29 |
Texas Instruments Inc |
Non-volatile memory cell
|
US3895360A
(en)
*
|
1974-01-29 |
1975-07-15 |
Westinghouse Electric Corp |
Block oriented random access memory
|
US4016588A
(en)
*
|
1974-12-27 |
1977-04-05 |
Nippon Electric Company, Ltd. |
Non-volatile semiconductor memory device
|
US4017888A
(en)
*
|
1975-12-31 |
1977-04-12 |
International Business Machines Corporation |
Non-volatile metal nitride oxide semiconductor device
|
US4151021A
(en)
*
|
1977-01-26 |
1979-04-24 |
Texas Instruments Incorporated |
Method of making a high density floating gate electrically programmable ROM
|
US4145703A
(en)
|
1977-04-15 |
1979-03-20 |
Supertex, Inc. |
High power MOS device and fabrication method therefor
|
US4173791A
(en)
|
1977-09-16 |
1979-11-06 |
Fairchild Camera And Instrument Corporation |
Insulated gate field-effect transistor read-only memory array
|
US4173766A
(en)
|
1977-09-16 |
1979-11-06 |
Fairchild Camera And Instrument Corporation |
Insulated gate field-effect transistor read-only memory cell
|
US4373248A
(en)
|
1978-07-12 |
1983-02-15 |
Texas Instruments Incorporated |
Method of making high density semiconductor device such as floating gate electrically programmable ROM or the like
|
DE2832388C2
(en)
*
|
1978-07-24 |
1986-08-14 |
Siemens Ag, 1000 Berlin Und 8000 Muenchen |
Process for the production of MNOS and MOS transistors in silicon gate technology on a semiconductor substrate
|
US4360900A
(en)
|
1978-11-27 |
1982-11-23 |
Texas Instruments Incorporated |
Non-volatile semiconductor memory elements
|
US4247861A
(en)
|
1979-03-09 |
1981-01-27 |
Rca Corporation |
High performance electrically alterable read-only memory (EAROM)
|
DE2923995C2
(en)
|
1979-06-13 |
1985-11-07 |
Siemens AG, 1000 Berlin und 8000 München |
Process for the production of integrated MOS circuits with MOS transistors and MNOS memory transistors in silicon gate technology
|
JPS5656677A
(en)
|
1979-10-13 |
1981-05-18 |
Toshiba Corp |
Semiconductor memory device
|
US4281397A
(en)
*
|
1979-10-29 |
1981-07-28 |
Texas Instruments Incorporated |
Virtual ground MOS EPROM or ROM matrix
|
DE2947350A1
(en)
*
|
1979-11-23 |
1981-05-27 |
Siemens AG, 1000 Berlin und 8000 München |
METHOD FOR PRODUCING MNOS STORAGE TRANSISTORS WITH A VERY SHORT CHANNEL LENGTH IN SILICON GATE TECHNOLOGY
|
JPS56120166A
(en)
|
1980-02-27 |
1981-09-21 |
Hitachi Ltd |
Semiconductor ic device and manufacture thereof
|
US4342102A
(en)
*
|
1980-06-18 |
1982-07-27 |
Signetics Corporation |
Semiconductor memory array
|
US4380057A
(en)
|
1980-10-27 |
1983-04-12 |
International Business Machines Corporation |
Electrically alterable double dense memory
|
US4521796A
(en)
*
|
1980-12-11 |
1985-06-04 |
General Instrument Corporation |
Memory implant profile for improved channel shielding in electrically alterable read only memory semiconductor device
|
DE3174858D1
(en)
|
1980-12-25 |
1986-07-24 |
Fujitsu Ltd |
Nonvolatile semiconductor memory device
|
US4448400A
(en)
|
1981-07-13 |
1984-05-15 |
Eliyahou Harari |
Highly scalable dynamic RAM cell with self-signal amplification
|
US4404747A
(en)
|
1981-07-29 |
1983-09-20 |
Schur, Inc. |
Knife and sheath assembly
|
US4389705A
(en)
*
|
1981-08-21 |
1983-06-21 |
Mostek Corporation |
Semiconductor memory circuit with depletion data transfer transistor
|
US4388705A
(en)
*
|
1981-10-01 |
1983-06-14 |
Mostek Corporation |
Semiconductor memory circuit
|
US4435786A
(en)
|
1981-11-23 |
1984-03-06 |
Fairchild Camera And Instrument Corporation |
Self-refreshing memory cell
|
US4494016A
(en)
|
1982-07-26 |
1985-01-15 |
Sperry Corporation |
High performance MESFET transistor for VLSI implementation
|
US4527257A
(en)
*
|
1982-08-25 |
1985-07-02 |
Westinghouse Electric Corp. |
Common memory gate non-volatile transistor memory
|
JPS5949022A
(en)
*
|
1982-09-13 |
1984-03-21 |
Toshiba Corp |
Multi-value logical circuit
|
US4613956A
(en)
|
1983-02-23 |
1986-09-23 |
Texas Instruments Incorporated |
Floating gate memory with improved dielectric
|
US4769340A
(en)
|
1983-11-28 |
1988-09-06 |
Exel Microelectronics, Inc. |
Method for making electrically programmable memory device by doping the floating gate by implant
|
US4725984A
(en)
|
1984-02-21 |
1988-02-16 |
Seeq Technology, Inc. |
CMOS eprom sense amplifier
|
JPS60182174A
(en)
|
1984-02-28 |
1985-09-17 |
Nec Corp |
