WO2007134316A3 - Off-die charge pump that supplies multiple flash devices - Google Patents

Off-die charge pump that supplies multiple flash devices Download PDF

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Publication number
WO2007134316A3
WO2007134316A3 PCT/US2007/068958 US2007068958W WO2007134316A3 WO 2007134316 A3 WO2007134316 A3 WO 2007134316A3 US 2007068958 W US2007068958 W US 2007068958W WO 2007134316 A3 WO2007134316 A3 WO 2007134316A3
Authority
WO
WIPO (PCT)
Prior art keywords
charge pump
flash memory
multiple flash
flash devices
supplies multiple
Prior art date
Application number
PCT/US2007/068958
Other languages
French (fr)
Other versions
WO2007134316A2 (en
Inventor
Michael J Cornwell
Christopher P Dudte
Original Assignee
Apple Inc
Michael J Cornwell
Christopher P Dudte
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Apple Inc, Michael J Cornwell, Christopher P Dudte filed Critical Apple Inc
Publication of WO2007134316A2 publication Critical patent/WO2007134316A2/en
Publication of WO2007134316A3 publication Critical patent/WO2007134316A3/en

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Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G11C11/5628Programming or writing circuits; Data input circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/04Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0483Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/10Programming or data input circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/24Bit-line control circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/30Power supply circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70Masking faults in memories by using spares or by reconfiguring
    • G11C29/78Masking faults in memories by using spares or by reconfiguring using programmable devices
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/02Disposition of storage elements, e.g. in the form of a matrix array
    • G11C5/04Supports for storage elements, e.g. memory modules; Mounting or fixing of storage elements on such supports
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/14Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/145Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G11C11/5642Sensing or reading circuits; Data output circuits

Abstract

A system and method for storing data uses multiple flash memory dies. Each flash memory die (103) includes multiple flash memory cells (124). A charge pump (1010) is adapted to supply charge at a predetermined voltage to each flash memory die of the flash memory dies, and an interface (115) is adapted to receive instructions for controlling the charge pump (1010).
PCT/US2007/068958 2006-05-15 2007-05-15 Off-die charge pump that supplies multiple flash devices WO2007134316A2 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US80035706P 2006-05-15 2006-05-15
US60/800,357 2006-05-15
US11/694,799 US8000134B2 (en) 2006-05-15 2007-03-30 Off-die charge pump that supplies multiple flash devices
US11/694,799 2007-03-30

Publications (2)

Publication Number Publication Date
WO2007134316A2 WO2007134316A2 (en) 2007-11-22
WO2007134316A3 true WO2007134316A3 (en) 2008-03-27

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2007/068958 WO2007134316A2 (en) 2006-05-15 2007-05-15 Off-die charge pump that supplies multiple flash devices

Country Status (2)

Country Link
US (6) US8000134B2 (en)
WO (1) WO2007134316A2 (en)

