WO2005091714A3 - Apparatus and methods for multi-level sensing in a memory array - Google Patents

Apparatus and methods for multi-level sensing in a memory array Download PDF

Info

Publication number
WO2005091714A3
WO2005091714A3 PCT/IL2004/001107 IL2004001107W WO2005091714A3 WO 2005091714 A3 WO2005091714 A3 WO 2005091714A3 IL 2004001107 W IL2004001107 W IL 2004001107W WO 2005091714 A3 WO2005091714 A3 WO 2005091714A3
Authority
WO
WIPO (PCT)
Prior art keywords
cell
memory array
sensing
methods
dbl
Prior art date
Application number
PCT/IL2004/001107
Other languages
French (fr)
Other versions
WO2005091714A2 (en
Inventor
Oleg Dadashev
Original Assignee
Saifun Semiconductors Ltd
Oleg Dadashev
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Saifun Semiconductors Ltd, Oleg Dadashev filed Critical Saifun Semiconductors Ltd
Publication of WO2005091714A2 publication Critical patent/WO2005091714A2/en
Publication of WO2005091714A3 publication Critical patent/WO2005091714A3/en

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G11C11/5642Sensing or reading circuits; Data output circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/32Timing circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2211/00Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C2211/56Indexing scheme relating to G11C11/56 and sub-groups for features not covered by these groups
    • G11C2211/563Multilevel memory reading aspects
    • G11C2211/5634Reference cells

Abstract

A method for sensing a signal (DBL) received from an array cell within a memory array (10), the method comprising the steps of generating an analog voltage Vddr proportional to a current of a selected array cell of the memory array (10), and comparing the analog voltage Vddr with a reference analog voltage Vcomp to generate an output digital signal (cmp). A method is also provided for sensing a memory cell by transforming a signal (DBL) from a memory cell to a time delay, and sensing the memory cell by comparing the time delay to a time delay of a reference cell (ref. DBL).
PCT/IL2004/001107 2004-03-29 2004-12-06 Apparatus and methods for multi-level sensing in a memory array WO2005091714A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/810,683 US7142464B2 (en) 2003-04-29 2004-03-29 Apparatus and methods for multi-level sensing in a memory array
US10/810,683 2004-03-29

Publications (2)

Publication Number Publication Date
WO2005091714A2 WO2005091714A2 (en) 2005-10-06
WO2005091714A3 true WO2005091714A3 (en) 2006-05-04

Family

ID=35056605

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IL2004/001107 WO2005091714A2 (en) 2004-03-29 2004-12-06 Apparatus and methods for multi-level sensing in a memory array

Country Status (3)

Country Link
US (2) US7142464B2 (en)
TW (1) TWI379306B (en)
WO (1) WO2005091714A2 (en)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7312641B2 (en) * 2004-12-28 2007-12-25 Spansion Llc Sense amplifiers with high voltage swing
EP1834399B1 (en) * 2004-12-30 2008-07-23 Koninklijke Philips Electronics N.V. Monitoring the temperature dependence of the external capacitors of a charge pump and improved charge pumps based thereon
US7558149B2 (en) * 2006-01-24 2009-07-07 Macronix International Co., Ltd. Method and apparatus to control sensing time for nonvolatile memory
WO2008056294A1 (en) * 2006-11-08 2008-05-15 Nxp B.V. Read enhancement for memory
US7580297B2 (en) * 2007-03-30 2009-08-25 Infineon Technologies Ag Readout of multi-level storage cells
US20090129166A1 (en) * 2007-11-15 2009-05-21 Eduardo Maayan Method, circuit and system for sensing a cell in a non-volatile memory array
US8717802B2 (en) 2010-09-13 2014-05-06 International Business Machines Corporation Reconfigurable multi-level sensing scheme for semiconductor memories
CN103366804B (en) * 2012-03-30 2017-10-13 硅存储技术公司 The Nonvolatile memory devices of sense amplifier are injected with electric current
US20140233339A1 (en) * 2013-02-18 2014-08-21 Spansion Llc. Apparatus and method to reduce bit line disturbs
US9911492B2 (en) 2014-01-17 2018-03-06 International Business Machines Corporation Writing multiple levels in a phase change memory using a write reference voltage that incrementally ramps over a write period
US9830999B2 (en) 2014-06-05 2017-11-28 Micron Technology, Inc. Comparison operations in memory
US9589602B2 (en) 2014-09-03 2017-03-07 Micron Technology, Inc. Comparison operations in memory
US9747961B2 (en) 2014-09-03 2017-08-29 Micron Technology, Inc. Division operations in memory
US9904515B2 (en) 2014-09-03 2018-02-27 Micron Technology, Inc. Multiplication operations in memory
US9898252B2 (en) 2014-09-03 2018-02-20 Micron Technology, Inc. Multiplication operations in memory
US10032493B2 (en) 2015-01-07 2018-07-24 Micron Technology, Inc. Longest element length determination in memory
US9460760B2 (en) * 2015-01-23 2016-10-04 Globalfoundries Inc. Data-dependent self-biased differential sense amplifier
US9583163B2 (en) 2015-02-03 2017-02-28 Micron Technology, Inc. Loop structure for operations in memory
US9898253B2 (en) 2015-03-11 2018-02-20 Micron Technology, Inc. Division operations on variable length elements in memory
US9741399B2 (en) 2015-03-11 2017-08-22 Micron Technology, Inc. Data shift by elements of a vector in memory
US10146537B2 (en) 2015-03-13 2018-12-04 Micron Technology, Inc. Vector population count determination in memory
US9892767B2 (en) 2016-02-12 2018-02-13 Micron Technology, Inc. Data gathering in memory
US9697876B1 (en) 2016-03-01 2017-07-04 Micron Technology, Inc. Vertical bit vector shift in memory
US9910637B2 (en) 2016-03-17 2018-03-06 Micron Technology, Inc. Signed division in memory
US10607665B2 (en) 2016-04-07 2020-03-31 Micron Technology, Inc. Span mask generation
US10153008B2 (en) 2016-04-20 2018-12-11 Micron Technology, Inc. Apparatuses and methods for performing corner turn operations using sensing circuitry
US9659605B1 (en) 2016-04-20 2017-05-23 Micron Technology, Inc. Apparatuses and methods for performing corner turn operations using sensing circuitry
US10042608B2 (en) 2016-05-11 2018-08-07 Micron Technology, Inc. Signed division in memory
US11029951B2 (en) 2016-08-15 2021-06-08 Micron Technology, Inc. Smallest or largest value element determination
US10043570B1 (en) 2017-04-17 2018-08-07 Micron Technology, Inc. Signed element compare in memory
US10147467B2 (en) 2017-04-17 2018-12-04 Micron Technology, Inc. Element value comparison in memory
CN112242172A (en) * 2019-07-19 2021-01-19 四川省豆萁科技股份有限公司 NOR flash memory and reference current comparison circuit thereof
US11342010B2 (en) * 2019-10-01 2022-05-24 Macronix International Co., Ltd. Managing bit line voltage generating circuits in memory devices