Non-volatile semiconductor memory
|
KR930007195B1
(en)
|
1984-05-23 |
1993-07-31 |
가부시끼가이샤 히다찌세이사꾸쇼 |
Semiconductor device and its manufacturing method
|
US5352620A
(en)
|
1984-05-23 |
1994-10-04 |
Hitachi, Ltd. |
Method of making semiconductor device with memory cells and peripheral transistors
|
US4665426A
(en)
|
1985-02-01 |
1987-05-12 |
Advanced Micro Devices, Inc. |
EPROM with ultraviolet radiation transparent silicon nitride passivation layer
|
EP0199305B1
(en)
|
1985-04-18 |
1992-03-18 |
Nec Corporation |
Programmable read only memory operable with reduced programming power consumption
|
US4667217A
(en)
*
|
1985-04-19 |
1987-05-19 |
Ncr Corporation |
Two bit vertically/horizontally integrated memory cell
|
JPH0831789B2
(en)
|
1985-09-04 |
1996-03-27 |
沖電気工業株式会社 |
Output circuit
|
US4742491A
(en)
*
|
1985-09-26 |
1988-05-03 |
Advanced Micro Devices, Inc. |
Memory cell having hot-hole injection erase mode
|
US4760555A
(en)
|
1986-04-21 |
1988-07-26 |
Texas Instruments Incorporated |
Memory array with an array reorganizer
|
JPH0828431B2
(en)
*
|
1986-04-22 |
1996-03-21 |
日本電気株式会社 |
Semiconductor memory device
|
US4758869A
(en)
|
1986-08-29 |
1988-07-19 |
Waferscale Integration, Inc. |
Nonvolatile floating gate transistor structure
|
US5168334A
(en)
|
1987-07-31 |
1992-12-01 |
Texas Instruments, Incorporated |
Non-volatile semiconductor memory
|
US4780424A
(en)
|
1987-09-28 |
1988-10-25 |
Intel Corporation |
Process for fabricating electrically alterable floating gate memory devices
|
US4870470A
(en)
|
1987-10-16 |
1989-09-26 |
International Business Machines Corporation |
Non-volatile memory cell having Si rich silicon nitride charge trapping layer
|
US4839705A
(en)
|
1987-12-16 |
1989-06-13 |
Texas Instruments Incorporated |
X-cell EEPROM array
|
JPH07120720B2
(en)
*
|
1987-12-17 |
1995-12-20 |
三菱電機株式会社 |
Nonvolatile semiconductor memory device
|
US5159570A
(en)
|
1987-12-22 |
1992-10-27 |
Texas Instruments Incorporated |
Four memory state EEPROM
|
US4888735A
(en)
|
1987-12-30 |
1989-12-19 |
Elite Semiconductor & Systems Int'l., Inc. |
ROM cell and array configuration
|
US4857770A
(en)
|
1988-02-29 |
1989-08-15 |
Advanced Micro Devices, Inc. |
Output buffer arrangement for reducing chip noise without speed penalty
|
US5268870A
(en)
*
|
1988-06-08 |
1993-12-07 |
Eliyahou Harari |
Flash EEPROM system and intelligent programming and erasing methods therefor
|
US4941028A
(en)
*
|
1988-08-10 |
1990-07-10 |
Actel Corporation |
Structure for protecting thin dielectrics during processing
|
JPH0271493A
(en)
*
|
1988-09-06 |
1990-03-12 |
Mitsubishi Electric Corp |
Semiconductor memory device
|
US5042009A
(en)
*
|
1988-12-09 |
1991-08-20 |
Waferscale Integration, Inc. |
Method for programming a floating gate memory device
|
US5293563A
(en)
*
|
1988-12-29 |
1994-03-08 |
Sharp Kabushiki Kaisha |
Multi-level memory cell with increased read-out margin
|
US5120672A
(en)
|
1989-02-22 |
1992-06-09 |
Texas Instruments Incorporated |
Fabricating a single level merged EEPROM cell having an ONO memory stack substantially spaced from the source region
|
US5142495A
(en)
|
1989-03-10 |
1992-08-25 |
Intel Corporation |
Variable load for margin mode
|
DE3931596A1
(en)
|
1989-03-25 |
1990-10-04 |
Eurosil Electronic Gmbh |
VOLTAGE MULTIPLIER
|
US5172338B1
(en)
|
1989-04-13 |
1997-07-08 |
Sandisk Corp |
Multi-state eeprom read and write circuits and techniques
|
US4961010A
(en)
|
1989-05-19 |
1990-10-02 |
National Semiconductor Corporation |
Output buffer for reducing switching induced noise
|
US5104819A
(en)
*
|
1989-08-07 |
1992-04-14 |
Intel Corporation |
Fabrication of interpoly dielctric for EPROM-related technologies
|
US5027321A
(en)
*
|
1989-11-21 |
1991-06-25 |
Intel Corporation |
Apparatus and method for improved reading/programming of virtual ground EPROM arrays
|
US4992391A
(en)
|
1989-11-29 |
1991-02-12 |
Advanced Micro Devices, Inc. |
Process for fabricating a control gate for a floating gate FET
|
US5204835A
(en)
*
|
1990-06-13 |
1993-04-20 |
Waferscale Integration Inc. |
Eprom virtual ground array
|
EP0461904A3
(en)
*
|
1990-06-14 |
1992-09-09 |
Creative Integrated Systems, Inc. |
An improved semiconductor read-only vlsi memory
|
US5618710A
(en)
*
|
1990-08-03 |
1997-04-08 |
Vertex Pharmaceuticals, Inc. |
Crosslinked enzyme crystals
|
US5075245A
(en)
|
1990-08-03 |