Families Citing this family (102)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8000134B2 (en) * 2006-05-15 2011-08-16 Apple Inc. Off-die charge pump that supplies multiple flash devices
US7911834B2 (en) * 2006-05-15 2011-03-22 Apple Inc. Analog interface for a flash memory die
US8738841B2 (en) 2007-12-27 2014-05-27 Sandisk Enterprise IP LLC. Flash memory controller and system including data pipelines incorporating multiple buffers
US8365039B2 (en) * 2008-05-21 2013-01-29 Intel Corporation Adjustable read reference for non-volatile memory
US20090292971A1 (en) * 2008-05-21 2009-11-26 Chun Fung Man Data recovery techniques
US8276028B2 (en) * 2008-05-23 2012-09-25 Intel Corporation Using error information from nearby locations to recover uncorrectable data in non-volatile memory
JP5185156B2 (en) * 2009-02-24 2013-04-17 株式会社東芝 Memory controller and semiconductor memory device
US8407564B2 (en) * 2009-07-15 2013-03-26 Intel Corporation Prediction and cancellation of systematic noise sources in non-volatile memory
US20110286271A1 (en) * 2010-05-21 2011-11-24 Mediatek Inc. Memory systems and methods for reading data stored in a memory cell of a memory device
US9218852B2 (en) 2011-06-30 2015-12-22 Sandisk Technologies Inc. Smart bridge for memory core
US8713404B2 (en) * 2011-07-01 2014-04-29 Apple Inc. Controller interface providing improved data reliability
US8921991B2 (en) 2011-09-01 2014-12-30 Chengdu Haicun Ip Technology Llc Discrete three-dimensional memory
US9117493B2 (en) 2011-09-01 2015-08-25 Chengdu Haicun Ip Technology Llc Discrete three-dimensional memory comprising off-die address/data translator
US9093129B2 (en) 2011-09-01 2015-07-28 Chengdu Haicun Ip Technology Llc Discrete three-dimensional memory comprising dice with different BEOL structures
US8890300B2 (en) 2011-09-01 2014-11-18 Chengdu Haicun Ip Technology Llc Discrete three-dimensional memory comprising off-die read/write-voltage generator
US9024425B2 (en) 2011-09-01 2015-05-05 HangZhou HaiCun Information Technology Co., Ltd. Three-dimensional memory comprising an integrated intermediate-circuit die
US8839083B2 (en) * 2011-10-25 2014-09-16 Taejin Info Tech Co., Ltd. Secure error detection and synchronous data tagging for high-speed data transfer
US8793543B2 (en) 2011-11-07 2014-07-29 Sandisk Enterprise Ip Llc Adaptive read comparison signal generation for memory systems
US9208070B2 (en) 2011-12-20 2015-12-08 Sandisk Technologies Inc. Wear leveling of multiple memory devices
US8645770B2 (en) 2012-01-18 2014-02-04 Apple Inc. Systems and methods for proactively refreshing nonvolatile memory
TWI451106B (en) * 2012-03-26 2014-09-01 Silicon Motion Inc Wafer testing system and testing method thereof
US9699263B1 (en) 2012-08-17 2017-07-04 Sandisk Technologies Llc. Automatic read and write acceleration of data accessed by virtual machines
US9501398B2 (en) 2012-12-26 2016-11-22 Sandisk Technologies Llc Persistent storage device with NVRAM for staging writes
US9612948B2 (en) 2012-12-27 2017-04-04 Sandisk Technologies Llc Reads and writes between a contiguous data block and noncontiguous sets of logical address blocks in a persistent storage device
US9239751B1 (en) 2012-12-27 2016-01-19 Sandisk Enterprise Ip Llc Compressing data from multiple reads for error control management in memory systems
US9454420B1 (en) 2012-12-31 2016-09-27 Sandisk Technologies Llc Method and system of reading threshold voltage equalization
US9870830B1 (en) 2013-03-14 2018-01-16 Sandisk Technologies Llc Optimal multilevel sensing for reading data from a storage medium
US9136877B1 (en) 2013-03-15 2015-09-15 Sandisk Enterprise Ip Llc Syndrome layered decoding for LDPC codes
US9367246B2 (en) * 2013-03-15 2016-06-14 Sandisk Technologies Inc. Performance optimization of data transfer for soft information generation
US9244763B1 (en) 2013-03-15 2016-01-26 Sandisk Enterprise Ip Llc System and method for updating a reading threshold voltage based on symbol transition information
US9236886B1 (en) 2013-03-15 2016-01-12 Sandisk Enterprise Ip Llc Universal and reconfigurable QC-LDPC encoder
US9159437B2 (en) 2013-06-11 2015-10-13 Sandisk Enterprise IP LLC. Device and method for resolving an LM flag issue
US9384126B1 (en) 2013-07-25 2016-07-05 Sandisk Technologies Inc. Methods and systems to avoid false negative results in bloom filters implemented in non-volatile data storage systems
US9524235B1 (en) 2013-07-25 2016-12-20 Sandisk Technologies Llc Local hash value generation in non-volatile data storage systems
