WO2006015379A3 - Electron spin resonance microscope for imaging with micron resolution - Google Patents

Electron spin resonance microscope for imaging with micron resolution Download PDF

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Publication number
WO2006015379A3
WO2006015379A3 PCT/US2005/027753 US2005027753W WO2006015379A3 WO 2006015379 A3 WO2006015379 A3 WO 2006015379A3 US 2005027753 W US2005027753 W US 2005027753W WO 2006015379 A3 WO2006015379 A3 WO 2006015379A3
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WO
WIPO (PCT)
Prior art keywords
microscope
coils
permit
systems
methods
Prior art date
Application number
PCT/US2005/027753
Other languages
French (fr)
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WO2006015379A2 (en
Inventor
Aharon Blank
Curt R Dunnam
Peter P Borbat
Jack H Freed
Original Assignee
Cornell Res Foundation Inc
Aharon Blank
Curt R Dunnam
Peter P Borbat
Jack H Freed
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Cornell Res Foundation Inc, Aharon Blank, Curt R Dunnam, Peter P Borbat, Jack H Freed filed Critical Cornell Res Foundation Inc
Publication of WO2006015379A2 publication Critical patent/WO2006015379A2/en
Publication of WO2006015379A3 publication Critical patent/WO2006015379A3/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/20Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/60Arrangements or instruments for measuring magnetic variables involving magnetic resonance using electron paramagnetic resonance

Abstract

ESR microscope systems and methods for examining specimens using both continuous wave and pulsed modes in the 9 to 60 GHz range. The ESR microscope uses an image probe comprising gradient coils in addition to conventional modulation coils (in continuous wave mode) or magnetic field bias coils (in pulse mode), and a resonator constructed from high permittivity material. The systems and methods also involves the use of sample containers that permit the precise placement of samples in relation to the image probe. The microscope uses a microstrip or thin coaxial or dielectric antenna to obtain a high coupling coefficient to the specimen being imaged. The microscope systems provide resolution at the single micron level, and permit the observation of images comprising tens to hundreds of pixels for each of two or three dimensions in a few minutes. Novel stable radicals used as the imaging media are also described.
PCT/US2005/027753 2004-08-02 2005-08-02 Electron spin resonance microscope for imaging with micron resolution WO2006015379A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US59810004P 2004-08-02 2004-08-02
US60/598,100 2004-08-02

Publications (2)

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WO2006015379A2 WO2006015379A2 (en) 2006-02-09
WO2006015379A3 true WO2006015379A3 (en) 2006-04-27

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PCT/US2005/027753 WO2006015379A2 (en) 2004-08-02 2005-08-02 Electron spin resonance microscope for imaging with micron resolution

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US (1) US7403008B2 (en)
WO (1) WO2006015379A2 (en)

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US20060022675A1 (en) 2006-02-02
US7403008B2 (en) 2008-07-22
WO2006015379A2 (en) 2006-02-09

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