1991-12-24 |
Intel Corporation |
Method for improving erase characteristics of buried bit line flash EPROM devices without using sacrificial oxide growth and removal steps
|
US5289406A
(en)
*
|
1990-08-28 |
1994-02-22 |
Mitsubishi Denki Kabushiki Kaisha |
Read only memory for storing multi-data
|
US5117389A
(en)
*
|
1990-09-05 |
1992-05-26 |
Macronix International Co., Ltd. |
Flat-cell read-only-memory integrated circuit
|
US5892013A
(en)
*
|
1990-09-13 |
1999-04-06 |
Novo Nordisk A/S |
Lipase variants
|
KR920006991A
(en)
*
|
1990-09-25 |
1992-04-28 |
김광호 |
High Voltage Generation Circuit of Semiconductor Memory Device
|
US5081371A
(en)
|
1990-11-07 |
1992-01-14 |
U.S. Philips Corp. |
Integrated charge pump circuit with back bias voltage reduction
|
JP2987193B2
(en)
*
|
1990-11-20 |
1999-12-06 |
富士通株式会社 |
Semiconductor storage device
|
US5094968A
(en)
|
1990-11-21 |
1992-03-10 |
Atmel Corporation |
Fabricating a narrow width EEPROM with single diffusion electrode formation
|
US5086325A
(en)
|
1990-11-21 |
1992-02-04 |
Atmel Corporation |
Narrow width EEPROM with single diffusion electrode formation
|
JP2612969B2
(en)
*
|
1991-02-08 |
1997-05-21 |
シャープ株式会社 |
Method for manufacturing semiconductor device
|
US6002614A
(en)
*
|
1991-02-08 |
1999-12-14 |
Btg International Inc. |
Memory apparatus including programmable non-volatile multi-bit memory cell, and apparatus and method for demarcating memory states of the cell
|
US5218569A
(en)
*
|
1991-02-08 |
1993-06-08 |
Banks Gerald J |
Electrically alterable non-volatile memory with n-bits per memory cell
|
JPH04311900A
(en)
|
1991-04-10 |
1992-11-04 |
Sharp Corp |
Semiconductor read only memory
|
JP2930440B2
(en)
|
1991-04-15 |
1999-08-03 |
沖電気工業株式会社 |
Semiconductor integrated circuit
|
US5424567A
(en)
*
|
1991-05-15 |
1995-06-13 |
North American Philips Corporation |
Protected programmable transistor with reduced parasitic capacitances and method of fabrication
|
US5142496A
(en)
*
|
1991-06-03 |
1992-08-25 |
Advanced Micro Devices, Inc. |
Method for measuring VT 's less than zero without applying negative voltages
|
JP3593550B2
(en)
*
|
1991-07-01 |
2004-11-24 |
ノルトマルク アルツナイミッテル ゲゼルシャフト ミット ベシュレンクテル ハフツング ウント コンパニー コマンディートゲゼルシャフト |
Use of lipase for pharmaceutical manufacturing
|
US5245572A
(en)
*
|
1991-07-30 |
1993-09-14 |
Intel Corporation |
Floating gate nonvolatile memory with reading while writing capability
|
JP2965415B2
(en)
*
|
1991-08-27 |
1999-10-18 |
松下電器産業株式会社 |
Semiconductor storage device
|
EP0740854B1
(en)
*
|
1991-08-29 |
2003-04-23 |
Hyundai Electronics Industries Co., Ltd. |
A self-aligned dual-bit split gate (dsg) flash eeprom cell
|
US5305262A
(en)
*
|
1991-09-11 |
1994-04-19 |
Kawasaki Steel Corporation |
Semiconductor integrated circuit
|
US5175120A
(en)
|
1991-10-11 |
1992-12-29 |
Micron Technology, Inc. |
Method of processing a semiconductor wafer to form an array of nonvolatile memory devices employing floating gate transistors and peripheral area having CMOS transistors
|
JPH05110114A
(en)
*
|
1991-10-17 |
1993-04-30 |
Rohm Co Ltd |
Nonvolatile semiconductor memory device
|
JP3358663B2
(en)
*
|
1991-10-25 |
2002-12-24 |
ローム株式会社 |
Semiconductor storage device and storage information reading method thereof
|
US5357134A
(en)
|
1991-10-31 |
1994-10-18 |
Rohm Co., Ltd. |
Nonvolatile semiconductor device having charge trap film containing silicon crystal grains
|
US5338954A
(en)
*
|
1991-10-31 |
1994-08-16 |
Rohm Co., Ltd. |
Semiconductor memory device having an insulating film and a trap film joined in a channel region
|
JPH05129284A
(en)
|
1991-11-06 |
1993-05-25 |
Sony Corp |
Method of setting condition of plasma sin forming film and manufacture of semiconductor device
|
US5260593A
(en)
|
1991-12-10 |
1993-11-09 |
Micron Technology, Inc. |
Semiconductor floating gate device having improved channel-floating gate interaction
|
JP2564067B2
(en)
*
|
1992-01-09 |
1996-12-18 |
株式会社東芝 |
Readout output circuit having sense circuit
|
US6222762B1
(en)
*
|
1992-01-14 |
2001-04-24 |
Sandisk Corporation |
Multi-state memory
|
JP2851962B2
(en)
|
1992-01-21 |
1999-01-27 |
シャープ株式会社 |
Semiconductor read-only memory
|
EP1032034A1
(en)
*
|
1992-01-22 |
2000-08-30 |
Macronix International Co., Ltd. |
Method of making memory device
|
US5324675A
(en)
*
|
1992-03-31 |
1994-06-28 |