US9235509B1 (en) 2013-08-26 2016-01-12 Sandisk Enterprise Ip Llc Write amplification reduction by delaying read access to data written during garbage collection
US9639463B1 (en) 2013-08-26 2017-05-02 Sandisk Technologies Llc Heuristic aware garbage collection scheme in storage systems
JP6275427B2 (en) * 2013-09-06 2018-02-07 株式会社東芝 Memory control circuit and cache memory
JP2015053096A (en) 2013-09-09 2015-03-19 マイクロン テクノロジー, インク. Semiconductor device and error correction method
US9298608B2 (en) 2013-10-18 2016-03-29 Sandisk Enterprise Ip Llc Biasing for wear leveling in storage systems
US9442662B2 (en) 2013-10-18 2016-09-13 Sandisk Technologies Llc Device and method for managing die groups
US9436831B2 (en) 2013-10-30 2016-09-06 Sandisk Technologies Llc Secure erase in a memory device
US9263156B2 (en) 2013-11-07 2016-02-16 Sandisk Enterprise Ip Llc System and method for adjusting trip points within a storage device
US9244785B2 (en) 2013-11-13 2016-01-26 Sandisk Enterprise Ip Llc Simulated power failure and data hardening
US9703816B2 (en) 2013-11-19 2017-07-11 Sandisk Technologies Llc Method and system for forward reference logging in a persistent datastore
US9520197B2 (en) 2013-11-22 2016-12-13 Sandisk Technologies Llc Adaptive erase of a storage device
US9520162B2 (en) 2013-11-27 2016-12-13 Sandisk Technologies Llc DIMM device controller supervisor
US9582058B2 (en) 2013-11-29 2017-02-28 Sandisk Technologies Llc Power inrush management of storage devices
US9235245B2 (en) 2013-12-04 2016-01-12 Sandisk Enterprise Ip Llc Startup performance and power isolation
US9703636B2 (en) 2014-03-01 2017-07-11 Sandisk Technologies Llc Firmware reversion trigger and control
US9390814B2 (en) 2014-03-19 2016-07-12 Sandisk Technologies Llc Fault detection and prediction for data storage elements
US9454448B2 (en) 2014-03-19 2016-09-27 Sandisk Technologies Llc Fault testing in storage devices
US9448876B2 (en) 2014-03-19 2016-09-20 Sandisk Technologies Llc Fault detection and prediction in storage devices
US9390021B2 (en) 2014-03-31 2016-07-12 Sandisk Technologies Llc Efficient cache utilization in a tiered data structure
US9626400B2 (en) 2014-03-31 2017-04-18 Sandisk Technologies Llc Compaction of information in tiered data structure
US9626399B2 (en) 2014-03-31 2017-04-18 Sandisk Technologies Llc Conditional updates for reducing frequency of data modification operations
US9697267B2 (en) 2014-04-03 2017-07-04 Sandisk Technologies Llc Methods and systems for performing efficient snapshots in tiered data structures
US10211258B2 (en) 2014-04-14 2019-02-19 HangZhou HaiCun Information Technology Co., Ltd. Manufacturing methods of JFET-type compact three-dimensional memory
US10079239B2 (en) 2014-04-14 2018-09-18 HangZhou HaiCun Information Technology Co., Ltd. Compact three-dimensional mask-programmed read-only memory
US10199432B2 (en) 2014-04-14 2019-02-05 HangZhou HaiCun Information Technology Co., Ltd. Manufacturing methods of MOSFET-type compact three-dimensional memory
US10304495B2 (en) 2014-04-14 2019-05-28 Chengdu Haicun Ip Technology Llc Compact three-dimensional memory with semi-conductive address line portion
CN104978990B (en) 2014-04-14 2017-11-10 成都海存艾匹科技有限公司 Compact three-dimensional storage
US10304553B2 (en) 2014-04-14 2019-05-28 HangZhou HaiCun Information Technology Co., Ltd. Compact three-dimensional memory with an above-substrate decoding stage
US10381102B2 (en) 2014-04-30 2019-08-13 Micron Technology, Inc. Memory devices having a read function of data stored in a plurality of reference cells
US9703491B2 (en) 2014-05-30 2017-07-11 Sandisk Technologies Llc Using history of unaligned writes to cache data and avoid read-modify-writes in a non-volatile storage device
US10372613B2 (en) 2014-05-30 2019-08-06 Sandisk Technologies Llc Using sub-region I/O history to cache repeatedly accessed sub-regions in a non-volatile storage device
US10114557B2 (en) 2014-05-30 2018-10-30 Sandisk Technologies Llc Identification of hot regions to enhance performance and endurance of a non-volatile storage device
US10656840B2 (en) 2014-05-30 2020-05-19 Sandisk Technologies Llc Real-time I/O pattern recognition to enhance performance and endurance of a storage device
US10656842B2 (en) 2014-05-30 2020-05-19 Sandisk Technologies Llc Using history of I/O sizes and I/O sequences to trigger coalesced writes in a non-volatile storage device
