WO2008024699A3 - Method and apparatus for proactive fault monitoring in interconnects - Google Patents

Method and apparatus for proactive fault monitoring in interconnects Download PDF

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Publication number
WO2008024699A3
WO2008024699A3 PCT/US2007/076285 US2007076285W WO2008024699A3 WO 2008024699 A3 WO2008024699 A3 WO 2008024699A3 US 2007076285 W US2007076285 W US 2007076285W WO 2008024699 A3 WO2008024699 A3 WO 2008024699A3
Authority
WO
WIPO (PCT)
Prior art keywords
component
interconnections
interconnects
fault monitoring
during operation
Prior art date
Application number
PCT/US2007/076285
Other languages
French (fr)
Other versions
WO2008024699A2 (en
Inventor
Leoncio D Lopez
David K Mcelfresh
Dan Vacar
Kenny C Gross
Original Assignee
Sun Microsystems Inc
Leoncio D Lopez
David K Mcelfresh
Dan Vacar
Kenny C Gross
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sun Microsystems Inc, Leoncio D Lopez, David K Mcelfresh, Dan Vacar, Kenny C Gross filed Critical Sun Microsystems Inc
Publication of WO2008024699A2 publication Critical patent/WO2008024699A2/en
Publication of WO2008024699A3 publication Critical patent/WO2008024699A3/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0751—Error or fault detection not based on redundancy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31717—Interconnect testing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
    • G06F11/0721—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment within a central processing unit [CPU]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/34—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/34—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
    • G06F11/3447—Performance evaluation by modeling
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G06F11/34—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
    • G06F11/3452—Performance evaluation by statistical analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/70—Testing of connections between components and printed circuit boards
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
    • G06F2201/81—Threshold

Abstract

A system that detects the onset of degradation for interconnections in a component within a computer system. During operation, the system monitors inferential variables associated with the interconnections during operation of the computer system. Next, the system determines a present state of the component from the monitored inferential variables. The system then compares the present state of the component with an initial state of the component. If the comparison indicates that the interconnections in the component have reached or will reach a limited operating state (LOS), the system performs a remedial action.
PCT/US2007/076285 2006-08-21 2007-08-20 Method and apparatus for proactive fault monitoring in interconnects WO2008024699A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/508,025 2006-08-21
US11/508,025 US7353431B2 (en) 2004-02-11 2006-08-21 Method and apparatus for proactive fault monitoring in interconnects

Publications (2)

Publication Number Publication Date
WO2008024699A2 WO2008024699A2 (en) 2008-02-28
WO2008024699A3 true WO2008024699A3 (en) 2008-05-15

Family

ID=39107560

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2007/076285 WO2008024699A2 (en) 2006-08-21 2007-08-20 Method and apparatus for proactive fault monitoring in interconnects

Country Status (2)

Country Link
US (1) US7353431B2 (en)
WO (1) WO2008024699A2 (en)

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US7543192B2 (en) * 2006-06-20 2009-06-02 Sun Microsystems, Inc. Estimating the residual life of a software system under a software-based failure mechanism
US8103463B2 (en) * 2006-09-21 2012-01-24 Impact Technologies, Llc Systems and methods for predicting failure of electronic systems and assessing level of degradation and remaining useful life
US7577542B2 (en) * 2007-04-11 2009-08-18 Sun Microsystems, Inc. Method and apparatus for dynamically adjusting the resolution of telemetry signals
US7668696B2 (en) * 2007-04-16 2010-02-23 Sun Microsystems, Inc. Method and apparatus for monitoring the health of a computer system
US20090326864A1 (en) * 2008-06-27 2009-12-31 Sun Microsystems, Inc. Determining the reliability of an interconnect
US8264215B1 (en) * 2009-12-10 2012-09-11 The Boeing Company Onboard electrical current sensing system
US8874968B1 (en) * 2012-04-27 2014-10-28 Coresonic Ab Method and system for testing a processor designed by a configurator
US9477568B2 (en) * 2013-09-27 2016-10-25 International Business Machines Corporation Managing interconnect electromigration effects
US9298579B2 (en) * 2014-05-15 2016-03-29 International Business Machines Corporation Link speed downshifting for error determination and performance enhancements
US9832876B2 (en) * 2014-12-18 2017-11-28 Intel Corporation CPU package substrates with removable memory mechanical interfaces
US9979675B2 (en) 2016-02-26 2018-05-22 Microsoft Technology Licensing, Llc Anomaly detection and classification using telemetry data
US10762444B2 (en) * 2018-09-06 2020-09-01 Quickpath, Inc. Real-time drift detection in machine learning systems and applications
US11422876B2 (en) 2019-08-02 2022-08-23 Microsoft Technology Licensing, Llc Systems and methods for monitoring and responding to bus bit error ratio events
CN113325819B (en) * 2021-04-22 2022-08-19 上海孟伯智能物联网科技有限公司 Continuous annealing unit fault diagnosis method and system based on deep learning algorithm

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US5533197A (en) * 1994-10-21 1996-07-02 International Business Machines Corporation Method to assess electromigration and hot electron reliability for microprocessors
US20040246008A1 (en) * 2003-06-04 2004-12-09 Barr Andrew H. Apparatus and method for detecting and rejecting high impedance interconnect failures in manufacturing process
WO2005078585A2 (en) * 2004-02-11 2005-08-25 Sun Microsystems, Inc. Detecting and correcting a failure sequence in a computer system before a failure occurs

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US5680541A (en) * 1991-12-16 1997-10-21 Fuji Xerox Co., Ltd. Diagnosing method and apparatus
US5668944A (en) * 1994-09-06 1997-09-16 International Business Machines Corporation Method and system for providing performance diagnosis of a computer system
US6470464B2 (en) * 1999-02-23 2002-10-22 International Business Machines Corporation System and method for predicting computer system performance and for making recommendations for improving its performance
US6594784B1 (en) * 1999-11-17 2003-07-15 International Business Machines Corporation Method and system for transparent time-based selective software rejuvenation
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US5533197A (en) * 1994-10-21 1996-07-02 International Business Machines Corporation Method to assess electromigration and hot electron reliability for microprocessors
US20040246008A1 (en) * 2003-06-04 2004-12-09 Barr Andrew H. Apparatus and method for detecting and rejecting high impedance interconnect failures in manufacturing process
WO2005078585A2 (en) * 2004-02-11 2005-08-25 Sun Microsystems, Inc. Detecting and correcting a failure sequence in a computer system before a failure occurs

Non-Patent Citations (2)

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Also Published As

Publication number Publication date
WO2008024699A2 (en) 2008-02-28
US20060282705A1 (en) 2006-12-14
US7353431B2 (en) 2008-04-01

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