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6128227A (en) * 1998-03-28 2000-10-03 Hyundai Electronics Industries Co., Ltd. Sense amplifier circuit in a flash memory device
US6163484A (en) * 1998-04-27 2000-12-19 Nec Corporation Non-volatile semiconductor storage device having improved program/erase/over erase verify
US6219290B1 (en) * 1998-10-14 2001-04-17 Macronix International Co., Ltd. Memory cell sense amplifier
US6400607B1 (en) * 1999-10-29 2002-06-04 Stmicroelectronics S.R.L. Reading circuit for a non-volatile memory

Family Cites Families (242)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1392599A (en) 1971-07-28 1975-04-30 Mullard Ltd Semiconductor memory elements
US3881180A (en) 1971-11-30 1975-04-29 Texas Instruments Inc Non-volatile memory cell
US3895360A (en) * 1974-01-29 1975-07-15 Westinghouse Electric Corp Block oriented random access memory
US4016588A (en) * 1974-12-27 1977-04-05 Nippon Electric Company, Ltd. Non-volatile semiconductor memory device
US4017888A (en) * 1975-12-31 1977-04-12 International Business Machines Corporation Non-volatile metal nitride oxide semiconductor device
US4151021A (en) * 1977-01-26 1979-04-24 Texas Instruments Incorporated Method of making a high density floating gate electrically programmable ROM
US4145703A (en) 1977-04-15 1979-03-20 Supertex, Inc. High power MOS device and fabrication method therefor
US4173791A (en) 1977-09-16 1979-11-06 Fairchild Camera And Instrument Corporation Insulated gate field-effect transistor read-only memory array
US4173766A (en) 1977-09-16 1979-11-06 Fairchild Camera And Instrument Corporation Insulated gate field-effect transistor read-only memory cell
US4373248A (en) 1978-07-12 1983-02-15 Texas Instruments Incorporated Method of making high density semiconductor device such as floating gate electrically programmable ROM or the like
DE2832388C2 (en) * 1978-07-24 1986-08-14 Siemens Ag, 1000 Berlin Und 8000 Muenchen Process for the production of MNOS and MOS transistors in silicon gate technology on a semiconductor substrate
US4360900A (en) 1978-11-27 1982-11-23 Texas Instruments Incorporated Non-volatile semiconductor memory elements
US4247861A (en) 1979-03-09 1981-01-27 Rca Corporation High performance electrically alterable read-only memory (EAROM)
DE2923995C2 (en) 1979-06-13 1985-11-07 Siemens AG, 1000 Berlin und 8000 München Process for the production of integrated MOS circuits with MOS transistors and MNOS memory transistors in silicon gate technology
JPS5656677A (en) 1979-10-13 1981-05-18 Toshiba Corp Semiconductor memory device
US4281397A (en) * 1979-10-29 1981-07-28 Texas Instruments Incorporated Virtual ground MOS EPROM or ROM matrix
DE2947350A1 (en) * 1979-11-23 1981-05-27 Siemens AG, 1000 Berlin und 8000 München METHOD FOR PRODUCING MNOS STORAGE TRANSISTORS WITH A VERY SHORT CHANNEL LENGTH IN SILICON GATE TECHNOLOGY
JPS56120166A (en) 1980-02-27 1981-09-21 Hitachi Ltd Semiconductor ic device and manufacture thereof
US4342102A (en) * 1980-06-18 1982-07-27 Signetics Corporation Semiconductor memory array
US4380057A (en) 1980-10-27 1983-04-12 International Business Machines Corporation Electrically alterable double dense memory
US4521796A (en) * 1980-12-11 1985-06-04 General Instrument Corporation Memory implant profile for improved channel shielding in electrically alterable read only memory semiconductor device
DE3174858D1 (en) 1980-12-25 1986-07-24 Fujitsu Ltd Nonvolatile semiconductor memory device
US4448400A (en) 1981-07-13 1984-05-15 Eliyahou Harari Highly scalable dynamic RAM cell with self-signal amplification
US4404747A (en) 1981-07-29 1983-09-20 Schur, Inc. Knife and sheath assembly
US4389705A (en) * 1981-08-21 1983-06-21 Mostek Corporation Semiconductor memory circuit with depletion data transfer transistor
US4388705A (en) * 1981-10-01 1983-06-14 Mostek Corporation Semiconductor memory circuit
US4435786A (en) 1981-11-23 1984-03-06 Fairchild Camera And Instrument Corporation Self-refreshing memory cell
US4494016A (en) 1982-07-26 1985-01-15 Sperry Corporation High performance MESFET transistor for VLSI implementation
US4527257A (en) * 1982-08-25 1985-07-02 Westinghouse Electric Corp. Common memory gate non-volatile transistor memory
JPS5949022A (en) * 1982-09-13 1984-03-21 Toshiba Corp Multi-value logical circuit
US4613956A (en) 1983-02-23 1986-09-23 Texas Instruments Incorporated Floating gate memory with improved dielectric
US4769340A (en) 1983-11-28 1988-09-06 Exel Microelectronics, Inc. Method for making electrically programmable memory device by doping the floating gate by implant
US4725984A (en) 1984-02-21 1988-02-16 Seeq Technology, Inc. CMOS eprom sense amplifier
JPS60182174A (en) 1984-02-28 1985-09-17 Nec Corp Non-volatile semiconductor memory
KR930007195B1 (en) 1984-05-23 1993-07-31 가부시끼가이샤 히다찌세이사꾸쇼 Semiconductor device and its manufacturing method
US5352620A (en) 1984-05-23 1994-10-04 Hitachi, Ltd. Method of making semiconductor device with memory cells and peripheral transistors
US4665426A (en) 1985-02-01 1987-05-12 Advanced Micro Devices, Inc. EPROM with ultraviolet radiation transparent silicon nitride passivation layer