US10162748B2 (en) 2014-05-30 2018-12-25 Sandisk Technologies Llc Prioritizing garbage collection and block allocation based on I/O history for logical address regions
US10146448B2 (en) 2014-05-30 2018-12-04 Sandisk Technologies Llc Using history of I/O sequences to trigger cached read ahead in a non-volatile storage device
US9652381B2 (en) 2014-06-19 2017-05-16 Sandisk Technologies Llc Sub-block garbage collection
US9443601B2 (en) 2014-09-08 2016-09-13 Sandisk Technologies Llc Holdup capacitor energy harvesting
US20170270044A1 (en) * 2014-10-03 2017-09-21 Agency For Science, Technology And Research Active Storage Unit and Array
US9224491B1 (en) * 2014-12-30 2015-12-29 Sandisk Technologies Inc. Average voltage band detection and use for tuning of voltages in ASICS
US10387259B2 (en) * 2015-06-26 2019-08-20 Intel Corporation Instant restart in non volatile system memory computing systems with embedded programmable data checking
KR20170062635A (en) 2015-11-27 2017-06-08 삼성전자주식회사 Semiconductor memory device for diminishing peak current in multi memory dies structure
US10490251B2 (en) 2017-01-30 2019-11-26 Micron Technology, Inc. Apparatuses and methods for distributing row hammer refresh events across a memory device
US11017833B2 (en) 2018-05-24 2021-05-25 Micron Technology, Inc. Apparatuses and methods for pure-time, self adopt sampling for row hammer refresh sampling
US10573370B2 (en) 2018-07-02 2020-02-25 Micron Technology, Inc. Apparatus and methods for triggering row hammer address sampling
US10685696B2 (en) 2018-10-31 2020-06-16 Micron Technology, Inc. Apparatuses and methods for access based refresh timing
CN113168861A (en) 2018-12-03 2021-07-23 美光科技公司 Semiconductor device for performing row hammer refresh operation
CN117198356A (en) * 2018-12-21 2023-12-08 美光科技公司 Apparatus and method for timing interleaving for targeted refresh operations
US11615831B2 (en) 2019-02-26 2023-03-28 Micron Technology, Inc. Apparatuses and methods for memory mat refresh sequencing
US10789015B2 (en) 2019-03-01 2020-09-29 Micron Technology, Inc. Background operations in memory
US11227649B2 (en) 2019-04-04 2022-01-18 Micron Technology, Inc. Apparatuses and methods for staggered timing of targeted refresh operations
US11069393B2 (en) 2019-06-04 2021-07-20 Micron Technology, Inc. Apparatuses and methods for controlling steal rates
US10978132B2 (en) 2019-06-05 2021-04-13 Micron Technology, Inc. Apparatuses and methods for staggered timing of skipped refresh operations
US11302374B2 (en) 2019-08-23 2022-04-12 Micron Technology, Inc. Apparatuses and methods for dynamic refresh allocation
US11302377B2 (en) 2019-10-16 2022-04-12 Micron Technology, Inc. Apparatuses and methods for dynamic targeted refresh steals
US11095299B1 (en) * 2020-03-30 2021-08-17 Sitrus Technology Corporation ADC having adjustable threshold levels for PAM signal processing
CN111261213B (en) * 2020-04-30 2020-09-01 深圳市芯天下技术有限公司 Erasing method of NOR Flash
US11782685B2 (en) 2020-06-17 2023-10-10 Bank Of America Corporation Software code vectorization converter
US11347500B2 (en) 2020-06-17 2022-05-31 Bank Of America Corporation Software code converter for resolving conflicts during code development
US11573775B2 (en) 2020-06-17 2023-02-07 Bank Of America Corporation Software code converter for resolving redundancy during code development
US11309010B2 (en) 2020-08-14 2022-04-19 Micron Technology, Inc. Apparatuses, systems, and methods for memory directed access pause
US11380382B2 (en) 2020-08-19 2022-07-05 Micron Technology, Inc. Refresh logic circuit layout having aggressor detector circuit sampling circuit and row hammer refresh control circuit
US11348631B2 (en) 2020-08-19 2022-05-31 Micron Technology, Inc. Apparatuses, systems, and methods for identifying victim rows in a memory device which cannot be simultaneously refreshed
US11557331B2 (en) 2020-09-23 2023-01-17 Micron Technology, Inc. Apparatuses and methods for controlling refresh operations
US11222686B1 (en) 2020-11-12 2022-01-11 Micron Technology, Inc. Apparatuses and methods for controlling refresh timing
US11264079B1 (en) 2020-12-18 2022-03-01 Micron Technology, Inc. Apparatuses and methods for row hammer based cache lockdown
US11776637B2 (en) 2022-02-03 2023-10-03 Western Digital Technologies, Inc. Voltage sharing across memory dies in response to a charge pump failure
US20240054046A1 (en) * 2022-08-09 2024-02-15 Micron Technology, Inc. Error-handling management during copyback operations in memory devices