Kawasaki Steel Corporation |
Method of producing semiconductor devices of a MONOS type
|
JPH05290584A
(en)
*
|
1992-04-08 |
1993-11-05 |
Nec Corp |
Semiconductor memory
|
US5657332A
(en)
*
|
1992-05-20 |
1997-08-12 |
Sandisk Corporation |
Soft errors handling in EEPROM devices
|
US5496753A
(en)
*
|
1992-05-29 |
1996-03-05 |
Citizen Watch, Co., Ltd. |
Method of fabricating a semiconductor nonvolatile storage device
|
JPH065823A
(en)
|
1992-06-19 |
1994-01-14 |
Toshiba Corp |
Nonvolatile semiconductor memory device and its application method
|
US5289412A
(en)
*
|
1992-06-19 |
1994-02-22 |
Intel Corporation |
High-speed bias-stabilized current-mirror referencing circuit for non-volatile memories
|
US5315541A
(en)
*
|
1992-07-24 |
1994-05-24 |
Sundisk Corporation |
Segmented column memory array
|
GB9217743D0
(en)
*
|
1992-08-19 |
1992-09-30 |
Philips Electronics Uk Ltd |
A semiconductor memory device
|
JP3036565B2
(en)
|
1992-08-28 |
2000-04-24 |
日本電気株式会社 |
Manufacturing method of nonvolatile semiconductor memory device
|
US5450354A
(en)
*
|
1992-08-31 |
1995-09-12 |
Nippon Steel Corporation |
Non-volatile semiconductor memory device detachable deterioration of memory cells
|
US5450341A
(en)
*
|
1992-08-31 |
1995-09-12 |
Nippon Steel Corporation |
Non-volatile semiconductor memory device having memory cells, each for at least three different data writable thereinto selectively and a method of using the same
|
US5412601A
(en)
*
|
1992-08-31 |
1995-05-02 |
Nippon Steel Corporation |
Non-volatile semiconductor memory device capable of storing multi-value data in each memory cell
|
US5412238A
(en)
*
|
1992-09-08 |
1995-05-02 |
National Semiconductor Corporation |
Source-coupling, split-gate, virtual ground flash EEPROM array
|
US5280420A
(en)
|
1992-10-02 |
1994-01-18 |
National Semiconductor Corporation |
Charge pump which operates on a low voltage power supply
|
US5350568A
(en)
*
|
1992-11-09 |
1994-09-27 |
Tetra Alfa Holdings, S.A. |
Method and apparatus for sterilizing cartons and breaking carton score lines
|
US5377153A
(en)
*
|
1992-11-30 |
1994-12-27 |
Sgs-Thomson Microelectronics, Inc. |
Virtual ground read only memory circuit
|
US5418743A
(en)
*
|
1992-12-07 |
1995-05-23 |
Nippon Steel Corporation |
Method of writing into non-volatile semiconductor memory
|
US5319593A
(en)
*
|
1992-12-21 |
1994-06-07 |
National Semiconductor Corp. |
Memory array with field oxide islands eliminated and method
|
DK154292D0
(en)
*
|
1992-12-23 |
1992-12-23 |
Novo Nordisk As |
NEW ENZYM
|
JPH07114792A
(en)
*
|
1993-10-19 |
1995-05-02 |
Mitsubishi Electric Corp |
Semiconductor memory
|
US5424978A
(en)
*
|
1993-03-15 |
1995-06-13 |
Nippon Steel Corporation |
Non-volatile semiconductor memory cell capable of storing more than two different data and method of using the same
|
DK39693D0
(en)
*
|
1993-04-02 |
1993-04-02 |
Novo Nordisk As |
ENZYME
|
US5393701A
(en)
*
|
1993-04-08 |
1995-02-28 |
United Microelectronics Corporation |
Layout design to eliminate process antenna effect
|
US5335198A
(en)
*
|
1993-05-06 |
1994-08-02 |
Advanced Micro Devices, Inc. |
Flash EEPROM array with high endurance
|
US5463586A
(en)
*
|
1993-05-28 |
1995-10-31 |
Macronix International Co., Ltd. |
Erase and program verification circuit for non-volatile memory
|
US5350710A
(en)
|
1993-06-24 |
1994-09-27 |
United Microelectronics Corporation |
Device for preventing antenna effect on circuit
|
US5400286A
(en)
*
|
1993-08-17 |
1995-03-21 |
Catalyst Semiconductor Corp. |
Self-recovering erase scheme to enhance flash memory endurance
|
US5477499A
(en)
|
1993-10-13 |
1995-12-19 |
Advanced Micro Devices, Inc. |
Memory architecture for a three volt flash EEPROM
|
US5828601A
(en)
*
|
1993-12-01 |
1998-10-27 |
Advanced Micro Devices, Inc. |
Programmed reference
|
JP3076185B2
(en)
*
|
1993-12-07 |
2000-08-14 |
日本電気株式会社 |
Semiconductor memory device and inspection method thereof
|
US5435481A
(en)
*
|
1994-01-18 |
1995-07-25 |
Motorola, Inc. |
Soldering process
|
US5440505A
(en)
*
|
1994-01-21 |
1995-08-08 |
Intel Corporation |
Method and circuitry for storing discrete amounts of charge in a single memory element
|
FR2715782B1
(en)
*
|
1994-01-31 |
1996-03-22 |
Sgs Thomson Microelectronics |
Programmable non-volatile bistable flip-flop, with predefined initial state, in particular for memory redundancy circuit.
