WO2006104565A3 - Laser projection with object feature detection - Google Patents
Laser projection with object feature detection Download PDFInfo
- Publication number
- WO2006104565A3 WO2006104565A3 PCT/US2006/003707 US2006003707W WO2006104565A3 WO 2006104565 A3 WO2006104565 A3 WO 2006104565A3 US 2006003707 W US2006003707 W US 2006003707W WO 2006104565 A3 WO2006104565 A3 WO 2006104565A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- light
- projection system
- laser projection
- detected
- feedback
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2518—Projection by scanning of the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B21/00—Projectors or projection-type viewers; Accessories therefor
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N9/00—Details of colour television systems
- H04N9/12—Picture reproducers
- H04N9/31—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM]
- H04N9/3129—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM] scanning a light beam on the display screen
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N9/00—Details of colour television systems
- H04N9/12—Picture reproducers
- H04N9/31—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM]
- H04N9/3179—Video signal processing therefor
- H04N9/3185—Geometric adjustment, e.g. keystone or convergence
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N9/00—Details of colour television systems
- H04N9/12—Picture reproducers
- H04N9/31—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM]
- H04N9/3191—Testing thereof
- H04N9/3194—Testing thereof including sensor feedback
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N2021/8411—Application to online plant, process monitoring
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N2021/8472—Investigation of composite materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95623—Inspecting patterns on the surface of objects using a spatial filtering method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/064—Stray light conditioning
- G01N2201/0642—Light traps; baffles
Abstract
A laser projection system scans an output laser light beam onto an object to detect features. A high-sensitivity optical feedback system receives and detects a feedback beam of the output beam light diffusely reflected from the object. The feedback light and projected output beam share the same beam path between beam-steering mirrors of the projector and the object. The laser projection system has light suppression components to control stray scattered light, including ambient light, from being detected. A computer of the laser projection system calculates fiducial points on the object from detected features to align the projection system with the object without using targets. This feature detection is used in a process to guide assembly and fabrication on or to the object, and to verify the accurate placement of parts and fabrication steps in place after they are assembled or processed. In one form, the detected feature is a light spot on the object produced by a second light source.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP06748189.5A EP1851588B1 (en) | 2005-02-01 | 2006-02-01 | Laser projection with object feature detection |
CA2596284A CA2596284C (en) | 2005-02-01 | 2006-02-01 | Laser projection with object feature detection |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US64924105P | 2005-02-01 | 2005-02-01 | |
US60/649,241 | 2005-02-01 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2006104565A2 WO2006104565A2 (en) | 2006-10-05 |
WO2006104565A3 true WO2006104565A3 (en) | 2007-03-01 |
Family
ID=37053835
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2006/003707 WO2006104565A2 (en) | 2005-02-01 | 2006-02-01 | Laser projection with object feature detection |
Country Status (4)
Country | Link |
---|---|
US (1) | US7306339B2 (en) |
EP (1) | EP1851588B1 (en) |
CA (1) | CA2596284C (en) |
WO (1) | WO2006104565A2 (en) |
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TW200720745A (en) * | 2005-11-23 | 2007-06-01 | Hannspree Inc | Automatic laser auxiliary positioning system and method for a production line of display devices |
US20070205875A1 (en) * | 2006-03-03 | 2007-09-06 | De Haan Ido G | Auxiliary device with projection display information alert |
DE102006031580A1 (en) | 2006-07-03 | 2008-01-17 | Faro Technologies, Inc., Lake Mary | Method and device for the three-dimensional detection of a spatial area |
JP5150329B2 (en) * | 2008-03-26 | 2013-02-20 | 株式会社トプコン | Surveying device and surveying system |
US7954953B2 (en) * | 2008-07-30 | 2011-06-07 | Microvision, Inc. | Scanned beam overlay projection |
JP4666060B2 (en) * | 2008-11-14 | 2011-04-06 | 富士ゼロックス株式会社 | Information processing apparatus, information processing system, and program |
DE102009015920B4 (en) | 2009-03-25 | 2014-11-20 | Faro Technologies, Inc. | Device for optically scanning and measuring an environment |
US9551575B2 (en) | 2009-03-25 | 2017-01-24 | Faro Technologies, Inc. | Laser scanner having a multi-color light source and real-time color receiver |
DE102009025201B3 (en) * | 2009-06-12 | 2011-01-27 | Konrad Maierhofer | projection device |
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US8269970B2 (en) * | 2009-07-02 | 2012-09-18 | Quality Vision International, Inc. | Optical comparator with digital gage |
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DE102009057101A1 (en) | 2009-11-20 | 2011-05-26 | Faro Technologies, Inc., Lake Mary | Device for optically scanning and measuring an environment |
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DE102010020925B4 (en) | 2010-05-10 | 2014-02-27 | Faro Technologies, Inc. | Method for optically scanning and measuring an environment |
US20120001061A1 (en) * | 2010-07-02 | 2012-01-05 | Hamilton Sundstrand Corporation | Ion implanted beam dump |
DE112011102995B4 (en) | 2010-09-08 | 2016-05-19 | Faro Technologies Inc. | Laser scanner or laser tracking device with a projector |
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US8997362B2 (en) | 2012-07-17 | 2015-04-07 | Faro Technologies, Inc. | Portable articulated arm coordinate measuring machine with optical communications bus |
US9513107B2 (en) | 2012-10-05 | 2016-12-06 | Faro Technologies, Inc. | Registration calculation between three-dimensional (3D) scans based on two-dimensional (2D) scan data from a 3D scanner |
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US10067231B2 (en) | 2012-10-05 | 2018-09-04 | Faro Technologies, Inc. | Registration calculation of three-dimensional scanner data performed between scans based on measurements by two-dimensional scanner |
US9644942B2 (en) | 2012-11-29 | 2017-05-09 | Mitsubishi Hitachi Power Systems, Ltd. | Method and apparatus for laser projection, and machining method |
US9121692B2 (en) * | 2013-03-13 | 2015-09-01 | Trimble Navigation Limited | Method and apparatus for projection of BIM information |
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2006
- 2006-02-01 US US11/345,784 patent/US7306339B2/en active Active
- 2006-02-01 WO PCT/US2006/003707 patent/WO2006104565A2/en active Application Filing
- 2006-02-01 CA CA2596284A patent/CA2596284C/en not_active Expired - Fee Related
- 2006-02-01 EP EP06748189.5A patent/EP1851588B1/en active Active
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Also Published As
Publication number | Publication date |
---|---|
US7306339B2 (en) | 2007-12-11 |
EP1851588A2 (en) | 2007-11-07 |
EP1851588B1 (en) | 2019-08-07 |
EP1851588A4 (en) | 2010-08-04 |
US20060170870A1 (en) | 2006-08-03 |
CA2596284C (en) | 2016-07-26 |
CA2596284A1 (en) | 2006-10-05 |
WO2006104565A2 (en) | 2006-10-05 |
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