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1993022770A1 (en) * 1992-05-01 1993-11-11 Motorola, Inc. Method and apparatus for storage of digital information
US5745414A (en) * 1994-09-14 1998-04-28 Information Storage Devices, Inc. Integrated circuit system having reference cells for improving the reading of storage cells
WO2002067269A2 (en) * 2001-02-16 2002-08-29 Sandisk Corporation Method and system for distributed power generation in multi-chip memory systems
US20020140463A1 (en) * 2001-03-15 2002-10-03 Paul Cheung Programmable soft-start control for charge pump
US20050146919A1 (en) * 2003-12-29 2005-07-07 Ellis Robert M. Memory system segmented power supply and control

Family Cites Families (109)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US613414A (en) * 1898-11-01 And samuel a
JPS5570986U (en) 1978-11-06 1980-05-16
JPS5570986A (en) 1978-11-24 1980-05-28 Hitachi Ltd Semiconductor intergrated circuit device
US4831403A (en) 1985-12-27 1989-05-16 Minolta Camera Kabushiki Kaisha Automatic focus detection system
DE69033262T2 (en) 1989-04-13 2000-02-24 Sandisk Corp EEPROM card with replacement of faulty memory cells and buffer
US5109496A (en) 1989-09-27 1992-04-28 International Business Machines Corporation Most recently used address translation system with least recently used (LRU) replacement
US5218569A (en) 1991-02-08 1993-06-08 Banks Gerald J Electrically alterable non-volatile memory with n-bits per memory cell
US5663901A (en) 1991-04-11 1997-09-02 Sandisk Corporation Computer memory cards using flash EEPROM integrated circuit chips and memory-controller systems
US6230233B1 (en) 1991-09-13 2001-05-08 Sandisk Corporation Wear leveling techniques for flash EEPROM systems
US6222762B1 (en) 1992-01-14 2001-04-24 Sandisk Corporation Multi-state memory
US5412601A (en) 1992-08-31 1995-05-02 Nippon Steel Corporation Non-volatile semiconductor memory device capable of storing multi-value data in each memory cell
US5812814A (en) 1993-02-26 1998-09-22 Kabushiki Kaisha Toshiba Alternative flash EEPROM semiconductor memory system
US5424978A (en) 1993-03-15 1995-06-13 Nippon Steel Corporation Non-volatile semiconductor memory cell capable of storing more than two different data and method of using the same
US5394450A (en) 1993-04-13 1995-02-28 Waferscale Integration, Inc. Circuit for performing arithmetic operations
US7137011B1 (en) 1993-09-01 2006-11-14 Sandisk Corporation Removable mother/daughter peripheral card
JP3205658B2 (en) 1993-12-28 2001-09-04 新日本製鐵株式会社 Reading method of semiconductor memory device
US5563838A (en) 1994-02-01 1996-10-08 Micron Electronics, Inc. Module having voltage control circuit to reduce surges in potential
US5440524A (en) 1994-02-01 1995-08-08 Integrated Device Technology, Inc. Method and apparatus for simuilataneous long writes of multiple cells of a row in a static ram
US5838603A (en) 1994-10-11 1998-11-17 Matsushita Electric Industrial Co., Ltd. Semiconductor device and method for fabricating the same, memory core chip and memory peripheral circuit chip
US5541886A (en) 1994-12-27 1996-07-30 Intel Corporation Method and apparatus for storing control information in multi-bit non-volatile memory arrays
US5867721A (en) 1995-02-07 1999-02-02 Intel Corporation Selecting an integrated circuit from different integrated circuit array configurations
US5745409A (en) 1995-09-28 1998-04-28 Invox Technology Non-volatile memory with analog and digital interface and storage
KR0157122B1 (en) 1995-12-23 1999-02-18 김광호 A/d converter
JPH09205615A (en) 1996-01-25 1997-08-05 Canon Inc Recorder
US5726934A (en) 1996-04-09 1998-03-10 Information Storage Devices, Inc. Method and apparatus for analog reading values stored in floating gate structures