|
FR2715758B1
(en)
*
|
1994-01-31 |
1996-03-22 |
Sgs Thomson Microelectronics |
Source-programmable, non-volatile flip-flop, especially for memory redundancy circuits.
|
US5418176A
(en)
*
|
1994-02-17 |
1995-05-23 |
United Microelectronics Corporation |
Process for producing memory devices having narrow buried N+ lines
|
DE4408152A1
(en)
*
|
1994-03-11 |
1995-09-14 |
Studiengesellschaft Kohle Mbh |
Immobilized lipases in hydrophobic sol-gel materials
|
DE69424771T2
(en)
*
|
1994-03-22 |
2000-10-26 |
St Microelectronics Srl |
Arrangement for reading a memory cell matrix
|
DK0755442T3
(en)
*
|
1994-05-04 |
2003-04-14 |
Genencor Int |
Lipases with improved resistance to surfactants
|
US5568085A
(en)
*
|
1994-05-16 |
1996-10-22 |
Waferscale Integration Inc. |
Unit for stabilizing voltage on a capacitive node
|
US5523972A
(en)
*
|
1994-06-02 |
1996-06-04 |
Intel Corporation |
Method and apparatus for verifying the programming of multi-level flash EEPROM memory
|
US5508968A
(en)
*
|
1994-08-12 |
1996-04-16 |
International Business Machines Corporation |
Dynamic random access memory persistent page implemented as processor register sets
|
US5822256A
(en)
*
|
1994-09-06 |
1998-10-13 |
Intel Corporation |
Method and circuitry for usage of partially functional nonvolatile memory
|
JPH08181284A
(en)
*
|
1994-09-13 |
1996-07-12 |
Hewlett Packard Co <Hp> |
Protective element and manufacture thereof
|
US5583808A
(en)
|
1994-09-16 |
1996-12-10 |
National Semiconductor Corporation |
EPROM array segmented for high performance and method for controlling same
|
US5523251A
(en)
*
|
1994-10-05 |
1996-06-04 |
United Microelectronics Corp. |
Method for fabricating a self aligned mask ROM
|
US5694356A
(en)
|
1994-11-02 |
1997-12-02 |
Invoice Technology, Inc. |
High resolution analog storage EPROM and flash EPROM
|
US5537358A
(en)
*
|
1994-12-06 |
1996-07-16 |
National Semiconductor Corporation |
Flash memory having adaptive sensing and method
|
US5661060A
(en)
*
|
1994-12-28 |
1997-08-26 |
National Semiconductor Corporation |
Method for forming field oxide regions
|
CA2142644C
(en)
*
|
1995-02-16 |
1996-11-26 |
Marc Etienne Bonneville |
Standby power circuit arrangement
|
US5518942A
(en)
*
|
1995-02-22 |
1996-05-21 |
Alliance Semiconductor Corporation |
Method of making flash EPROM cell having improved erase characteristics by using a tilt angle implant
|
US6353554B1
(en)
*
|
1995-02-27 |
2002-03-05 |
Btg International Inc. |
Memory apparatus including programmable non-volatile multi-bit memory cell, and apparatus and method for demarcating memory states of the cell
|
DE69524572T2
(en)
|
1995-04-28 |
2002-08-22 |
St Microelectronics Srl |
Sense amplifier circuit for semiconductor memory devices
|
KR100187656B1
(en)
*
|
1995-05-16 |
1999-06-01 |
김주용 |
Method for manufacturing a flash eeprom and the programming method
|
US6051220A
(en)
*
|
1995-05-31 |
2000-04-18 |
Medzyme N.V. And Simon Lodewijk Scharpe |
Composition to improve digestibility and utilization of nutrients
|
US6034896A
(en)
*
|
1995-07-03 |
2000-03-07 |
The University Of Toronto, Innovations Foundation |
Method of fabricating a fast programmable flash E2 PROM cell
|
KR970008496A
(en)
*
|
1995-07-04 |
1997-02-24 |
모리시다 요이치 |
MIS semiconductor device, manufacturing method thereof, and diagnostic method thereof
|
EP0753859B1
(en)
*
|
1995-07-14 |
2000-01-26 |
STMicroelectronics S.r.l. |
Method for setting the threshold voltage of a reference memory cell
|
JP2830800B2
(en)
*
|
1995-09-29 |
1998-12-02 |
日本電気株式会社 |
Current differential amplifier circuit
|
US5633603A
(en)
*
|
1995-12-26 |
1997-05-27 |
Hyundai Electronics Industries Co., Ltd. |
Data output buffer using pass transistors biased with a reference voltage and a precharged data input
|
US5748534A
(en)
*
|
