WO2008004664A1 - Micro-actionneur, unité optique, dispositif d'exposition et procédé de fabrication - Google Patents
Micro-actionneur, unité optique, dispositif d'exposition et procédé de fabrication Download PDFInfo
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- WO2008004664A1 WO2008004664A1 PCT/JP2007/063578 JP2007063578W WO2008004664A1 WO 2008004664 A1 WO2008004664 A1 WO 2008004664A1 JP 2007063578 W JP2007063578 W JP 2007063578W WO 2008004664 A1 WO2008004664 A1 WO 2008004664A1
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- state
- microactuator
- optical device
- support member
- optical
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Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
- G03F7/70825—Mounting of individual elements, e.g. mounts, holders or supports
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
- G02B26/0833—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD
- G02B26/0841—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD the reflecting element being moved or deformed by electrostatic means
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B3/00—Devices comprising flexible or deformable elements, e.g. comprising elastic tongues or membranes
- B81B3/0035—Constitution or structural means for controlling the movement of the flexible or deformable elements
- B81B3/0051—For defining the movement, i.e. structures that guide or limit the movement of an element
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/001—Optical devices or arrangements for the control of light using movable or deformable optical elements based on interference in an adjustable optical cavity
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70233—Optical aspects of catoptric systems, i.e. comprising only reflective elements, e.g. extreme ultraviolet [EUV] projection systems
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70283—Mask effects on the imaging process
- G03F7/70291—Addressable masks, e.g. spatial light modulators [SLMs], digital micro-mirror devices [DMDs] or liquid crystal display [LCD] patterning devices
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
- G03F7/70833—Mounting of optical systems, e.g. mounting of illumination system, projection system or stage systems on base-plate or ground
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/04—Optical MEMS
- B81B2201/042—Micromirrors, not used as optical switches
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2203/00—Basic microelectromechanical structures
- B81B2203/05—Type of movement
- B81B2203/053—Translation according to an axis perpendicular to the substrate
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2203/00—Basic microelectromechanical structures
- B81B2203/05—Type of movement
- B81B2203/058—Rotation out of a plane parallel to the substrate
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S359/00—Optical: systems and elements
- Y10S359/90—Methods
Definitions
- the present invention relates to a microactuator, an optical unit, an exposure apparatus, and a device manufacturing method. More specifically, the present invention relates to a microactuator that drives a driven body, an optical unit that includes the microactuator, and the device. The present invention relates to an exposure apparatus including an optical unit, and a device manufacturing method using the exposure apparatus.
- a pattern formed on a mask (reticle, photomask, etc.) is transferred to a sensitive agent such as a resist via a projection optical system.
- a projection exposure apparatus is used to transfer onto the substrate (glass plate, wafer, etc.) coated with.
- variable mask also called an active mask
- Various maskless scanning exposure systems have been proposed! As a type of maskless scanning exposure equipment, scanning exposure using a DMD (Digital Micro-mirror Device), which is a type of reflective spatial light modulator, as a variable shaping mask.
- An apparatus has been proposed (see, for example, Patent Document 1). According to the scanning type exposure apparatus that uses this DMD as a variable shaping mask, the pattern generated in the variable shaping mask is changed in synchronization with the scanning of the substrate stage to expose the substrate held on the substrate stage. The desired pattern can be easily formed on the substrate, and the cost and size of the apparatus can be reduced.
- the illumination light IL When the illumination light IL is incident on this on-state micromirror, it is reflected by the reflection surface of the micromirror and is incident on the projection optical system PL (that is, using the illumination light IL through the on-state micromirror). Exposure is performed). On the other hand, when it is in the state indicated by the symbol M ′, it is a so-called off state, and the illumination light IL incident on the micromirror in the off state is not incident on the projection optical system PL after being reflected by the micromirror.
- the micromirrors in the on state are arranged along the base BS while being inclined with respect to the base BS, the reflecting surfaces of the micromirrors M adjacent to each other are arranged. They are shifted by a distance D with respect to the normal direction of the reflecting surface of the micromirror M.
- the illumination light IL passing through the respective micromirrors M has a phase difference with each other, and this phase difference may affect the exposure accuracy.
- Patent Document 1 Japanese Patent Application Laid-Open No. 2004_327660
- the present invention is a microactuator for driving a driven body, which supports the driven body, and A plurality of support members each having an elastic portion; and a plurality of drive mechanisms provided corresponding to each of the plurality of support members, wherein each of the plurality of drive mechanisms has elasticity of a corresponding support member.
