WO2007140351A3 - Flexible open tube sampling system for use with surface ionization technology - Google Patents

Flexible open tube sampling system for use with surface ionization technology Download PDF

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Publication number
WO2007140351A3
WO2007140351A3 PCT/US2007/069823 US2007069823W WO2007140351A3 WO 2007140351 A3 WO2007140351 A3 WO 2007140351A3 US 2007069823 W US2007069823 W US 2007069823W WO 2007140351 A3 WO2007140351 A3 WO 2007140351A3
Authority
WO
WIPO (PCT)
Prior art keywords
present
ions
sample
tubes
sampling system
Prior art date
Application number
PCT/US2007/069823
Other languages
French (fr)
Other versions
WO2007140351A2 (en
Inventor
Brian D Musselman
Original Assignee
Ionsense Inc
Brian D Musselman
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ionsense Inc, Brian D Musselman filed Critical Ionsense Inc
Priority to JP2009513407A priority Critical patent/JP2009539115A/en
Priority to EP07797812A priority patent/EP2035122A4/en
Publication of WO2007140351A2 publication Critical patent/WO2007140351A2/en
Publication of WO2007140351A3 publication Critical patent/WO2007140351A3/en

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0404—Capillaries used for transferring samples or ions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0409—Sample holders or containers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0459—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for solid samples

Abstract

The present invention is a device to restrict the sampling of analyte ions and neutral molecules from surfaces with mass spectrometry and thereby sample from a defined area or volume. In various embodiments of the present invention, a tube is used to sample ions formed with a defined spatial resolution from desorption ionization at or near atmospheric pressures. In an embodiment of the present invention, electrostatic fields are used to direct ions to either individual tubes or a plurality of tubes positioned in close proximity to the surface of the sample being analyzed. In an embodiment of the present invention, wide diameter sampling tubes can be used in combination with a vacuum inlet to draw ions and neutrals into the spectrometer for analysis. In an embodiment of the present invention, wide diameter sampling tubes in combination with electrostatic fields improve the efficiency of ion collection.
PCT/US2007/069823 2006-05-26 2007-05-25 Flexible open tube sampling system for use with surface ionization technology WO2007140351A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2009513407A JP2009539115A (en) 2006-05-26 2007-05-25 Flexible open tube collection system for use in surface ionization technology
EP07797812A EP2035122A4 (en) 2006-05-26 2007-05-25 Flexible open tube sampling system for use with surface ionization technology

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US80860906P 2006-05-26 2006-05-26
US60/808,609 2006-05-26

Publications (2)

Publication Number Publication Date
WO2007140351A2 WO2007140351A2 (en) 2007-12-06
WO2007140351A3 true WO2007140351A3 (en) 2008-04-17

Family

ID=38779395

Family Applications (2)

Application Number Title Priority Date Filing Date
PCT/US2007/069823 WO2007140351A2 (en) 2006-05-26 2007-05-25 Flexible open tube sampling system for use with surface ionization technology
PCT/US2007/069821 WO2007140349A2 (en) 2006-05-26 2007-05-25 Apparatus for holding solids for use with surface ionization technology

Family Applications After (1)

Application Number Title Priority Date Filing Date
PCT/US2007/069821 WO2007140349A2 (en) 2006-05-26 2007-05-25 Apparatus for holding solids for use with surface ionization technology

Country Status (4)

Country Link
US (5) US7777181B2 (en)
EP (2) EP2035121A4 (en)
JP (2) JP2009539115A (en)
WO (2) WO2007140351A2 (en)

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US20120112057A1 (en) 2012-05-10
US8421005B2 (en) 2013-04-16
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US20080067358A1 (en) 2008-03-20
US8481922B2 (en) 2013-07-09
US20080067359A1 (en) 2008-03-20
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US20100140468A1 (en) 2010-06-10

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