1996-03-26 |
1998-05-05 |
Invox Technology |
Feedback loop for reading threshold voltage
|
US5777923A
(en)
*
|
1996-06-17 |
1998-07-07 |
Aplus Integrated Circuits, Inc. |
Flash memory read/write controller
|
US5712815A
(en)
*
|
1996-04-22 |
1998-01-27 |
Advanced Micro Devices, Inc. |
Multiple bits per-cell flash EEPROM capable of concurrently programming and verifying memory cells and reference cells
|
US5847441A
(en)
|
1996-05-10 |
1998-12-08 |
Micron Technology, Inc. |
Semiconductor junction antifuse circuit
|
US5715193A
(en)
*
|
1996-05-23 |
1998-02-03 |
Micron Quantum Devices, Inc. |
Flash memory system and method for monitoring the disturb effect on memory cell blocks due to high voltage conditions of other memory cell blocks
|
US5886927A
(en)
*
|
1996-06-11 |
1999-03-23 |
Nkk Corporation |
Nonvolatile memory device with verify function
|
EP0907954B1
(en)
*
|
1996-06-24 |
2000-06-07 |
Advanced Micro Devices, Inc. |
A method for a multiple bits-per-cell flash eeprom with page mode program and read
|
KR100265574B1
(en)
*
|
1996-06-29 |
2000-09-15 |
김영환 |
Sense amplifier for semiconductor memory apparatus
|
US5787484A
(en)
*
|
1996-08-08 |
1998-07-28 |
Micron Technology, Inc. |
System and method which compares data preread from memory cells to data to be written to the cells
|
US5812456A
(en)
*
|
1996-10-01 |
1998-09-22 |
Microchip Technology Incorporated |
Switched ground read for EPROM memory array
|
US5717632A
(en)
*
|
1996-11-27 |
1998-02-10 |
Advanced Micro Devices, Inc. |
Apparatus and method for multiple-level storage in non-volatile memories
|
TW367503B
(en)
*
|
1996-11-29 |
1999-08-21 |
Sanyo Electric Co |
Non-volatile semiconductor device
|
JP3532725B2
(en)
|
1997-02-27 |
2004-05-31 |
株式会社東芝 |
Semiconductor integrated circuit
|
JP3920415B2
(en)
*
|
1997-03-31 |
2007-05-30 |
三洋電機株式会社 |
Nonvolatile semiconductor memory device
|
US6252799B1
(en)
*
|
1997-04-11 |
2001-06-26 |
Programmable Silicon Solutions |
Device with embedded flash and EEPROM memories
|
US5805500A
(en)
*
|
1997-06-18 |
1998-09-08 |
Sgs-Thomson Microelectronics S.R.L. |
Circuit and method for generating a read reference signal for nonvolatile memory cells
|
JP3189740B2
(en)
*
|
1997-06-20 |
2001-07-16 |
日本電気株式会社 |
Data repair method for nonvolatile semiconductor memory
|
JP3039458B2
(en)
*
|
1997-07-07 |
2000-05-08 |
日本電気株式会社 |
Non-volatile semiconductor memory
|
IL125604A
(en)
*
|
1997-07-30 |
2004-03-28 |
Saifun Semiconductors Ltd |
Non-volatile electrically erasable and programmble semiconductor memory cell utilizing asymmetrical charge
|
US6768165B1
(en)
*
|
1997-08-01 |
2004-07-27 |
Saifun Semiconductors Ltd. |
Two bit non-volatile electrically erasable and programmable semiconductor memory cell utilizing asymmetrical charge trapping
|
US5926409A
(en)
*
|
1997-09-05 |
1999-07-20 |
Information Storage Devices, Inc. |
Method and apparatus for an adaptive ramp amplitude controller in nonvolatile memory application
|
US5940332A
(en)
*
|
1997-11-13 |
1999-08-17 |
Stmicroelectronics, Inc. |
Programmed memory with improved speed and power consumption
|
US5867429A
(en)
*
|
1997-11-19 |
1999-02-02 |
Sandisk Corporation |
High density non-volatile flash memory without adverse effects of electric field coupling between adjacent floating gates
|
JP3599541B2
(en)
*
|
1997-11-27 |
2004-12-08 |
シャープ株式会社 |
Nonvolatile semiconductor memory device
|
US5949728A
(en)
*
|
1997-12-12 |
1999-09-07 |
Scenix Semiconductor, Inc. |
High speed, noise immune, single ended sensing scheme for non-volatile memories
|
KR100327421B1
(en)
*
|
1997-12-31 |
2002-07-27 |
주식회사 하이닉스반도체 |
Program system of non-volatile memory device and programming method thereof
|
US5946258A
(en)
*
|
1998-03-16 |
1999-08-31 |
Intel Corporation |