- the first microactuator is configured to change the distance between the support point at which the corresponding support member supports the driven body and a predetermined reference plane by deforming the portion.
- a microactuator for driving a driven body comprising a pair of elastic portions, a connecting portion connecting the elastic portions, the connecting portion, And a pair of drive mechanisms provided corresponding to the pair of elastic portions, respectively, and each of the pair of drive mechanisms includes a pair of drive members.
- the second micro-actuator changes the posture of the driven body by deforming a corresponding elastic part.
- the driven bodies can be driven in parallel by making the driving amounts of the pair of driving mechanisms that respectively deform the corresponding elastic portions of the support member the same.
- the connecting portion is inclined by making the driving amounts of the pair of driving mechanisms different, the driven body can be inclined by an amount corresponding to the inclination angle.
- the present invention provides a microactuator for driving a driven body, which supports the driven body, a part of which is perpendicular to a predetermined plane, and the predetermined
- a support member having an elastic force in a torsional direction with respect to the surface; provided on both sides of the support member, and capable of causing the driven body to apply a force in a direction perpendicular to the predetermined surface.
- a third microactuator comprising: a pair of drive mechanisms;
- the support member has an elastic force in a direction orthogonal to the predetermined surface and a twist direction with respect to the predetermined surface
- the pair of drive mechanisms act on the driven body with the same force.
- the driven body can be translated in a direction orthogonal to the predetermined surface, and each driving mechanism applies different forces to the driven body, so that the driven body is moved to the predetermined surface. Can be inclined with respect to.
- an optical device comprising: an optical element; and any one of the first to third microactuators of the present invention that drives the optical element as the driven body. It is.
- an exposure apparatus that exposes an object using illumination light, and includes a control device that drives and controls a drive mechanism that is disposed on the optical path of the illumination light.
- a control device that drives and controls a drive mechanism that is disposed on the optical path of the illumination light.
- 1 is a first exposure apparatus that includes the optical device of the present invention and exposes the object using the illumination light that has passed through the optical device.
- the optical device of the present invention is arranged on the optical path of the illumination light, and the object is exposed using the illumination light via the optical device, so that the posture of the optical element included in the optical device is changed. By changing, the state of the illumination light reaching the object can be controlled
- an exposure apparatus for exposing an object wherein the optical element is a mirror element that generates a predetermined pattern by irradiation with illumination light, the first on state, the second Comprising an optical device of the present invention that is switched between an on state and an off state of the illumination light phase through the first on-state optical element and the second on-state optical element.
- the phase of the illumination light is a second exposure apparatus that is shifted by a half wavelength from each other.
- the optical device functions as a phase shift mask by switching each of the plurality of optical elements between the first on state, the second on state, and the off state. It is possible to generate a highly accurate pattern.
- the present invention is a device manufacturing method using either the first exposure apparatus or the second exposure apparatus of the present invention from another viewpoint.
- FIG. 1 is a schematic view showing an exposure apparatus according to an embodiment.
- FIG. 2 is a plan view showing a variable shaping mask.
- FIG. 3 is an exploded perspective view of a micromirror mechanism constituting a variable shaping mask.
- FIG. 4 (A) and FIG. 4 (B) are diagrams for explaining the operation of the drive mechanism.
- FIG. 5 (A) to FIG. 5 (C) are diagrams for explaining the operation of the micromirror mechanism.
- FIG. 6 is a diagram (part 1) showing a modification of the embodiment.
- FIG. 7 is a diagram (No. 2) showing a modification of the embodiment.
- FIG. 8 is a diagram (part 3) showing a modification of the embodiment.
- FIG. 9 is a view showing a conventional variable molding mask.
- FIG. 1 schematically shows a configuration of an exposure apparatus 100 according to an embodiment.
- the exposure apparatus 100 includes an illumination system 10, a pattern generation apparatus 12, a projection optical system PL, a stage apparatus 16, a reflection mirror 26, a control system, and the like.
- the exposure apparatus 100 forms a pattern image (pattern image) generated by the pattern generation apparatus 12 on the wafer W placed on the stage ST constituting a part of the stage apparatus 16 using the projection optical system PL.
- the control system includes a microcomputer, and is configured around a main control device 20 that performs overall control of the entire device.