US5712815A (en) 1996-04-22 1998-01-27 Advanced Micro Devices, Inc. Multiple bits per-cell flash EEPROM capable of concurrently programming and verifying memory cells and reference cells
US5946257A (en) 1996-07-24 1999-08-31 Micron Technology, Inc. Selective power distribution circuit for an integrated circuit
JP3709246B2 (en) 1996-08-27 2005-10-26 株式会社日立製作所 Semiconductor integrated circuit
US5754566A (en) 1996-09-06 1998-05-19 Intel Corporation Method and apparatus for correcting a multilevel cell memory by using interleaving
US6023781A (en) 1996-09-18 2000-02-08 Nippon Steel Corporation Multilevel semiconductor memory, write/read method thereto/therefrom and storage medium storing write/read program
JPH10124381A (en) 1996-10-21 1998-05-15 Mitsubishi Electric Corp Semiconductor storage device
US6097638A (en) 1997-02-12 2000-08-01 Kabushiki Kaisha Toshiba Semiconductor memory device
US5828592A (en) 1997-03-12 1998-10-27 Information Storage Devices, Inc. Analog signal recording and playback integrated circuit and message management system
JP3189740B2 (en) 1997-06-20 2001-07-16 日本電気株式会社 Data repair method for nonvolatile semiconductor memory
US5909449A (en) 1997-09-08 1999-06-01 Invox Technology Multibit-per-cell non-volatile memory with error detection and correction
JP4074697B2 (en) 1997-11-28 2008-04-09 株式会社ルネサステクノロジ Semiconductor device
JPH11176178A (en) 1997-12-15 1999-07-02 Sony Corp Non-volatile semiconductor storage and ic memory card using it
US6072676A (en) * 1998-04-13 2000-06-06 Analog Devices, Inc. Protection circuit for an excitation current source
US6208542B1 (en) 1998-06-30 2001-03-27 Sandisk Corporation Techniques for storing digital data in an analog or multilevel memory
EP1005213A3 (en) 1998-11-02 2000-07-05 Information Storage Devices, Inc. Multiple message multilevel analog signal recording and playback system containing configurable analog processing functions
US6058060A (en) 1998-12-31 2000-05-02 Invox Technology Multi-bit-per-cell and analog/multi-level non-volatile memories with improved resolution and signal-to noise ratio
US6134141A (en) 1998-12-31 2000-10-17 Sandisk Corporation Dynamic write process for high bandwidth multi-bit-per-cell and analog/multi-level non-volatile memories
US7139196B2 (en) 1999-01-14 2006-11-21 Silicon Storage Technology, Inc. Sub-volt sensing for digital multilevel flash memory
TW417381B (en) 1999-04-01 2001-01-01 Mustek Systems Inc Conversion method for increasing the bits of scanning signals of scanner
JP2000298992A (en) 1999-04-13 2000-10-24 Hitachi Ltd Control device for multi-level storage non-volatile semiconductor memory
JP2001006374A (en) 1999-06-17 2001-01-12 Hitachi Ltd Semiconductor memory and system
JP2001052476A (en) 1999-08-05 2001-02-23 Mitsubishi Electric Corp Semiconductor device
JP2001067884A (en) 1999-08-31 2001-03-16 Hitachi Ltd Nonvolatile semiconductor memory device
US6166960A (en) * 1999-09-24 2000-12-26 Microchip Technology, Incorporated Method, system and apparatus for determining that a programming voltage level is sufficient for reliably programming an eeprom
JP2001110184A (en) 1999-10-14 2001-04-20 Hitachi Ltd Semiconductor device
US6259627B1 (en) 2000-01-27 2001-07-10 Multi Level Memory Technology Read and write operations using constant row line voltage and variable column line load
US6426893B1 (en) 2000-02-17 2002-07-30 Sandisk Corporation Flash eeprom system with simultaneous multiple data sector programming and storage of physical block characteristics in other designated blocks
US6297988B1 (en) 2000-02-25 2001-10-02 Advanced Micro Devices, Inc. Mode indicator for multi-level memory