EP0199305B1 (en) 1985-04-18 1992-03-18 Nec Corporation Programmable read only memory operable with reduced programming power consumption
US4667217A (en) * 1985-04-19 1987-05-19 Ncr Corporation Two bit vertically/horizontally integrated memory cell
JPH0831789B2 (en) 1985-09-04 1996-03-27 沖電気工業株式会社 Output circuit
US4742491A (en) * 1985-09-26 1988-05-03 Advanced Micro Devices, Inc. Memory cell having hot-hole injection erase mode
US4760555A (en) 1986-04-21 1988-07-26 Texas Instruments Incorporated Memory array with an array reorganizer
JPH0828431B2 (en) * 1986-04-22 1996-03-21 日本電気株式会社 Semiconductor memory device
US4758869A (en) 1986-08-29 1988-07-19 Waferscale Integration, Inc. Nonvolatile floating gate transistor structure
US5168334A (en) 1987-07-31 1992-12-01 Texas Instruments, Incorporated Non-volatile semiconductor memory
US4780424A (en) 1987-09-28 1988-10-25 Intel Corporation Process for fabricating electrically alterable floating gate memory devices
US4870470A (en) 1987-10-16 1989-09-26 International Business Machines Corporation Non-volatile memory cell having Si rich silicon nitride charge trapping layer
US4839705A (en) 1987-12-16 1989-06-13 Texas Instruments Incorporated X-cell EEPROM array
JPH07120720B2 (en) * 1987-12-17 1995-12-20 三菱電機株式会社 Nonvolatile semiconductor memory device
US5159570A (en) 1987-12-22 1992-10-27 Texas Instruments Incorporated Four memory state EEPROM
US4888735A (en) 1987-12-30 1989-12-19 Elite Semiconductor & Systems Int'l., Inc. ROM cell and array configuration
US4857770A (en) 1988-02-29 1989-08-15 Advanced Micro Devices, Inc. Output buffer arrangement for reducing chip noise without speed penalty
US5268870A (en) * 1988-06-08 1993-12-07 Eliyahou Harari Flash EEPROM system and intelligent programming and erasing methods therefor
US4941028A (en) * 1988-08-10 1990-07-10 Actel Corporation Structure for protecting thin dielectrics during processing
JPH0271493A (en) * 1988-09-06 1990-03-12 Mitsubishi Electric Corp Semiconductor memory device
US5042009A (en) * 1988-12-09 1991-08-20 Waferscale Integration, Inc. Method for programming a floating gate memory device
US5293563A (en) * 1988-12-29 1994-03-08 Sharp Kabushiki Kaisha Multi-level memory cell with increased read-out margin
US5120672A (en) 1989-02-22 1992-06-09 Texas Instruments Incorporated Fabricating a single level merged EEPROM cell having an ONO memory stack substantially spaced from the source region
US5142495A (en) 1989-03-10 1992-08-25 Intel Corporation Variable load for margin mode
DE3931596A1 (en) 1989-03-25 1990-10-04 Eurosil Electronic Gmbh VOLTAGE MULTIPLIER
US5172338B1 (en) 1989-04-13 1997-07-08 Sandisk Corp Multi-state eeprom read and write circuits and techniques
US4961010A (en) 1989-05-19 1990-10-02 National Semiconductor Corporation Output buffer for reducing switching induced noise
US5104819A (en) * 1989-08-07 1992-04-14 Intel Corporation Fabrication of interpoly dielctric for EPROM-related technologies
US5027321A (en) * 1989-11-21 1991-06-25 Intel Corporation Apparatus and method for improved reading/programming of virtual ground EPROM arrays
US4992391A (en) 1989-11-29 1991-02-12 Advanced Micro Devices, Inc. Process for fabricating a control gate for a floating gate FET
US5204835A (en) * 1990-06-13 1993-04-20 Waferscale Integration Inc. Eprom virtual ground array
EP0461904A3 (en) * 1990-06-14 1992-09-09 Creative Integrated Systems, Inc. An improved semiconductor read-only vlsi memory
US5618710A (en) * 1990-08-03 1997-04-08 Vertex Pharmaceuticals, Inc. Crosslinked enzyme crystals
US5075245A (en) 1990-08-03 1991-12-24 Intel Corporation Method for improving erase characteristics of buried bit line flash EPROM devices without using sacrificial oxide growth and removal steps
US5289406A (en) * 1990-08-28 1994-02-22 Mitsubishi Denki Kabushiki Kaisha Read only memory for storing multi-data
US5117389A (en) * 1990-09-05 1992-05-26 Macronix International Co., Ltd. Flat-cell read-only-memory integrated circuit
US5892013A (en) * 1990-09-13 1999-04-06 Novo Nordisk A/S Lipase variants
KR920006991A (en) * 1990-09-25 1992-04-28 김광호 High Voltage Generation Circuit of Semiconductor Memory Device
US5081371A (en) 1990-11-07 1992-01-14 U.S. Philips Corp. Integrated charge pump circuit with back bias voltage reduction
JP2987193B2 (en) * 1990-11-20 1999-12-06 富士通株式会社 Semiconductor storage device
US5094968A (en) 1990-11-21 1992-03-10 Atmel Corporation Fabricating a narrow width EEPROM with single diffusion electrode formation
US5086325A (en) 1990-11-21 1992-02-04 Atmel Corporation Narrow width EEPROM with single diffusion electrode formation
JP2612969B2 (en) * 1991-02-08 1997-05-21 シャープ株式会社 Method for manufacturing semiconductor device
US6002614A (en) * 1991-02-08 1999-12-14 Btg International Inc. Memory apparatus including programmable non-volatile multi-bit memory cell, and apparatus and method for demarcating memory states of the cell
US5218569A (en) * 1991-02-08 1993-06-08 Banks Gerald J Electrically alterable non-volatile memory with n-bits per memory cell
JPH04311900A (en) 1991-04-10 1992-11-04 Sharp Corp Semiconductor read only memory