- the illumination system 10 includes a light source system including a light source unit and a light source control system, a collimator lens, an optical integrator (such as a fly-eye lens, a rod-type integrator, or a diffraction element), a condensing lens, a field stop, a relay lens, and the like. Including the illumination optical system etc. (both not shown). Illumination light IL is emitted from the illumination system 10.
- a solid-state laser light source such as a DFB semiconductor laser or a fiber laser is used.
- a harmonic generation device that outputs a 193 nm wavelength light including an optical amplification unit having a fiber amplifier and the like, a wavelength conversion unit, and the like is used.
- the light source unit may be a laser diode that generates continuous light or pulsed light having a wavelength of 440 nm, for example.
- the reflection mirror 26 reflects the illumination light IL emitted from the illumination system 10 toward a variable shaping mask VM described later on the pattern generation device 12. Note that the reflection mirror 26 actually constitutes a part of the illumination optical system inside the illumination system 10, but here, for convenience of explanation, it is taken out of the illumination system 10 and shown. ing.
- the pattern generation device 12 includes a variable shaping mask VM, a mirror drive system 30 and the like.
- variable shaping mask VM is disposed on the + Z side of the projection optical system PL and on the optical path of the illumination light IL reflected by the reflection mirror 26.
- this variable shaping mask VM as shown in FIG. 2, a plurality of micromirror mechanisms of m rows and n columns arranged two-dimensionally (arranged in an array) in the XY plane.
- Micromirror arrays also called digital micromirror devices (DMD), etc.
- This micromirror array is an integrated circuit made by CMOS process, with MEMS technology, and a movable micromirror mechanism is formed.
- Each mirror mirror mechanism M has a mirror surface (reflection surface) and a Z-axis direction. Or can be tilted with respect to the XY plane.
- micromirror mechanism M constituting the variable shaping mask VM will be described in detail with reference to FIG.
- FIG. 3 is an exploded perspective view showing the micromirror mechanism M as viewed from below.
- the micromirror mechanism M includes a mirror element 52, a pair of support mechanisms 54A and 54B, and a pair of driving mechanisms provided corresponding to the pair of support mechanisms 54A and 54B.
- Mechanisms 66 A and 66B are shown in FIG. 3.
- the mirror element 52 includes a plate-like member having a substantially square shape in plan view (viewed from below) made of single crystal silicon or the like.
- the mirror surface is formed by plating using a material such as
- a pair of contact holes 52a and 52b are formed on the other side (+ Z side) of the plate-like member.
- One support member 54A of the pair of support members 54A and 54B is made of a member in which single crystal silicon or silicon nitride is laminated, and has a crank-like bent portion in the vicinity of both ends in the X-axis direction.
- a support member main body 58 and a pin portion 56 provided so as to protrude downward (one Z direction) at a substantially central portion in the X-axis direction of the support member main body 58 are included.
- the support member main body 58 is fixed to the base BS (here, the integrated circuit made by the above-described CMOS process) at the bent portions (the uppermost surface of the support member main body 58) at both ends.
- the center in the X-axis direction sandwiched between the bent parts at both ends is It has a function as a squeeze panel having elasticity.
- the portion! /, Na! /, which is in contact with the base BS in the central portion in the X-axis direction will be referred to as a “spring portion”.
- the drive mechanism 66A on the side corresponding to one of the support members 54A is movable and fixed to the upper surface (the surface on the + Z side) of the spring portion of the support member main body 58.
- An electrode 62 and a fixed electrode 64 fixed to a position of the base BS facing the movable electrode 62 are included.
- an electrostatic force is generated between the electrodes 62 and 64.
- the fixed electrode 64 and the movable electrode 62 are driven by the driving force (electrostatic force) corresponding to the driving signal from the main controller 20 (in this embodiment, the voltage between both electrodes). ) And the mirror element 52 is driven by squeezing and deforming the panel portion of the support member main body 58.
- the support member 54A, the drive mechanism 66A, and the wiring (not shown) for the electrodes constituting the drive mechanism 66A include silicon film formation for the base BS, aluminum film formation, pattern ungulation by photolithography etching,
- the manufacturing force S can be obtained by repeating operations such as formation of a sacrificial layer such as a photoresist, and performing operations such as removal of the sacrificial layer.
- the other support member 54B and the drive mechanism 66B corresponding to the support member 54B have the same configuration as the support member 54A and the drive mechanism 66A.
