WO2007112164A3 - High efficiency intersubband semiconductor lasers - Google Patents
High efficiency intersubband semiconductor lasers Download PDFInfo
- Publication number
- WO2007112164A3 WO2007112164A3 PCT/US2007/062569 US2007062569W WO2007112164A3 WO 2007112164 A3 WO2007112164 A3 WO 2007112164A3 US 2007062569 W US2007062569 W US 2007062569W WO 2007112164 A3 WO2007112164 A3 WO 2007112164A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- energy level
- electrons
- photon
- emission
- high efficiency
- Prior art date
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/3401—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having no PN junction, e.g. unipolar lasers, intersubband lasers, quantum cascade lasers
- H01S5/3402—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having no PN junction, e.g. unipolar lasers, intersubband lasers, quantum cascade lasers intersubband lasers, e.g. transitions within the conduction or valence bands
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/3403—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having a strained layer structure in which the strain performs a special function, e.g. general strain effects, strain versus polarisation
- H01S5/3406—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having a strained layer structure in which the strain performs a special function, e.g. general strain effects, strain versus polarisation including strain compensation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/3407—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers characterised by special barrier layers
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
- Y10S977/949—Radiation emitter using nanostructure
- Y10S977/95—Electromagnetic energy
- Y10S977/951—Laser
Abstract
An intersubband quantum cascade laser structure includes multiple coupled laser stages, wherein each stage has a multilayer structure including an electron injector, an active region with at least one quantum well, and an electron reflector. Electrons injected from the injector into the active region at a high energy level relax to a lower energy level with the emission of a photon at, for example, mid-infrared wavelengths. The reflector reflects electrons at the higher energy level at which they were injected and transmits electrons from the lower energy level after emission of a photon. Multiple layers of semiconductor are formed on each side of the multistage structure to provide conduction across the device and to provide optical confinement of the photons emitted.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP07757323.6A EP2002518A4 (en) | 2006-03-10 | 2007-02-22 | High efficiency intersubband semiconductor lasers |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/276,712 US7403552B2 (en) | 2006-03-10 | 2006-03-10 | High efficiency intersubband semiconductor lasers |
US11/276,712 | 2006-03-10 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2007112164A2 WO2007112164A2 (en) | 2007-10-04 |
WO2007112164A3 true WO2007112164A3 (en) | 2009-02-05 |
Family
ID=38541778
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2007/062569 WO2007112164A2 (en) | 2006-03-10 | 2007-02-22 | High efficiency intersubband semiconductor lasers |
Country Status (3)
Country | Link |
---|---|
US (2) | US7403552B2 (en) |
EP (1) | EP2002518A4 (en) |
WO (1) | WO2007112164A2 (en) |
Families Citing this family (26)
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US7558305B2 (en) * | 2003-12-31 | 2009-07-07 | Wisconsin Alumni Research Foundation | Intersubband mid-infrared electroluminescent semiconductor devices |
US7609738B2 (en) * | 2006-10-30 | 2009-10-27 | Maxion Technologies, Inc. | Multiple phonon resonance quantum cascade lasers |
TWI318815B (en) * | 2006-12-20 | 2009-12-21 | Ind Tech Res Inst | Multiwavelength semiconductor laser array and method of manufacturing the same |
US8115213B2 (en) * | 2007-02-08 | 2012-02-14 | Phoseon Technology, Inc. | Semiconductor light sources, systems, and methods |
FR2933542B1 (en) * | 2008-07-04 | 2016-03-04 | Thales Sa | QUANTIC CASCADES DEVICE WITH HIGH INJECTOR |
US8098702B1 (en) * | 2008-09-09 | 2012-01-17 | United States Of America As Represented By The Secretary Of The Navy | Step well quantum cascade structures |
US8421058B2 (en) * | 2008-11-21 | 2013-04-16 | Agency For Science, Technology And Research | Light emitting diode structure having superlattice with reduced electron kinetic energy therein |
TW201029218A (en) * | 2009-01-16 | 2010-08-01 | Univ Nat Central | Optical diode structure and manufacturing method |
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US8259767B2 (en) | 2009-12-16 | 2012-09-04 | Wisconsin Alumni Research Foundation | High-power quantum cascade lasers with active-photonic-crystal structure |
WO2012021333A2 (en) * | 2010-08-11 | 2012-02-16 | President And Fellows Of Harvard College | Broadband quantum cascade laser source |
US8325774B2 (en) | 2010-08-12 | 2012-12-04 | Wisconsin Alumni Research Foundation | High power, high efficiency quantum cascade lasers with reduced electron leakage |
US8428093B2 (en) | 2011-03-11 | 2013-04-23 | Wisconsin Alumni Research Foundation | High-power quantum cascade lasers with active-photonic-crystal structure for single, in-phase mode operation |
US20130114628A1 (en) * | 2011-11-07 | 2013-05-09 | Catherine Genevieve Caneau | Multi-wavelength dbr laser |
US9548590B2 (en) | 2011-11-29 | 2017-01-17 | Thorlabs Quantum Electronics, Inc. | Quantum cascade laser design with stepped well active region |
US9450053B2 (en) * | 2012-07-26 | 2016-09-20 | Massachusetts Institute Of Technology | Photonic integrated circuits based on quantum cascade structures |
US8848754B2 (en) | 2012-08-22 | 2014-09-30 | Wisconsin Alumni Research Foundation | Multiquantum well structures for suppression of electron leakage and reduction of threshold-current density in quantum cascade lasers |
CN105659383A (en) * | 2013-10-21 | 2016-06-08 | 传感器电子技术股份有限公司 | Heterostructure including a composite semiconductor layer |
JP6161160B2 (en) * | 2013-10-31 | 2017-07-12 | 国立研究開発法人理化学研究所 | Quantum cascade laser device |
KR102113256B1 (en) * | 2013-11-07 | 2020-05-20 | 삼성전자주식회사 | Optical device including three coupled quantum well structure having multi-energy level |
JP6282756B2 (en) * | 2015-03-13 | 2018-02-21 | 株式会社東芝 | Quantum cascade laser |
WO2017123309A2 (en) * | 2016-01-06 | 2017-07-20 | Northwestern University | Monolithical widely tunable quantum cascade laser devices |
KR102477094B1 (en) * | 2016-01-08 | 2022-12-13 | 삼성전자주식회사 | Optical device including three coupled quantum well structure having asymmetric multi-energy levels |
KR20200049026A (en) * | 2018-10-31 | 2020-05-08 | 엘지이노텍 주식회사 | A surface-emitting laser device and light emitting device including the same |
CN114552379B (en) * | 2020-11-25 | 2023-08-08 | 上海禾赛科技有限公司 | Resonant cavity, laser unit, laser and laser radar |
JP7203282B1 (en) * | 2022-01-24 | 2023-01-12 | 三菱電機株式会社 | Quantum cascade laser device manufacturing method and quantum cascade laser device |
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2008
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Title |
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See also references of EP2002518A4 * |
SIRTORI ET AL.: "GaAs-AlGaAs Quantum Cascade Lasers: Physics, Technology and Prospects", IEEE JOURNAL QUANTUM ELECTRONICS, vol. 38, June 2002 (2002-06-01), XP011065197 * |
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Also Published As
Publication number | Publication date |
---|---|
EP2002518A2 (en) | 2008-12-17 |
US20070248131A1 (en) | 2007-10-25 |
US20090022196A1 (en) | 2009-01-22 |
US7403552B2 (en) | 2008-07-22 |
WO2007112164A2 (en) | 2007-10-04 |
US7856042B2 (en) | 2010-12-21 |
EP2002518A4 (en) | 2017-03-29 |
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