JP2930440B2 (en) 1991-04-15 1999-08-03 沖電気工業株式会社 Semiconductor integrated circuit
US5424567A (en) * 1991-05-15 1995-06-13 North American Philips Corporation Protected programmable transistor with reduced parasitic capacitances and method of fabrication
US5142496A (en) * 1991-06-03 1992-08-25 Advanced Micro Devices, Inc. Method for measuring VT 's less than zero without applying negative voltages
JP3593550B2 (en) * 1991-07-01 2004-11-24 ノルトマルク アルツナイミッテル ゲゼルシャフト ミット ベシュレンクテル ハフツング ウント コンパニー コマンディートゲゼルシャフト Use of lipase for pharmaceutical manufacturing
US5245572A (en) * 1991-07-30 1993-09-14 Intel Corporation Floating gate nonvolatile memory with reading while writing capability
JP2965415B2 (en) * 1991-08-27 1999-10-18 松下電器産業株式会社 Semiconductor storage device
EP0740854B1 (en) * 1991-08-29 2003-04-23 Hyundai Electronics Industries Co., Ltd. A self-aligned dual-bit split gate (dsg) flash eeprom cell
US5305262A (en) * 1991-09-11 1994-04-19 Kawasaki Steel Corporation Semiconductor integrated circuit
US5175120A (en) 1991-10-11 1992-12-29 Micron Technology, Inc. Method of processing a semiconductor wafer to form an array of nonvolatile memory devices employing floating gate transistors and peripheral area having CMOS transistors
JPH05110114A (en) * 1991-10-17 1993-04-30 Rohm Co Ltd Nonvolatile semiconductor memory device
JP3358663B2 (en) * 1991-10-25 2002-12-24 ローム株式会社 Semiconductor storage device and storage information reading method thereof
US5357134A (en) 1991-10-31 1994-10-18 Rohm Co., Ltd. Nonvolatile semiconductor device having charge trap film containing silicon crystal grains
US5338954A (en) * 1991-10-31 1994-08-16 Rohm Co., Ltd. Semiconductor memory device having an insulating film and a trap film joined in a channel region
JPH05129284A (en) 1991-11-06 1993-05-25 Sony Corp Method of setting condition of plasma sin forming film and manufacture of semiconductor device
US5260593A (en) 1991-12-10 1993-11-09 Micron Technology, Inc. Semiconductor floating gate device having improved channel-floating gate interaction
JP2564067B2 (en) * 1992-01-09 1996-12-18 株式会社東芝 Readout output circuit having sense circuit
US6222762B1 (en) * 1992-01-14 2001-04-24 Sandisk Corporation Multi-state memory
JP2851962B2 (en) 1992-01-21 1999-01-27 シャープ株式会社 Semiconductor read-only memory
EP1032034A1 (en) * 1992-01-22 2000-08-30 Macronix International Co., Ltd. Method of making memory device
US5324675A (en) * 1992-03-31 1994-06-28 Kawasaki Steel Corporation Method of producing semiconductor devices of a MONOS type
JPH05290584A (en) * 1992-04-08 1993-11-05 Nec Corp Semiconductor memory
US5657332A (en) * 1992-05-20 1997-08-12 Sandisk Corporation Soft errors handling in EEPROM devices
US5496753A (en) * 1992-05-29 1996-03-05 Citizen Watch, Co., Ltd. Method of fabricating a semiconductor nonvolatile storage device
JPH065823A (en) 1992-06-19 1994-01-14 Toshiba Corp Nonvolatile semiconductor memory device and its application method
US5289412A (en) * 1992-06-19 1994-02-22 Intel Corporation High-speed bias-stabilized current-mirror referencing circuit for non-volatile memories
US5315541A (en) * 1992-07-24 1994-05-24 Sundisk Corporation Segmented column memory array
GB9217743D0 (en) * 1992-08-19 1992-09-30 Philips Electronics Uk Ltd A semiconductor memory device
JP3036565B2 (en) 1992-08-28 2000-04-24 日本電気株式会社 Manufacturing method of nonvolatile semiconductor memory device
US5450354A (en) * 1992-08-31 1995-09-12 Nippon Steel Corporation Non-volatile semiconductor memory device detachable deterioration of memory cells
US5450341A (en) * 1992-08-31 1995-09-12 Nippon Steel Corporation Non-volatile semiconductor memory device having memory cells, each for at least three different data writable thereinto selectively and a method of using the same
US5412601A (en) * 1992-08-31 1995-05-02 Nippon Steel Corporation Non-volatile semiconductor memory device capable of storing multi-value data in each memory cell
US5412238A (en) * 1992-09-08 1995-05-02 National Semiconductor Corporation Source-coupling, split-gate, virtual ground flash EEPROM array
US5280420A (en) 1992-10-02 1994-01-18 National Semiconductor Corporation Charge pump which operates on a low voltage power supply
US5350568A (en) * 1992-11-09 1994-09-27 Tetra Alfa Holdings, S.A. Method and apparatus for sterilizing cartons and breaking carton score lines
US5377153A (en) * 1992-11-30 1994-12-27 Sgs-Thomson Microelectronics, Inc. Virtual ground read only memory circuit
US5418743A (en) * 1992-12-07 1995-05-23 Nippon Steel Corporation Method of writing into non-volatile semiconductor memory
US5319593A (en) * 1992-12-21 1994-06-07 National Semiconductor Corp. Memory array with field oxide islands eliminated and method
DK154292D0 (en) * 1992-12-23 1992-12-23 Novo Nordisk As NEW ENZYM
JPH07114792A (en) * 1993-10-19 1995-05-02 Mitsubishi Electric Corp Semiconductor memory
US5424978A (en) * 1993-03-15 1995-06-13 Nippon Steel Corporation Non-volatile semiconductor memory cell capable of storing more than two different data and method of using the same
DK39693D0 (en) * 1993-04-02 1993-04-02 Novo Nordisk As ENZYME
