WO2008033329A3 - System and method for analyzing displacements and contouring of surfaces - Google Patents

System and method for analyzing displacements and contouring of surfaces Download PDF

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Publication number
WO2008033329A3
WO2008033329A3 PCT/US2007/019707 US2007019707W WO2008033329A3 WO 2008033329 A3 WO2008033329 A3 WO 2008033329A3 US 2007019707 W US2007019707 W US 2007019707W WO 2008033329 A3 WO2008033329 A3 WO 2008033329A3
Authority
WO
WIPO (PCT)
Prior art keywords
optical system
processing unit
signal processing
observation
contouring
Prior art date
Application number
PCT/US2007/019707
Other languages
French (fr)
Other versions
WO2008033329A2 (en
Inventor
Cesar A Sciammarella
Original Assignee
Cesar A Sciammarella
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cesar A Sciammarella filed Critical Cesar A Sciammarella
Publication of WO2008033329A2 publication Critical patent/WO2008033329A2/en
Publication of WO2008033329A3 publication Critical patent/WO2008033329A3/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object

Abstract

An optical system including a signal processing unit has been developed to study the contours of objects and/or their deformations. The optical system utilizes projectors comprising an illumination source including those outside the visible range and an observation source such as a digital camera. The optical system provides information regarding the object in such a way that renders a complete description of the surface geometry and/or its deformation. The optical system further facilitates a substantial simplification in obtaining the desired result in the form of eliminating the need for point-wise solution of simultaneous equations. The signal processing unit comprises software that, among others, provides a transformation that mimics projection and observation from infinity. The signal processing unit further reduces data processing by recognizing known geometric shapes, and automatically correcting for discontinuities of the object and/or optical system.
PCT/US2007/019707 2006-09-15 2007-09-11 System and method for analyzing displacements and contouring of surfaces WO2008033329A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US84477806P 2006-09-15 2006-09-15
US60/844,778 2006-09-15

Publications (2)

Publication Number Publication Date
WO2008033329A2 WO2008033329A2 (en) 2008-03-20
WO2008033329A3 true WO2008033329A3 (en) 2008-06-26

Family

ID=39184290

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2007/019707 WO2008033329A2 (en) 2006-09-15 2007-09-11 System and method for analyzing displacements and contouring of surfaces

Country Status (2)

Country Link
US (1) US8054471B2 (en)
WO (1) WO2008033329A2 (en)

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US7921139B2 (en) * 2006-12-01 2011-04-05 Whitserve Llc System for sequentially opening and displaying files in a directory
JP5485889B2 (en) * 2007-08-17 2014-05-07 レニショウ パブリック リミテッド カンパニー Apparatus and method for performing phase analysis measurement
US7895009B2 (en) * 2007-11-07 2011-02-22 Amfit, Inc. Impression foam digital scanner
JP5141452B2 (en) * 2008-09-05 2013-02-13 富士通株式会社 Attitude measurement device and attitude measurement method
GB2468164B (en) * 2009-02-27 2014-08-13 Samsung Electronics Co Ltd Computer-aided detection of lesions
GB0915904D0 (en) 2009-09-11 2009-10-14 Renishaw Plc Non-contact object inspection
JP5578844B2 (en) 2009-12-21 2014-08-27 キヤノン株式会社 Information processing apparatus, information processing method, and program
JP5615055B2 (en) * 2010-06-18 2014-10-29 キヤノン株式会社 Information processing apparatus and processing method thereof
KR101547218B1 (en) * 2010-11-19 2015-08-25 주식회사 고영테크놀러지 Method for inspecting substrate
US9124873B2 (en) 2010-12-08 2015-09-01 Cognex Corporation System and method for finding correspondence between cameras in a three-dimensional vision system
US8600192B2 (en) 2010-12-08 2013-12-03 Cognex Corporation System and method for finding correspondence between cameras in a three-dimensional vision system
US11488322B2 (en) 2010-12-08 2022-11-01 Cognex Corporation System and method for training a model in a plurality of non-perspective cameras and determining 3D pose of an object at runtime with the same
EP2857872B1 (en) 2012-06-01 2021-05-19 Toppan Printing Co., Ltd. Method of manufacturing an anisotropic reflection display unit
US9217636B2 (en) * 2012-06-11 2015-12-22 Canon Kabushiki Kaisha Information processing apparatus, information processing method, and a computer-readable storage medium
WO2016001985A1 (en) 2014-06-30 2016-01-07 ４Ｄセンサー株式会社 Measurement method, measurement device, measurement program, and computer-readable recording medium recording measurement program
US10330465B2 (en) 2014-08-08 2019-06-25 Applied Research Associates, Inc. Systems, methods, and apparatuses for measuring deformation of a surface
FR3027136B1 (en) * 2014-10-10 2017-11-10 Morpho METHOD OF IDENTIFYING A SIGN ON A DEFORMATION DOCUMENT
US9536320B1 (en) * 2014-12-23 2017-01-03 John H. Prince Multiple coordinated detectors for examination and ranging
JP6317666B2 (en) * 2014-12-25 2018-04-25 サクサ株式会社 Image processing program and image processing system
US9952037B2 (en) * 2015-06-26 2018-04-24 Glasstech, Inc. System and method for developing three-dimensional surface information corresponding to a contoured sheet
US20180172567A1 (en) * 2015-07-09 2018-06-21 National Institute Of Advanced Industrial Science And Technology A method for measuring damage progression and a system for measuring damage progression
JPWO2017175341A1 (en) * 2016-04-06 2019-02-14 ４Ｄセンサー株式会社 Measuring method, measuring apparatus, measuring program, and computer-readable recording medium recording the measuring program
US11580156B2 (en) * 2019-11-28 2023-02-14 Mitsubishi Electric Corporation Workpiece image search apparatus and workpiece image search method
US20230194259A1 (en) * 2020-10-09 2023-06-22 Virtek Vision International Inc Control of an optical indicator system through manipulation of physical objects

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US4185918A (en) * 1975-08-27 1980-01-29 Solid Photography Inc. Arrangement for sensing the characteristics of a surface and determining the position of points thereon
US6075605A (en) * 1997-09-09 2000-06-13 Ckd Corporation Shape measuring device
US7068825B2 (en) * 1999-03-08 2006-06-27 Orametrix, Inc. Scanning system and calibration method for capturing precise three-dimensional information of objects
US20020088952A1 (en) * 2000-11-15 2002-07-11 Rao Nagaraja P. Optical method and apparatus for inspecting large area planar objects
US20030043387A1 (en) * 2000-11-22 2003-03-06 Ssang-Gun Lim Method and apparatus for measuring the three-dimensional shape of an object using a moire equipment

Also Published As

Publication number Publication date
US20080075328A1 (en) 2008-03-27
US8054471B2 (en) 2011-11-08
WO2008033329A2 (en) 2008-03-20

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