WO2006119404A3 - Method and system for configuring parameters for a flash memory - Google Patents

Method and system for configuring parameters for a flash memory Download PDF

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Publication number
WO2006119404A3
WO2006119404A3 PCT/US2006/017096 US2006017096W WO2006119404A3 WO 2006119404 A3 WO2006119404 A3 WO 2006119404A3 US 2006017096 W US2006017096 W US 2006017096W WO 2006119404 A3 WO2006119404 A3 WO 2006119404A3
Authority
WO
WIPO (PCT)
Prior art keywords
flash memory
configuring parameters
configuration
address
configuration value
Prior art date
Application number
PCT/US2006/017096
Other languages
French (fr)
Other versions
WO2006119404A2 (en
Inventor
Stefano Surico
Simone Bartoli
Mirella Marsella
Giorgio Bosisio
Original Assignee
Atmel Corp
Stefano Surico
Simone Bartoli
Mirella Marsella
Giorgio Bosisio
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atmel Corp, Stefano Surico, Simone Bartoli, Mirella Marsella, Giorgio Bosisio filed Critical Atmel Corp
Publication of WO2006119404A2 publication Critical patent/WO2006119404A2/en
Publication of WO2006119404A3 publication Critical patent/WO2006119404A3/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/20—Initialising; Data preset; Chip identification
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/021—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in voltage or current generators
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C2029/4402—Internal storage of test result, quality data, chip identification, repair information

Abstract

Method and system for configuring parameters used in flash memory devices. A load instruction and associated address are retrieved from a read-only memory, and the address is used to select a configuration register storing a configuration value. The configuration value is loaded to an associated dedicated register to configure a parameter of the flash memory in a flash memory operation. In another aspect, one or more selected configuration values not stored in a ROM are changed if a tested flash memory operation is not within desired specifications.
PCT/US2006/017096 2005-05-03 2006-05-03 Method and system for configuring parameters for a flash memory WO2006119404A2 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
ITMI2005A00799 2005-05-03
IT000799A ITMI20050799A1 (en) 2005-05-03 2005-05-03 METHOD AND CONFIGURATION SYSTEM OF PARAMETERS FOR A FLASH MEMORY
US11/272,206 2005-11-10
US11/272,206 US7181565B2 (en) 2005-05-03 2005-11-10 Method and system for configuring parameters for flash memory

Publications (2)

Publication Number Publication Date
WO2006119404A2 WO2006119404A2 (en) 2006-11-09
WO2006119404A3 true WO2006119404A3 (en) 2007-04-05

Family

ID=37395307

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2006/017096 WO2006119404A2 (en) 2005-05-03 2006-05-03 Method and system for configuring parameters for a flash memory

Country Status (4)

Country Link
US (2) US7181565B2 (en)
IT (1) ITMI20050799A1 (en)
TW (1) TW200707441A (en)
WO (1) WO2006119404A2 (en)