US5393701A (en) * 1993-04-08 1995-02-28 United Microelectronics Corporation Layout design to eliminate process antenna effect
US5335198A (en) * 1993-05-06 1994-08-02 Advanced Micro Devices, Inc. Flash EEPROM array with high endurance
US5463586A (en) * 1993-05-28 1995-10-31 Macronix International Co., Ltd. Erase and program verification circuit for non-volatile memory
US5350710A (en) 1993-06-24 1994-09-27 United Microelectronics Corporation Device for preventing antenna effect on circuit
US5400286A (en) * 1993-08-17 1995-03-21 Catalyst Semiconductor Corp. Self-recovering erase scheme to enhance flash memory endurance
US5477499A (en) 1993-10-13 1995-12-19 Advanced Micro Devices, Inc. Memory architecture for a three volt flash EEPROM
US5828601A (en) * 1993-12-01 1998-10-27 Advanced Micro Devices, Inc. Programmed reference
JP3076185B2 (en) * 1993-12-07 2000-08-14 日本電気株式会社 Semiconductor memory device and inspection method thereof
US5435481A (en) * 1994-01-18 1995-07-25 Motorola, Inc. Soldering process
US5440505A (en) * 1994-01-21 1995-08-08 Intel Corporation Method and circuitry for storing discrete amounts of charge in a single memory element
FR2715782B1 (en) * 1994-01-31 1996-03-22 Sgs Thomson Microelectronics Programmable non-volatile bistable flip-flop, with predefined initial state, in particular for memory redundancy circuit.
FR2715758B1 (en) * 1994-01-31 1996-03-22 Sgs Thomson Microelectronics Source-programmable, non-volatile flip-flop, especially for memory redundancy circuits.
US5418176A (en) * 1994-02-17 1995-05-23 United Microelectronics Corporation Process for producing memory devices having narrow buried N+ lines
DE4408152A1 (en) * 1994-03-11 1995-09-14 Studiengesellschaft Kohle Mbh Immobilized lipases in hydrophobic sol-gel materials
DE69424771T2 (en) * 1994-03-22 2000-10-26 St Microelectronics Srl Arrangement for reading a memory cell matrix
DK0755442T3 (en) * 1994-05-04 2003-04-14 Genencor Int Lipases with improved resistance to surfactants
US5568085A (en) * 1994-05-16 1996-10-22 Waferscale Integration Inc. Unit for stabilizing voltage on a capacitive node
US5523972A (en) * 1994-06-02 1996-06-04 Intel Corporation Method and apparatus for verifying the programming of multi-level flash EEPROM memory
US5508968A (en) * 1994-08-12 1996-04-16 International Business Machines Corporation Dynamic random access memory persistent page implemented as processor register sets
US5822256A (en) * 1994-09-06 1998-10-13 Intel Corporation Method and circuitry for usage of partially functional nonvolatile memory
JPH08181284A (en) * 1994-09-13 1996-07-12 Hewlett Packard Co <Hp> Protective element and manufacture thereof
US5583808A (en) 1994-09-16 1996-12-10 National Semiconductor Corporation EPROM array segmented for high performance and method for controlling same
US5523251A (en) * 1994-10-05 1996-06-04 United Microelectronics Corp. Method for fabricating a self aligned mask ROM
US5694356A (en) 1994-11-02 1997-12-02 Invoice Technology, Inc. High resolution analog storage EPROM and flash EPROM
US5537358A (en) * 1994-12-06 1996-07-16 National Semiconductor Corporation Flash memory having adaptive sensing and method
US5661060A (en) * 1994-12-28 1997-08-26 National Semiconductor Corporation Method for forming field oxide regions
CA2142644C (en) * 1995-02-16 1996-11-26 Marc Etienne Bonneville Standby power circuit arrangement
US5518942A (en) * 1995-02-22 1996-05-21 Alliance Semiconductor Corporation Method of making flash EPROM cell having improved erase characteristics by using a tilt angle implant
US6353554B1 (en) * 1995-02-27 2002-03-05 Btg International Inc. Memory apparatus including programmable non-volatile multi-bit memory cell, and apparatus and method for demarcating memory states of the cell
DE69524572T2 (en) 1995-04-28 2002-08-22 St Microelectronics Srl Sense amplifier circuit for semiconductor memory devices
KR100187656B1 (en) * 1995-05-16 1999-06-01 김주용 Method for manufacturing a flash eeprom and the programming method
US6051220A (en) * 1995-05-31 2000-04-18 Medzyme N.V. And Simon Lodewijk Scharpe Composition to improve digestibility and utilization of nutrients
US6034896A (en) * 1995-07-03 2000-03-07 The University Of Toronto, Innovations Foundation Method of fabricating a fast programmable flash E2 PROM cell
KR970008496A (en) * 1995-07-04 1997-02-24 모리시다 요이치 MIS semiconductor device, manufacturing method thereof, and diagnostic method thereof
EP0753859B1 (en) * 1995-07-14 2000-01-26 STMicroelectronics S.r.l. Method for setting the threshold voltage of a reference memory cell
JP2830800B2 (en) * 1995-09-29 1998-12-02 日本電気株式会社 Current differential amplifier circuit
US5633603A (en) * 1995-12-26 1997-05-27 Hyundai Electronics Industries Co., Ltd. Data output buffer using pass transistors biased with a reference voltage and a precharged data input
US5748534A (en) * 1996-03-26 1998-05-05 Invox Technology Feedback loop for reading threshold voltage
US5777923A (en) * 1996-06-17 1998-07-07 Aplus Integrated Circuits, Inc. Flash memory read/write controller
