WO2007139648A3 - Method for improving the precision of a temperature-sensor circuit - Google Patents

Method for improving the precision of a temperature-sensor circuit Download PDF

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Publication number
WO2007139648A3
WO2007139648A3 PCT/US2007/010307 US2007010307W WO2007139648A3 WO 2007139648 A3 WO2007139648 A3 WO 2007139648A3 US 2007010307 W US2007010307 W US 2007010307W WO 2007139648 A3 WO2007139648 A3 WO 2007139648A3
Authority
WO
WIPO (PCT)
Prior art keywords
precision
improving
sensor circuit
temperature
preferred
Prior art date
Application number
PCT/US2007/010307
Other languages
French (fr)
Other versions
WO2007139648A2 (en
Inventor
Kenneth So
Ali Al-Shamma
Original Assignee
Sandisk 3D Llc
Kenneth So
Ali Al-Shamma
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sandisk 3D Llc, Kenneth So, Ali Al-Shamma filed Critical Sandisk 3D Llc
Publication of WO2007139648A2 publication Critical patent/WO2007139648A2/en
Publication of WO2007139648A3 publication Critical patent/WO2007139648A3/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/04—Arrangements for writing information into, or reading information out from, a digital store with means for avoiding disturbances due to temperature effects
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops

Abstract

The preferred embodiment described below provide a method and a memory device for improving the precision of a temperature sensor circuit (160). In one preferred embodiment, first (Vtemp1) and second (Vtemp2) temperature dependent reference voltages are generated and compared, and an operating condition of the memory array is controlled based on the result (TempTrip1, TempTrip2) of the comparison.
PCT/US2007/010307 2006-05-24 2007-04-27 Method for improving the precision of a temperature-sensor circuit WO2007139648A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/441,389 US7283414B1 (en) 2006-05-24 2006-05-24 Method for improving the precision of a temperature-sensor circuit
US11/441,389 2006-05-24

Publications (2)

Publication Number Publication Date
WO2007139648A2 WO2007139648A2 (en) 2007-12-06
WO2007139648A3 true WO2007139648A3 (en) 2008-07-24

Family

ID=38535823

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2007/010307 WO2007139648A2 (en) 2006-05-24 2007-04-27 Method for improving the precision of a temperature-sensor circuit

Country Status (3)

Country Link
US (2) US7283414B1 (en)
TW (1) TW200814080A (en)
WO (1) WO2007139648A2 (en)

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US8004917B2 (en) 2008-09-22 2011-08-23 Sandisk Technologies Inc. Bandgap voltage and temperature coefficient trimming algorithm
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Also Published As

Publication number Publication date
WO2007139648A2 (en) 2007-12-06
US7283414B1 (en) 2007-10-16
TW200814080A (en) 2008-03-16
US7277343B1 (en) 2007-10-02

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