Pump supply self regulation for flash memory cell pair reference circuit
|
US6046591A
(en)
*
|
1998-03-16 |
2000-04-04 |
General Electric Company |
MRI system with fractional decimation of acquired data
|
US6030871A
(en)
*
|
1998-05-05 |
2000-02-29 |
Saifun Semiconductors Ltd. |
Process for producing two bit ROM cell utilizing angled implant
|
US6215148B1
(en)
*
|
1998-05-20 |
2001-04-10 |
Saifun Semiconductors Ltd. |
NROM cell with improved programming, erasing and cycling
|
US6348711B1
(en)
*
|
1998-05-20 |
2002-02-19 |
Saifun Semiconductors Ltd. |
NROM cell with self-aligned programming and erasure areas
|
US6042823A
(en)
*
|
1998-07-02 |
2000-03-28 |
Amano Pharmaceuticals Co., Ltd. |
Enzyme composition and use thereof
|
GB9818548D0
(en)
*
|
1998-08-25 |
1998-10-21 |
Microbiological Res Authority |
Treatment of mucas hypersecretion
|
JP3999900B2
(en)
|
1998-09-10 |
2007-10-31 |
株式会社東芝 |
Nonvolatile semiconductor memory
|
DE69828966D1
(en)
*
|
1998-09-15 |
2005-03-17 |
St Microelectronics Srl |
Method for protecting the content of non-volatile memory cells
|
US6044019A
(en)
*
|
1998-10-23 |
2000-03-28 |
Sandisk Corporation |
Non-volatile memory with improved sensing and method therefor
|
US6134156A
(en)
*
|
1999-02-04 |
2000-10-17 |
Saifun Semiconductors Ltd. |
Method for initiating a retrieval procedure in virtual ground arrays
|
US6147904A
(en)
|
1999-02-04 |
2000-11-14 |
Tower Semiconductor Ltd. |
Redundancy method and structure for 2-bit non-volatile memory cells
|
US6108240A
(en)
*
|
1999-02-04 |
2000-08-22 |
Tower Semiconductor Ltd. |
Implementation of EEPROM using intermediate gate voltage to avoid disturb conditions
|
US6128226A
(en)
*
|
1999-02-04 |
2000-10-03 |
Saifun Semiconductors Ltd. |
Method and apparatus for operating with a close to ground signal
|
US6233180B1
(en)
*
|
1999-02-04 |
2001-05-15 |
Saifun Semiconductors Ltd. |
Device for determining the validity of word line conditions and for delaying data sensing operation
|
US6075724A
(en)
*
|
1999-02-22 |
2000-06-13 |
Vantis Corporation |
Method for sorting semiconductor devices having a plurality of non-volatile memory cells
|
US6044022A
(en)
*
|
1999-02-26 |
2000-03-28 |
Tower Semiconductor Ltd. |
Programmable configuration for EEPROMS including 2-bit non-volatile memory cell arrays
|
US6084794A
(en)
*
|
1999-05-28 |
2000-07-04 |
Winbond Electronics Corp. |
High speed flat-cell mask ROM structure with select lines
|
US6108241A
(en)
*
|
1999-07-01 |
2000-08-22 |
Micron Technology, Inc. |
Leakage detection in flash memory cell
|
US6469935B2
(en)
*
|
1999-08-05 |
2002-10-22 |
Halo Lsi Design & Device Technology, Inc. |
Array architecture nonvolatile memory and its operation methods
|
JP3912937B2
(en)
|
1999-08-10 |
2007-05-09 |
スパンション インク |
Multi-bit non-volatile memory using non-conductive charge trap gate
|
JP3348432B2
(en)
*
|
1999-09-14 |
2002-11-20 |
日本電気株式会社 |
Semiconductor device and semiconductor storage device
|
US6181605B1
(en)
*
|
1999-10-06 |
2001-01-30 |
Advanced Micro Devices, Inc. |
Global erase/program verification apparatus and method
|
US6331950B1
(en)
|
1999-10-19 |
2001-12-18 |
Fujitsu Limited |
Write protect input implementation for a simultaneous operation flash memory device
|
US6175523B1
(en)
*
|
1999-10-25 |
2001-01-16 |
Advanced Micro Devices, Inc |
Precharging mechanism and method for NAND-based flash memory devices
|
US6272047B1
(en)
*
|
1999-12-17 |
2001-08-07 |
Micron Technology, Inc. |
Flash memory cell
|
US6201737B1
(en)
*
|
2000-01-28 |
2001-03-13 |
Advanced Micro Devices, Inc. |
Apparatus and method to characterize the threshold distribution in an NROM virtual ground array
|
US6185143B1
(en)
*
|
2000-02-04 |
2001-02-06 |
Hewlett-Packard Company |
Magnetic random access memory (MRAM) device including differential sense amplifiers
|
