WO2006083909A3 - Method of making substitutionally carbon-highly doped crystalline si-layers by cvd - Google Patents
Method of making substitutionally carbon-highly doped crystalline si-layers by cvd Download PDFInfo
- Publication number
- WO2006083909A3 WO2006083909A3 PCT/US2006/003465 US2006003465W WO2006083909A3 WO 2006083909 A3 WO2006083909 A3 WO 2006083909A3 US 2006003465 W US2006003465 W US 2006003465W WO 2006083909 A3 WO2006083909 A3 WO 2006083909A3
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- WIPO (PCT)
- Prior art keywords
- making
- carbon
- substitutionally
- cvd
- layers
- Prior art date
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- 238000004519 manufacturing process Methods 0.000 title 1
- 239000002019 doping agent Substances 0.000 abstract 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 abstract 1
- 229910052799 carbon Inorganic materials 0.000 abstract 1
- 238000005229 chemical vapour deposition Methods 0.000 abstract 1
- 229910021419 crystalline silicon Inorganic materials 0.000 abstract 1
- 238000000151 deposition Methods 0.000 abstract 1
- 230000008021 deposition Effects 0.000 abstract 1
- 238000010348 incorporation Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 239000002243 precursor Substances 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
- VEDJZFSRVVQBIL-UHFFFAOYSA-N trisilane Chemical compound [SiH3][SiH2][SiH3] VEDJZFSRVVQBIL-UHFFFAOYSA-N 0.000 abstract 1
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- H01—ELECTRIC ELEMENTS
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- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
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- H01L29/7848—Field effect transistors with field effect produced by an insulated gate means for exerting mechanical stress on the crystal lattice of the channel region, e.g. using a flexible substrate the means being located in the source/drain region, e.g. SiGe source and drain
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/04—Coating on selected surface areas, e.g. using masks
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- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
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Abstract
Methods of making Si-containing films that contain relatively high levels of substitutional dopants involve chemical vapor deposition using trisilane and a dopant precursor. Extremely high levels of substitutional incorporation may be obtained, including crystalline silicon films that contain 2.4 atomic % or greater substitutional carbon. Substitutionally doped Si-containing films may be selectively deposited onto the crystalline surfaces of mixed substrates by introducing an etchant gas during deposition.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP06720025A EP1846596A2 (en) | 2005-02-04 | 2006-01-31 | Method of making substitutionally carbon-highly doped crystalline si-layers by cvd |
JP2007554171A JP5571287B2 (en) | 2005-02-04 | 2006-01-31 | Method of producing crystalline Si-containing material substituted with carbon by chemical vapor deposition |
Applications Claiming Priority (6)
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US7438760B2 (en) | 2008-10-21 |
TW200633021A (en) | 2006-09-16 |
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WO2006083821A1 (en) | 2006-08-10 |
EP1846596A2 (en) | 2007-10-24 |
TW200710950A (en) | 2007-03-16 |
US7648690B2 (en) | 2010-01-19 |
JP5295344B2 (en) | 2013-09-18 |
TWI385714B (en) | 2013-02-11 |
JP5173140B2 (en) | 2013-03-27 |
EP1846595A1 (en) | 2007-10-24 |
US20060234504A1 (en) | 2006-10-19 |
US7816236B2 (en) | 2010-10-19 |
JP5571287B2 (en) | 2014-08-13 |
KR20080016988A (en) | 2008-02-25 |
JP2006216955A (en) | 2006-08-17 |
US20060205194A1 (en) | 2006-09-14 |
US9190515B2 (en) | 2015-11-17 |
US7687383B2 (en) | 2010-03-30 |
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WO2006083909A2 (en) | 2006-08-10 |
US20090026496A1 (en) | 2009-01-29 |
US20060240630A1 (en) | 2006-10-26 |
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