- Drive mechanism The 66A and the drive mechanism 66B are not limited to a mechanism using electrostatic force (electrostatic actuator), and for example, a drive mechanism using electromagnetic force (Lorentz force) or a drive mechanism using a piezoelectric element can also be adopted. is there.
- FIG. 5A shows a state in which no voltage is applied to the drive mechanisms 66A and 66B.
- both support members 54A and 54B are maintained in the state shown in FIG. Accordingly, the mirror element 52 is held in parallel with the base BS at a position separated from the base BS by the distance La.
- FIG. 5B shows a state in which a voltage is applied to both drive mechanisms 66A and 66B.
- both support members 54A and 54B are maintained in the state shown in FIG. Therefore, the mirror element 52 is held parallel to the base BS at a position separated from the base BS by the distance Lb. That is, by applying a voltage to both drive mechanisms 66A and 66B from the state shown in FIG. 5A, the mirror element 52 is translated in the Z-axis direction by a distance (La-Lb).
- FIG. 5C shows a state in which a voltage is applied only to one drive mechanism 66B of the drive mechanisms 66A and 66B.
- one support member 54A is in the state shown in FIG. 4 (A)
- the other support member 54B is in the state shown in FIG. 4 (B). Therefore, the mirror element 52 is held in an inclined state in the XY plane.
- the illumination light IL is irradiated in the state shown in FIG. 1 to the mirror element 52 in the state (or posture) shown in FIG. 5 (A), it is reflected by the reflection surface of the mirror element 52. Incident on the projection optical system PL. Therefore, the state of the mirror element 52 in FIG. 5A is also referred to as a “first on state” below.
- the state of the mirror element 52 in FIG. 5B is also referred to as a “second on state” below.
- the moving distance (La ⁇ Lb) in this case depends on the phase of the illumination light IL (hereinafter also referred to as reflected light IL2) via the first on-state mirror element 52 and the second on-state.
- the phase of the reflected light IL2 through the mirror element 52 is shifted by half a wavelength from each other. Has been determined.
- the illumination light IL is applied to the mirror element 52 in the state (or posture) shown in FIG. 5C, it is reflected by the reflection surface of the mirror element 52, and the reflected light is projected into the projection optics. Does not enter system PL. Therefore, the state shown in FIG. 5C will be referred to as an “off state” in the following.
- the mirror drive system 30 under the instruction of the main controller 20, the mirror drive system 30 causes the state of each mirror element 52 to be the first on state, the second on state, and the off state. It can be switched independently between the two states.
- the mirror drive system 30 acquires pattern design data (for example, CAD data) out of data necessary for forming a pattern image from a host device (not shown) via an interface (not shown). To do. Then, based on the acquired design data, the mirror drive system 30 irradiates the light from the variable shaping mask VM onto the section area to be exposed on the wafer W via the projection optical system PL, and exposes on the wafer W. A signal for driving the mirror element 52 of each micromirror mechanism M is generated so that light from the variable shaping mask VM is not irradiated on the portion other than the target partition region portion, and the electric power constituting the drive mechanisms 66A and 66B is generated. Supply to poles 62 and 64.
- pattern design data for example, CAD data
- One of the drive signals for making the output is output to the electrodes of the drive mechanisms 66A and 66B of each micromirror mechanism.
- the pattern generator 12 generates a pattern according to the design data. Note that the pattern generated by the pattern generation device 12 changes as the wafer W moves in the scanning direction (here, the Y-axis direction).
- Projection optical system PL has a plurality of optical elements arranged in a predetermined positional relationship inside the lens barrel.
- the projection optical system PL projects the pattern generated by the pattern generation device 12 onto the wafer W placed on the exposure surface, with a projection magnification of / 3 (/ 3 is 1/4, 1/8, 1/100, for example, 1/200, 1/400, etc.)
- the stage device 16 includes a stage ST that holds and moves the wafer W (object), and a main control device.
- stage drive system 40 that controls the operation state (movement, etc.) of the stage ST in accordance with the command from 20.
- the stage ST can move in the X-axis, Y-axis, and Z-axis directions, and can rotate in the X-axis, Y-axis, and Z-axis rotation directions ( ⁇ ⁇ , ⁇ y, ⁇ z).
- the wafer W can be aligned with 6 degrees of freedom to the pattern image of the variable forming mask VM generated via the optical system PL.