US6424569B1 (en) 2000-02-25 2002-07-23 Advanced Micro Devices, Inc. User selectable cell programming
JP2002074999A (en) 2000-08-23 2002-03-15 Sharp Corp Non-volatile semiconductor memory
US6538922B1 (en) 2000-09-27 2003-03-25 Sandisk Corporation Writable tracking cells
US6763424B2 (en) 2001-01-19 2004-07-13 Sandisk Corporation Partial block data programming and reading operations in a non-volatile memory
US6552929B1 (en) 2001-02-08 2003-04-22 Advanced Micro Devices, Inc. Piggyback programming using an extended first pulse for multi-level cell flash memory designs
JP3829088B2 (en) 2001-03-29 2006-10-04 株式会社東芝 Semiconductor memory device
JP3828376B2 (en) 2001-05-07 2006-10-04 株式会社東芝 Storage system
US7554842B2 (en) 2001-09-17 2009-06-30 Sandisk Corporation Multi-purpose non-volatile memory card
US6643169B2 (en) * 2001-09-18 2003-11-04 Intel Corporation Variable level memory
GB0123422D0 (en) 2001-09-28 2001-11-21 Memquest Ltd Improved memory controller
US6678192B2 (en) 2001-11-02 2004-01-13 Sandisk Corporation Error management for writable tracking storage units
US6850441B2 (en) 2002-01-18 2005-02-01 Sandisk Corporation Noise reduction technique for transistors and small devices utilizing an episodic agitation
US6871257B2 (en) 2002-02-22 2005-03-22 Sandisk Corporation Pipelined parallel programming operation in a non-volatile memory system
US6721820B2 (en) 2002-05-15 2004-04-13 M-Systems Flash Disk Pioneers Ltd. Method for improving performance of a flash-based storage system using specialized flash controllers
US6751766B2 (en) 2002-05-20 2004-06-15 Sandisk Corporation Increasing the effectiveness of error correction codes and operating multi-level memory systems by using information about the quality of the stored data
JP4086583B2 (en) 2002-08-08 2008-05-14 シャープ株式会社 Nonvolatile semiconductor memory device and data write control method
JP2004086991A (en) 2002-08-27 2004-03-18 Renesas Technology Corp Nonvolatile storage device
US6963505B2 (en) 2002-10-29 2005-11-08 Aifun Semiconductors Ltd. Method circuit and system for determining a reference voltage
JP4129170B2 (en) 2002-12-05 2008-08-06 シャープ株式会社 Semiconductor memory device and memory data correction method for memory cell
US6735114B1 (en) 2003-02-04 2004-05-11 Advanced Micro Devices, Inc. Method of improving dynamic reference tracking for flash memory unit
JP4550439B2 (en) 2003-02-28 2010-09-22 東芝メモリシステムズ株式会社 ECC controller
JP4554598B2 (en) 2003-03-27 2010-09-29 サンディスク アイエル リミテッド A data storage device that is fully accessible by all users
JP2004310650A (en) 2003-04-10 2004-11-04 Renesas Technology Corp Memory device
US7240219B2 (en) 2003-05-25 2007-07-03 Sandisk Il Ltd. Method and system for maintaining backup of portable storage devices
US7237074B2 (en) 2003-06-13 2007-06-26 Sandisk Corporation Tracking cells for a memory system
US7752380B2 (en) 2003-07-31 2010-07-06 Sandisk Il Ltd SDRAM memory device with an embedded NAND flash controller
US7212067B2 (en) 2003-08-01 2007-05-01 Sandisk Corporation Voltage regulator with bypass for multi-voltage storage system
US7019998B2 (en) 2003-09-09 2006-03-28 Silicon Storage Technology, Inc. Unified multilevel cell memory
US6937513B1 (en) 2003-10-16 2005-08-30 Lsi Logic Corporation Integrated NAND and nor-type flash memory device and method of using the same
JP2005141811A (en) 2003-11-05 2005-06-02 Renesas Technology Corp Nonvolatile memory
US7389465B2 (en) 2004-01-30 2008-06-17 Micron Technology, Inc. Error detection and correction scheme for a memory device
US7164561B2 (en) 2004-02-13 2007-01-16 Sandisk Corporation Voltage regulator using protected low voltage devices