US5712815A (en) * 1996-04-22 1998-01-27 Advanced Micro Devices, Inc. Multiple bits per-cell flash EEPROM capable of concurrently programming and verifying memory cells and reference cells
US5847441A (en) 1996-05-10 1998-12-08 Micron Technology, Inc. Semiconductor junction antifuse circuit
US5715193A (en) * 1996-05-23 1998-02-03 Micron Quantum Devices, Inc. Flash memory system and method for monitoring the disturb effect on memory cell blocks due to high voltage conditions of other memory cell blocks
US5886927A (en) * 1996-06-11 1999-03-23 Nkk Corporation Nonvolatile memory device with verify function
EP0907954B1 (en) * 1996-06-24 2000-06-07 Advanced Micro Devices, Inc. A method for a multiple bits-per-cell flash eeprom with page mode program and read
KR100265574B1 (en) * 1996-06-29 2000-09-15 김영환 Sense amplifier for semiconductor memory apparatus
US5787484A (en) * 1996-08-08 1998-07-28 Micron Technology, Inc. System and method which compares data preread from memory cells to data to be written to the cells
US5812456A (en) * 1996-10-01 1998-09-22 Microchip Technology Incorporated Switched ground read for EPROM memory array
US5717632A (en) * 1996-11-27 1998-02-10 Advanced Micro Devices, Inc. Apparatus and method for multiple-level storage in non-volatile memories
TW367503B (en) * 1996-11-29 1999-08-21 Sanyo Electric Co Non-volatile semiconductor device
JP3532725B2 (en) 1997-02-27 2004-05-31 株式会社東芝 Semiconductor integrated circuit
JP3920415B2 (en) * 1997-03-31 2007-05-30 三洋電機株式会社 Nonvolatile semiconductor memory device
US6252799B1 (en) * 1997-04-11 2001-06-26 Programmable Silicon Solutions Device with embedded flash and EEPROM memories
US5805500A (en) * 1997-06-18 1998-09-08 Sgs-Thomson Microelectronics S.R.L. Circuit and method for generating a read reference signal for nonvolatile memory cells
JP3189740B2 (en) * 1997-06-20 2001-07-16 日本電気株式会社 Data repair method for nonvolatile semiconductor memory
JP3039458B2 (en) * 1997-07-07 2000-05-08 日本電気株式会社 Non-volatile semiconductor memory
IL125604A (en) * 1997-07-30 2004-03-28 Saifun Semiconductors Ltd Non-volatile electrically erasable and programmble semiconductor memory cell utilizing asymmetrical charge
US6768165B1 (en) * 1997-08-01 2004-07-27 Saifun Semiconductors Ltd. Two bit non-volatile electrically erasable and programmable semiconductor memory cell utilizing asymmetrical charge trapping
US5926409A (en) * 1997-09-05 1999-07-20 Information Storage Devices, Inc. Method and apparatus for an adaptive ramp amplitude controller in nonvolatile memory application
US5940332A (en) * 1997-11-13 1999-08-17 Stmicroelectronics, Inc. Programmed memory with improved speed and power consumption
US5867429A (en) * 1997-11-19 1999-02-02 Sandisk Corporation High density non-volatile flash memory without adverse effects of electric field coupling between adjacent floating gates
JP3599541B2 (en) * 1997-11-27 2004-12-08 シャープ株式会社 Nonvolatile semiconductor memory device
US5949728A (en) * 1997-12-12 1999-09-07 Scenix Semiconductor, Inc. High speed, noise immune, single ended sensing scheme for non-volatile memories
KR100327421B1 (en) * 1997-12-31 2002-07-27 주식회사 하이닉스반도체 Program system of non-volatile memory device and programming method thereof
US5946258A (en) * 1998-03-16 1999-08-31 Intel Corporation Pump supply self regulation for flash memory cell pair reference circuit
US6046591A (en) * 1998-03-16 2000-04-04 General Electric Company MRI system with fractional decimation of acquired data
US6030871A (en) * 1998-05-05 2000-02-29 Saifun Semiconductors Ltd. Process for producing two bit ROM cell utilizing angled implant
US6215148B1 (en) * 1998-05-20 2001-04-10 Saifun Semiconductors Ltd. NROM cell with improved programming, erasing and cycling
US6348711B1 (en) * 1998-05-20 2002-02-19 Saifun Semiconductors Ltd. NROM cell with self-aligned programming and erasure areas
US6042823A (en) * 1998-07-02 2000-03-28 Amano Pharmaceuticals Co., Ltd. Enzyme composition and use thereof
GB9818548D0 (en) * 1998-08-25 1998-10-21 Microbiological Res Authority Treatment of mucas hypersecretion
JP3999900B2 (en) 1998-09-10 2007-10-31 株式会社東芝 Nonvolatile semiconductor memory
DE69828966D1 (en) * 1998-09-15 2005-03-17 St Microelectronics Srl Method for protecting the content of non-volatile memory cells
US6044019A (en) * 1998-10-23 2000-03-28 Sandisk Corporation Non-volatile memory with improved sensing and method therefor
US6134156A (en) * 1999-02-04 2000-10-17 Saifun Semiconductors Ltd. Method for initiating a retrieval procedure in virtual ground arrays
US6147904A (en) 1999-02-04 2000-11-14 Tower Semiconductor Ltd. Redundancy method and structure for 2-bit non-volatile memory cells
US6108240A (en) * 1999-02-04 2000-08-22 Tower Semiconductor Ltd. Implementation of EEPROM using intermediate gate voltage to avoid disturb conditions
US6128226A (en) * 1999-02-04 2000-10-03 Saifun Semiconductors Ltd. Method and apparatus for operating with a close to ground signal
US6233180B1 (en) * 1999-02-04 2001-05-15 Saifun Semiconductors Ltd. Device for determining the validity of word line conditions and for delaying data sensing operation