- the stage ST is moved in a predetermined scanning direction in the XY plane (for example, in the horizontal direction in the drawing in FIG. 1). It is moved at a desired speed in a certain Y-axis direction), and the change in the pattern (display image) generated by the variable shaping mask VM is synchronized with the movement of the wafer W.
- the position information (including rotation information) of the stage ST is measured by a position measurement system (not shown) (for example, including a laser interferometer and / or an encoder and, if necessary, a focus sensor). Supplied to main controller 20. Based on this position information, main controller 20 drives the motor of stage drive system 40 to move and position wafer W.
- a position measurement system for example, including a laser interferometer and / or an encoder and, if necessary, a focus sensor.
- the main controller 20 controls the operations of the illumination system 10, the pattern generator 12, the stage device 16, and the like, and the patterns sequentially generated by the variable molding mask VM on the wafer W via the projection optical system PL. Form an image.
- the main controller 20 moves the wafer W at an appropriate speed and, in synchronization with this, scrolls the pattern generated by the variable molding mask VM via the drive system 30, thereby scanning-type exposure. I do.
- the mirror element 52 has two types of on-states, that is, a first on-state and a second on-state, and the first on-state and the second on-state. Then, since the phases of the reflected light IL2 reflected by the mirror element 52 are shifted from each other by a half wavelength, the first on-state mirror element and the second on-state mirror element are arranged close to each other. As a result, it functions as a phase shift mask.
- a pair of support members 54A and 54B having spring portions support the mirror element 52, and a pair of drive mechanisms 66A and 66B provided corresponding to the pair of support members 54A and 54B, corresponding support members 54A. , 54B, the distance between the support point where the support members 54A and 54B support the mirror element 52 and the base BS changes. Therefore, the mirror element 52 is translated by driving all the drive mechanisms 66A and 66B. In addition, it is possible to tilt the mirror element 52 with respect to the base BS by driving a part of the drive mechanism!
- the panel portions of the support members 54A and 54B constituting each micromirror mechanism M are stagnation-type. Therefore, it is possible to increase the panel constant compared to when using a torsional panel, etc., and when the electrostatic forces of the drive mechanisms 66A and 66B are released, the response is high. It is possible to return to the state of Fig. 4 (A) from the state of B), and it is possible to shorten the time until the vibration is attenuated.
- the on-state in which the illumination light IL incident and reflected on the mirror element 52 of each micromirror mechanism M enters the projection optical system PL, Switching to the OFF state where the light does not enter the projection optical system PL can be performed at high speed. Further, in the support members 54A and 54B having the panel portion of the sag type, the response speed can be increased (high response can be achieved) by applying tension.
- variable shaping mask VM of the present embodiment the mirror element 52 of each micromirror mechanism M can be translated as described above, so that the first on state and the second on state are By devising the arrangement of the mirror element 52, it can be used as a phase shift mask. Thereby, it is possible to expose a fine pattern with high accuracy.
- one micromirror mechanism M force pair of support members 54A, 54B and a pair of drive mechanisms 66A, 66B provided corresponding to the pair of support members 54A, 54B.
- the force which demonstrated the structure provided Not only this but 3 or more support members and 3 or more drive mechanisms provided corresponding to this may be provided.
- the pair of support member force axial directions is the longitudinal direction.
- the present invention is not limited thereto, and for example, the pair of support members has the Y axis direction as the longitudinal direction. It is also possible to use a micromirror mechanism having a support member whose longitudinal direction is the Y-axis direction and a micromirror mechanism having a support member whose longitudinal direction is the X-axis direction. It is also good to do.
- micromirror mechanisms having different types of support members are used in combination, for example, as shown in FIG. 6 (A), adjacent micromirror mechanisms have the same type of micromirror mechanisms having different types of support members. It can be. Thus, for example, as shown in FIG.
- FIG. 6 (B) a micromirror mechanism in which support members having a longitudinal direction in the Y-axis direction are arranged at predetermined intervals in the X-axis direction, and a support member having a longitudinal direction in the Y-axis direction are provided. You may make it arrange
- the support members of the adjacent micromirror mechanisms do not mechanically interfere with each other, so that the mirror elements can be arranged in an array.
- the longitudinal direction may be the direction in which the support member intersects the X axis and the Y axis.
- the force described in the case where a plurality of support members and a plurality of drive mechanisms corresponding to the support members are provided is not limited thereto, and a configuration as shown in Fig. 7 may be employed. It is.