US6266281B1
(en)
*
|
2000-02-16 |
2001-07-24 |
Advanced Micro Devices, Inc. |
Method of erasing non-volatile memory cells
|
US6215702B1
(en)
*
|
2000-02-16 |
2001-04-10 |
Advanced Micro Devices, Inc. |
Method of maintaining constant erasing speeds for non-volatile memory cells
|
US6205056B1
(en)
*
|
2000-03-14 |
2001-03-20 |
Advanced Micro Devices, Inc. |
Automated reference cell trimming verify
|
US6240040B1
(en)
*
|
2000-03-15 |
2001-05-29 |
Advanced Micro Devices, Inc. |
Multiple bank simultaneous operation for a flash memory
|
US6396741B1
(en)
*
|
2000-05-04 |
2002-05-28 |
Saifun Semiconductors Ltd. |
Programming of nonvolatile memory cells
|
CA2310295C
(en)
*
|
2000-05-31 |
2010-10-05 |
Mosaid Technologies Incorporated |
Multiple match detection circuit and method
|
KR100597060B1
(en)
*
|
2000-08-03 |
2006-07-06 |
후지쯔 가부시끼가이샤 |
Nonvolatile semiconductor memory and method of reading data
|
JP2002184190A
(en)
*
|
2000-12-11 |
2002-06-28 |
Toshiba Corp |
Non-volatile semiconductor memory
|
US6614692B2
(en)
*
|
2001-01-18 |
2003-09-02 |
Saifun Semiconductors Ltd. |
EEPROM array and method for operation thereof
|
JP4467815B2
(en)
|
2001-02-26 |
2010-05-26 |
富士通マイクロエレクトロニクス株式会社 |
Nonvolatile semiconductor memory read operation method and nonvolatile semiconductor memory
|
US6351415B1
(en)
*
|
2001-03-28 |
2002-02-26 |
Tower Semiconductor Ltd. |
Symmetrical non-volatile memory array architecture without neighbor effect
|
US6535434B2
(en)
*
|
2001-04-05 |
2003-03-18 |
Saifun Semiconductors Ltd. |
Architecture and scheme for a non-strobed read sequence
|
JP2002319287A
(en)
|
2001-04-20 |
2002-10-31 |
Fujitsu Ltd |
Nonvolatile semiconductor memory
|
US6636440B2
(en)
|
2001-04-25 |
2003-10-21 |
Saifun Semiconductors Ltd. |
Method for operation of an EEPROM array, including refresh thereof
|
US6522585B2
(en)
*
|
2001-05-25 |
2003-02-18 |
Sandisk Corporation |
Dual-cell soft programming for virtual-ground memory arrays
|
US6574139B2
(en)
*
|
2001-06-20 |
2003-06-03 |
Fujitsu Limited |
Method and device for reading dual bit memory cells using multiple reference cells with two side read
|
US6643178B2
(en)
|
2001-07-31 |
2003-11-04 |
Fujitsu Limited |
System for source side sensing
|
US6525969B1
(en)
*
|
2001-08-10 |
2003-02-25 |
Advanced Micro Devices, Inc. |
Decoder apparatus and methods for pre-charging bit lines
|
US6469929B1
(en)
*
|
2001-08-21 |
2002-10-22 |
Tower Semiconductor Ltd. |
Structure and method for high speed sensing of memory arrays
|
US6510082B1
(en)
*
|
2001-10-23 |
2003-01-21 |
Advanced Micro Devices, Inc. |
Drain side sensing scheme for virtual ground flash EPROM array with adjacent bit charge and hold
|
TW506123B
(en)
|
2001-10-24 |
2002-10-11 |
Macronix Int Co Ltd |
Multi-level NROM memory cell and its operating method
|
US6885585B2
(en)
*
|
2001-12-20 |
2005-04-26 |
Saifun Semiconductors Ltd. |
NROM NOR array
|
US6529412B1
(en)
*
|
2002-01-16 |
2003-03-04 |
Advanced Micro Devices, Inc. |
Source side sensing scheme for virtual ground read of flash eprom array with adjacent bit precharge
|
US6975536B2
(en)
*
|
2002-01-31 |
2005-12-13 |
Saifun Semiconductors Ltd. |
Mass storage array and methods for operation thereof
|
US6639844B1
(en)
*
|
2002-03-13 |
2003-10-28 |
Advanced Micro Devices, Inc. |
Overerase correction method
|
US6594181B1
(en)
*
|
2002-05-10 |
2003-07-15 |
Fujitsu Limited |
System for reading a double-bit memory cell
|
US6917544B2
(en)
*
|
2002-07-10 |
2005-07-12 |
Saifun Semiconductors Ltd. |
Multiple use memory chip
|
US6813189B2
(en)
*
|
2002-07-16 |
2004-11-02 |
Fujitsu Limited |
System for using a dynamic reference in a double-bit cell memory
|
JP4260434B2
(en)
*
|
2002-07-16 |
2009-04-30 |
富士通マイクロエレクトロニクス株式会社 |
Nonvolatile semiconductor memory and operation method thereof
|