US6075724A (en) * 1999-02-22 2000-06-13 Vantis Corporation Method for sorting semiconductor devices having a plurality of non-volatile memory cells
US6044022A (en) * 1999-02-26 2000-03-28 Tower Semiconductor Ltd. Programmable configuration for EEPROMS including 2-bit non-volatile memory cell arrays
US6084794A (en) * 1999-05-28 2000-07-04 Winbond Electronics Corp. High speed flat-cell mask ROM structure with select lines
US6108241A (en) * 1999-07-01 2000-08-22 Micron Technology, Inc. Leakage detection in flash memory cell
US6469935B2 (en) * 1999-08-05 2002-10-22 Halo Lsi Design & Device Technology, Inc. Array architecture nonvolatile memory and its operation methods
JP3912937B2 (en) 1999-08-10 2007-05-09 スパンション インク Multi-bit non-volatile memory using non-conductive charge trap gate
JP3348432B2 (en) * 1999-09-14 2002-11-20 日本電気株式会社 Semiconductor device and semiconductor storage device
US6181605B1 (en) * 1999-10-06 2001-01-30 Advanced Micro Devices, Inc. Global erase/program verification apparatus and method
US6331950B1 (en) 1999-10-19 2001-12-18 Fujitsu Limited Write protect input implementation for a simultaneous operation flash memory device
US6175523B1 (en) * 1999-10-25 2001-01-16 Advanced Micro Devices, Inc Precharging mechanism and method for NAND-based flash memory devices
US6272047B1 (en) * 1999-12-17 2001-08-07 Micron Technology, Inc. Flash memory cell
US6201737B1 (en) * 2000-01-28 2001-03-13 Advanced Micro Devices, Inc. Apparatus and method to characterize the threshold distribution in an NROM virtual ground array
US6185143B1 (en) * 2000-02-04 2001-02-06 Hewlett-Packard Company Magnetic random access memory (MRAM) device including differential sense amplifiers
US6266281B1 (en) * 2000-02-16 2001-07-24 Advanced Micro Devices, Inc. Method of erasing non-volatile memory cells
US6215702B1 (en) * 2000-02-16 2001-04-10 Advanced Micro Devices, Inc. Method of maintaining constant erasing speeds for non-volatile memory cells
US6205056B1 (en) * 2000-03-14 2001-03-20 Advanced Micro Devices, Inc. Automated reference cell trimming verify
US6240040B1 (en) * 2000-03-15 2001-05-29 Advanced Micro Devices, Inc. Multiple bank simultaneous operation for a flash memory
US6396741B1 (en) * 2000-05-04 2002-05-28 Saifun Semiconductors Ltd. Programming of nonvolatile memory cells
CA2310295C (en) * 2000-05-31 2010-10-05 Mosaid Technologies Incorporated Multiple match detection circuit and method
KR100597060B1 (en) * 2000-08-03 2006-07-06 후지쯔 가부시끼가이샤 Nonvolatile semiconductor memory and method of reading data
JP2002184190A (en) * 2000-12-11 2002-06-28 Toshiba Corp Non-volatile semiconductor memory
US6614692B2 (en) * 2001-01-18 2003-09-02 Saifun Semiconductors Ltd. EEPROM array and method for operation thereof
JP4467815B2 (en) 2001-02-26 2010-05-26 富士通マイクロエレクトロニクス株式会社 Nonvolatile semiconductor memory read operation method and nonvolatile semiconductor memory
US6351415B1 (en) * 2001-03-28 2002-02-26 Tower Semiconductor Ltd. Symmetrical non-volatile memory array architecture without neighbor effect
US6535434B2 (en) * 2001-04-05 2003-03-18 Saifun Semiconductors Ltd. Architecture and scheme for a non-strobed read sequence
JP2002319287A (en) 2001-04-20 2002-10-31 Fujitsu Ltd Nonvolatile semiconductor memory
US6636440B2 (en) 2001-04-25 2003-10-21 Saifun Semiconductors Ltd. Method for operation of an EEPROM array, including refresh thereof
US6522585B2 (en) * 2001-05-25 2003-02-18 Sandisk Corporation Dual-cell soft programming for virtual-ground memory arrays
US6574139B2 (en) * 2001-06-20 2003-06-03 Fujitsu Limited Method and device for reading dual bit memory cells using multiple reference cells with two side read
US6643178B2 (en) 2001-07-31 2003-11-04 Fujitsu Limited System for source side sensing
US6525969B1 (en) * 2001-08-10 2003-02-25 Advanced Micro Devices, Inc. Decoder apparatus and methods for pre-charging bit lines
US6469929B1 (en) * 2001-08-21 2002-10-22 Tower Semiconductor Ltd. Structure and method for high speed sensing of memory arrays
US6510082B1 (en) * 2001-10-23 2003-01-21 Advanced Micro Devices, Inc. Drain side sensing scheme for virtual ground flash EPROM array with adjacent bit charge and hold
TW506123B (en) 2001-10-24 2002-10-11 Macronix Int Co Ltd Multi-level NROM memory cell and its operating method
US6885585B2 (en) * 2001-12-20 2005-04-26 Saifun Semiconductors Ltd. NROM NOR array
US6529412B1 (en) * 2002-01-16 2003-03-04 Advanced Micro Devices, Inc. Source side sensing scheme for virtual ground read of flash eprom array with adjacent bit precharge
US6975536B2 (en) * 2002-01-31 2005-12-13 Saifun Semiconductors Ltd. Mass storage array and methods for operation thereof
US6639844B1 (en) * 2002-03-13 2003-10-28 Advanced Micro Devices, Inc. Overerase correction method
US6594181B1 (en) * 2002-05-10 2003-07-15 Fujitsu Limited System for reading a double-bit memory cell
US6917544B2 (en) * 2002-07-10 2005-07-12 Saifun Semiconductors Ltd. Multiple use memory chip
US6813189B2 (en) * 2002-07-16 2004-11-02 Fujitsu Limited System for using a dynamic reference in a double-bit cell memory
JP4260434B2 (en) * 2002-07-16 2009-04-30 富士通マイクロエレクトロニクス株式会社 Nonvolatile semiconductor memory and operation method thereof