US8019928B2 (en) 2004-02-15 2011-09-13 Sandisk Il Ltd. Method of managing a multi-bit-cell flash memory
US7233532B2 (en) 2004-04-30 2007-06-19 Xilinx, Inc. Reconfiguration port for dynamic reconfiguration-system monitor interface
US7218137B2 (en) 2004-04-30 2007-05-15 Xilinx, Inc. Reconfiguration port for dynamic reconfiguration
US7109750B2 (en) 2004-04-30 2006-09-19 Xilinx, Inc. Reconfiguration port for dynamic reconfiguration-controller
US7222224B2 (en) 2004-05-21 2007-05-22 Rambus Inc. System and method for improving performance in computer memory systems supporting multiple memory access latencies
US7535759B2 (en) 2004-06-04 2009-05-19 Micron Technology, Inc. Memory system with user configurable density/performance option
WO2005122177A1 (en) 2004-06-09 2005-12-22 Matsushita Electric Industrial Co., Ltd. Semiconductor integrated circuit
JP2006031795A (en) 2004-07-14 2006-02-02 Renesas Technology Corp Nonvolatile semiconductor memory
US7335026B2 (en) 2004-10-12 2008-02-26 Telerobotics Corp. Video surveillance system and method
US7493457B2 (en) 2004-11-08 2009-02-17 Sandisk Il. Ltd States encoding in multi-bit flash cells for optimizing error rate
US7218570B2 (en) 2004-12-17 2007-05-15 Sandisk 3D Llc Apparatus and method for memory operations using address-dependent conditions
US7391193B2 (en) 2005-01-25 2008-06-24 Sandisk Corporation Voltage regulator with bypass mode
KR100704628B1 (en) 2005-03-25 2007-04-09 삼성전자주식회사 Method and apparatus for storing status information using plural strings
JP4772363B2 (en) 2005-04-12 2011-09-14 株式会社東芝 Nonvolatile semiconductor memory device
WO2006129339A1 (en) 2005-05-30 2006-12-07 Spansion Llc Storage apparatus and method for controlling storage apparatus
US20060294295A1 (en) 2005-06-24 2006-12-28 Yukio Fukuzo DRAM chip device well-communicated with flash memory chip and multi-chip package comprising such a device
US7317630B2 (en) * 2005-07-15 2008-01-08 Atmel Corporation Nonvolatile semiconductor memory apparatus
US8379721B2 (en) 2005-09-22 2013-02-19 Qualcomm Incorported Two pass rate control techniques for video coding using a min-max approach
US7631245B2 (en) 2005-09-26 2009-12-08 Sandisk Il Ltd. NAND flash memory controller exporting a NAND interface
US7954037B2 (en) 2005-10-25 2011-05-31 Sandisk Il Ltd Method for recovering from errors in flash memory
KR101224919B1 (en) 2006-02-07 2013-01-22 삼성전자주식회사 Semiconductor memory device controlling output voltage level of high voltage generator according to temperature varation
US7483327B2 (en) 2006-03-02 2009-01-27 Freescale Semiconductor, Inc. Apparatus and method for adjusting an operating parameter of an integrated circuit
US7852690B2 (en) 2006-05-15 2010-12-14 Apple Inc. Multi-chip package for a flash memory
US8000134B2 (en) 2006-05-15 2011-08-16 Apple Inc. Off-die charge pump that supplies multiple flash devices

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1993022770A1 (en) * 1992-05-01 1993-11-11 Motorola, Inc. Method and apparatus for storage of digital information
US5745414A (en) * 1994-09-14 1998-04-28 Information Storage Devices, Inc. Integrated circuit system having reference cells for improving the reading of storage cells
WO2002067269A2 (en) * 2001-02-16 2002-08-29 Sandisk Corporation Method and system for distributed power generation in multi-chip memory systems
US20020140463A1 (en) * 2001-03-15 2002-10-03 Paul Cheung Programmable soft-start control for charge pump
US20050146919A1 (en) * 2003-12-29 2005-07-07 Ellis Robert M. Memory system segmented power supply and control

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US20150380083A1 (en) 2015-12-31
US20140313826A1 (en) 2014-10-23

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