- the micromirror mechanism M ′ shown in FIG. 7 is provided between the mirror element 52, one support member 54 ′ that supports the mirror element 52, and the support member 54 ′ and the base BS.
- the support member 54 ' includes a substantially H-shaped support member main body 58' in a plan view, and a pin provided at the center of the lower surface of the support member main body 58 'in the XY plane. Part 56 '.
- the support member main body 58 ' is manufactured by the same manufacturing method using the same member as the support member main body 58 described in the above embodiment, extends in the X-axis direction, and has a predetermined interval in the Y-axis direction.
- the X-axis direction both ends of the driven parts 59A and 59B are sequentially bent in the ⁇ Z direction and + X direction (one X direction) and fixed to the base BS at the bent part (the part having the XY plane).
- the central part of the driven parts 59A and 59B (the part that is not in contact with the base BS) is the panel part as in the above embodiment. Yes
- Each of the pair of drive mechanisms 66A and 66B is provided at a position facing the movable electrode 62 provided on the + Z side surface of the driven parts 59A and 59B and the movable electrode 62 of the base BS.
- a fixed electrode 64 Since the pair of drive mechanisms 66A and 66B is the same as that of the above embodiment, the description thereof is omitted.
- the micromirror mechanism M in FIG. 7 configured as described above can be driven in the same manner as in the above embodiment. That is, a state in which no voltage is applied to either drive mechanism 66A, 66B (first on state), a state in which voltage is applied to both drive mechanisms 66A, 66B (second on state), and By applying a voltage to the drive mechanism, one of the states in which the mirror element 52 is inclined with respect to the XY plane (off state) can be selectively switched.
- the mirror element 52 can be driven in the same manner as in the above embodiment, and the mirror element 52 can be supported at one location. Compared to a case where the mirror element 52 is supported at a plurality of points, there is a low possibility that a force that deforms the mirror element 52 is applied.
- the micromirror mechanism M “shown in FIG. 8 includes a mirror element 52, a single support member 54" that supports the mirror element 52, and a drive mechanism that is arranged at a predetermined distance on the Y side of the support member 54 ".
- 66A 'and a drive mechanism 66B' disposed at a predetermined distance on the + Y side of the support member 54 ".
- the support member 54 "has substantially the same configuration as the support members 54A and 54B of the above-described embodiment. Force S, a pair of hinge portions 71 are formed on a part of the support member main body 58 constituting the support member 54". The differences are different.
- the drive mechanisms 66A 'and 66B' have the same configuration as the drive mechanisms 66A and 66B of the above embodiment (a configuration including the fixed electrode 64 and the movable electrode 62), but the movable electrode 62 is the mirror element 52. It is fixed directly to the point that is different.
- the mirror element 58 is In a state in which a voltage is applied to both of the pair of drive mechanisms 66A ′ and 66B ′, the mirror element 58 is supported in parallel to the base BS at a position higher than the predetermined height, and is further supported.
- the mirror element 58 can be rotated (tilted) around the X axis. In this case, the inclination is easily performed by the pair of hinge portions 71 formed on the support member main body 58.
- the mirror element is used as the optical element.
- the present invention is not limited to this, and other optical elements such as a lens element may be used.
- a plurality of pairs of force variable molding mask VM and projection optical system PL may be provided, in which a pair of variable molding mask (micromirror array) VM and projection optical system PL are provided.
- the number of the variable shaping mask VM and the projection optical system PL may be different. In the former, for example, the position of each projection region (corresponding to the irradiation region of the illumination light IL) of the plurality of projection optical systems PL is different with respect to a direction (for example, the X-axis direction) intersecting the scanning direction (Y-axis direction).
- a plurality of projection regions may be arranged in a line along the X-axis direction, or the projection regions may be arranged in a nested manner, that is, zigzag along each of a plurality of columns separated in the Y-axis direction.
- M ( ⁇ N + 1) projection optical systems PL are provided for N (integer greater than or equal to 1) variable shaped masks VM, or for M variable shaped masks VM.
- N projection optical systems PL may be provided.
- the force S described for the case where the optical device of the present invention is applied to the variable shaping mask VM not limited to this, for example, the present invention is included in an illumination system (illumination optical system).
- This optical device may be provided, and the optical device may be used to suppress the occurrence of uneven illumination.