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6128227A (en) * 1998-03-28 2000-10-03 Hyundai Electronics Industries Co., Ltd. Sense amplifier circuit in a flash memory device
US6163484A (en) * 1998-04-27 2000-12-19 Nec Corporation Non-volatile semiconductor storage device having improved program/erase/over erase verify
US6219290B1 (en) * 1998-10-14 2001-04-17 Macronix International Co., Ltd. Memory cell sense amplifier
US6400607B1 (en) * 1999-10-29 2002-06-04 Stmicroelectronics S.R.L. Reading circuit for a non-volatile memory

Also Published As

Publication number Publication date
WO2005091714A2 (en) 2005-10-06
US20040218426A1 (en) 2004-11-04
US20060285402A1 (en) 2006-12-21
TW200532708A (en) 2005-10-01
US7532529B2 (en) 2009-05-12
TWI379306B (en) 2012-12-11
US7142464B2 (en) 2006-11-28

Similar Documents

Publication Publication Date Title
WO2005091714A3 (en) Apparatus and methods for multi-level sensing in a memory array
WO2007038984A8 (en) Analog design retargeting
US7696739B2 (en) Electronic switch circuit, converter and method of operation
WO2008024688A3 (en) Method, apparatus and system relating to automatic cell threshold voltage measurement
EP1646101A3 (en) Method of monitoring the operational state of a fuel cell stack
WO2003033749A3 (en) Matrix element precharge voltage adjusting apparatus and method
WO2007134188A3 (en) Shifting reference values to account for voltage sag
ATE520072T1 (en) ELECTRONIC PEN AND CONTROL DEVICE AND METHOD THEREOF
KR101885296B1 (en) Power detection circuit for tracking maximum power point of solar cell and method for detecting using the same
TWI267088B (en) Multi-level cell memory device and associated read method
AU2003232029A1 (en) Serially sensing the output of multilevel cell arrays
TW200709398A (en) Process for erasing chalcogenide variable resistance memory bits
WO2006119303A3 (en) Apparatus and methods for measurement of analog voltages in an integrated circuit
WO2007018829A3 (en) Measurement of current-voltage characteristic curves of solar cells and solar modules
AU2003228271A1 (en) System and method for generating a reference voltage based on averaging the voltages of two complementary programmed dual bit reference cells
AU2003295599A1 (en) Ethanol production by simultaneous saccharification and fermentation (ssf)
EP1761113A3 (en) Dual logarithmic phase-magnitude detector
WO2009041370A1 (en) Degradation detection device for fuel cell, and fuel cell system
TW200705445A (en) Sensing circuit for multi-level flash memory
EP1227563A3 (en) Method for charging a battery
TW200623019A (en) Gamma voltage generating apparatus and method of testing a gamma voltage
WO2007013796A8 (en) Closest user terminal search method for a telecommunication network and service node applying such a method
WO2011047327A3 (en) Apparatus and method for isolating an adaptive voltage scaling (avs) loop in a powered system
TW200531418A (en) A configurable voltage generator
WO2000045569A3 (en) A portable multi-band communication device, and a method for determining a charge consumption thereof

Legal Events

Date Code Title Description
AK Designated states

Kind code of ref document: A2

Designated state(s): AE AG AL AM AT AU AZ BA BB BG BR BW BY BZ CA CH CN CO CR CU CZ DE DK DM DZ EC EE EG ES FI GB GD GE GH GM HR HU ID IL IN IS JP KE KG KP KR KZ LC LK LR LS LT LU LV MA MD MG MK MN MW MX MZ NA NI NO NZ OM PG PH PL PT RO RU SC SD SE SG SK SL SY TJ TM TN TR TT TZ UA UG US UZ VC VN YU ZA ZM ZW

AL Designated countries for regional patents

Kind code of ref document: A2

Designated state(s): BW GH GM KE LS MW MZ NA SD SL SZ TZ UG ZM ZW AM AZ BY KG KZ MD RU TJ TM AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LT LU MC NL PL PT RO SE SI SK TR BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG

NENP Non-entry into the national phase

Ref country code: DE

WWW Wipo information: withdrawn in national office

Country of ref document: DE

122 Ep: pct application non-entry in european phase