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US7720556B2 (en) * 2005-12-21 2010-05-18 Lsi Corporation Web-enabled solutions for memory compilation to support pre-sales estimation of memory size, performance and power data for memory components
KR100936149B1 (en) * 2006-12-29 2010-01-12 삼성전자주식회사 Memory system chip having a plural of memorys and memory access methtod thereof
US7414891B2 (en) 2007-01-04 2008-08-19 Atmel Corporation Erase verify method for NAND-type flash memories
US8002332B2 (en) 2007-01-30 2011-08-23 Zephyros, Inc. Structural mounting insert
US7882405B2 (en) * 2007-02-16 2011-02-01 Atmel Corporation Embedded architecture with serial interface for testing flash memories
US20080232169A1 (en) * 2007-03-20 2008-09-25 Atmel Corporation Nand-like memory array employing high-density nor-like memory devices
US8181327B2 (en) 2008-02-08 2012-05-22 Zephyros, Inc Mechanical method for improving bond joint strength
US9194408B2 (en) 2008-02-08 2015-11-24 Zephyros, Inc. Mechanical method for improving bond joint strength
US7957187B2 (en) * 2008-05-09 2011-06-07 Sandisk Corporation Dynamic and adaptive optimization of read compare levels based on memory cell threshold voltage distribution
US20100112968A1 (en) * 2008-10-30 2010-05-06 Motorola, Inc. Method and apparatus for cloning contents of a source radio into a target radio
US7984919B2 (en) * 2009-05-18 2011-07-26 Zephyros, Inc. Structural mounting insert having a non-conductive isolator
US9311102B2 (en) * 2010-07-13 2016-04-12 Advanced Micro Devices, Inc. Dynamic control of SIMDs
US8689516B2 (en) 2011-03-17 2014-04-08 Zephyros, Inc. Bonding assembly
JP2012203951A (en) * 2011-03-24 2012-10-22 Toshiba Corp Semiconductor storage device
US10481992B1 (en) * 2011-03-31 2019-11-19 EMC IP Holding Company LLC Optimization of flash storage
US9257162B2 (en) * 2012-06-18 2016-02-09 Intel Corporation Alternate control settings
US8938597B2 (en) 2012-10-23 2015-01-20 Seagate Technology Llc Restoring virtualized GCU state information
US9076545B2 (en) 2013-01-17 2015-07-07 Sandisk Tecnologies Inc. Dynamic adjustment of read voltage levels based on memory cell threshold voltage distribution
US9251053B2 (en) * 2013-03-14 2016-02-02 SanDisk Technologies, Inc. Managing configuration parameters for a non-volatile medium
US8766707B1 (en) 2013-03-15 2014-07-01 Seagate Technology Llc Integrated always on power island for low power mode operation
US9411394B2 (en) 2013-03-15 2016-08-09 Seagate Technology Llc PHY based wake up from low power mode operation
US9335809B2 (en) 2013-03-15 2016-05-10 Seagate Technology Llc Volatile memory storing system data during low power mode operation and monitoring the voltage supplied to the memory during low power mode
GB201318595D0 (en) 2013-10-21 2013-12-04 Zephyros Inc Improvements in or relating to laminates
CN105916651B (en) 2013-12-17 2018-11-02 泽菲罗斯公司 A kind of reinforced structure and its manufacturing method including fiber insert
US10713392B2 (en) * 2017-09-29 2020-07-14 Xilinx, Inc. Network interface device and method
US10721072B2 (en) 2017-09-29 2020-07-21 Xilinx, Inc. Network interface device and method

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US20020144103A1 (en) * 2001-03-29 2002-10-03 Kendall Terry L. Non-volatile alterable default flash memory configuration registers
US20050086456A1 (en) * 2003-09-29 2005-04-21 Yaron Elboim Addressing scheme to load configuration registers
US6907496B2 (en) * 2002-05-02 2005-06-14 International Business Machines Corporation Method and apparatus for auto-detection of a configuration of a flash memory
US20050280072A1 (en) * 2001-09-12 2005-12-22 Micron Technology, Inc. Test mode decoder in a flash memory

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Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020144103A1 (en) * 2001-03-29 2002-10-03 Kendall Terry L. Non-volatile alterable default flash memory configuration registers
US20050280072A1 (en) * 2001-09-12 2005-12-22 Micron Technology, Inc. Test mode decoder in a flash memory
US6907496B2 (en) * 2002-05-02 2005-06-14 International Business Machines Corporation Method and apparatus for auto-detection of a configuration of a flash memory
US20050086456A1 (en) * 2003-09-29 2005-04-21 Yaron Elboim Addressing scheme to load configuration registers

Also Published As

Publication number Publication date
ITMI20050799A1 (en) 2006-11-04
US7181565B2 (en) 2007-02-20
US7249215B2 (en) 2007-07-24
WO2006119404A2 (en) 2006-11-09
TW200707441A (en) 2007-02-16
US20060253644A1 (en) 2006-11-09
US20070083699A1 (en) 2007-04-12

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