- the present invention is not limited to application to an exposure apparatus for manufacturing a semiconductor device, and for example, for a liquid crystal display element formed on a square glass plate or a display apparatus such as a plasma display. It can also be widely applied to exposure apparatuses for manufacturing various devices such as exposure apparatuses, image sensors (CCD, etc.), micromachines, thin film magnetic heads, and DNA chips. Furthermore, the present invention is also applicable to an exposure apparatus that manufactures a mask (photomask, reticle, etc.) on which mask patterns of various devices are formed using a lithographic process. Ability to do S. As described above, in the above embodiments, the object to be exposed to which the energy beam is irradiated is not limited to the wafer, and other objects such as a glass plate, a ceramic substrate, or a mask blank can be used.
- a semiconductor device includes a step of designing a function and performance of a device, a step of forming a wafer from a silicon material, a step of exposing a wafer through a variable molding mask by the exposure apparatus of the above-described embodiment, etching, etc. It is manufactured through a circuit pattern forming step, a device assembly step (including a dicing process, a bonding process, and a packaging process) and an inspection step.
- the present invention is not limited to this, and can also be used in a projection image display apparatus such as a projector. However, it can also be used for various applications such as optical information processing devices, electrostatic photographic printing devices, optical switches used for optical communication, Switched Blazed Grating Devices, or platesetters used in the printing field. . In this case, it is not limited to the case where a plurality of micromirrors (optical elements) are included as in the above embodiment, and only one micromirror mechanism may be included.
- the microactuator of the present invention is suitable for driving a driven body.
- the optical unit of the present invention is suitable for driving an optical element.
- the exposure apparatus of the present invention is suitable for exposing an object using illumination light.
- the device manufacturing method of the present invention is suitable for manufacturing micro devices.
Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
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JP2008523755A JP5282883B2 (ja) | 2006-07-06 | 2007-07-06 | 光学デバイス及び露光装置、並びにデバイス製造方法 |
EP07828158A EP2045645A1 (en) | 2006-07-06 | 2007-07-06 | Micro actuator, optical unit, exposure device, and device manufacturing method |
KR1020137013112A KR20130079603A (ko) | 2006-07-06 | 2007-07-06 | 광학 디바이스, 노광 장치, 및 디바이스 제조 방법 |
US12/348,530 US7952780B2 (en) | 2006-07-06 | 2009-01-05 | Microactuator, optical device and exposure apparatus, and device manufacturing method |
US13/085,001 US8570632B2 (en) | 2006-07-06 | 2011-04-12 | Microactuator, optical device and exposure apparatus, and device manufacturing method |
Applications Claiming Priority (2)
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JP2006-186449 | 2006-07-06 | ||
JP2006186449 | 2006-07-06 |
Related Child Applications (1)
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US12/348,530 Continuation US7952780B2 (en) | 2006-07-06 | 2009-01-05 | Microactuator, optical device and exposure apparatus, and device manufacturing method |
Publications (1)
Publication Number | Publication Date |
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WO2008004664A1 true WO2008004664A1 (fr) | 2008-01-10 |
Family
ID=38894630
Family Applications (1)
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PCT/JP2007/063578 WO2008004664A1 (fr) | 2006-07-06 | 2007-07-06 | Micro-actionneur, unité optique, dispositif d'exposition et procédé de fabrication |
Country Status (5)
Country | Link |
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US (2) | US7952780B2 (ja) |
EP (1) | EP2045645A1 (ja) |
JP (2) | JP5282883B2 (ja) |
KR (2) | KR20090039664A (ja) |
WO (1) | WO2008004664A1 (ja) |
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JP2013504218A (ja) * | 2009-09-08 | 2013-02-04 | カール・ツァイス・エスエムティー・ゲーエムベーハー | 表面外形(surfacefigure)変形の少ない光学素子 |
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Also Published As
Publication number | Publication date |
---|---|
US8570632B2 (en) | 2013-10-29 |
US7952780B2 (en) | 2011-05-31 |
KR20090039664A (ko) | 2009-04-22 |
US20090122381A1 (en) | 2009-05-14 |
JP2013225134A (ja) | 2013-10-31 |
US20110187810A1 (en) | 2011-08-04 |
JPWO2008004664A1 (ja) | 2009-12-10 |
JP5754656B2 (ja) | 2015-07-29 |
EP2045645A1 (en) | 2009-04-08 |
KR20130079603A (ko) | 2013-07-10 |
JP5282883B2 (ja) | 2013-09-04 |
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