WO2008067131A3 - Passive station power distribution for cable reduction - Google Patents

Passive station power distribution for cable reduction Download PDF

Info

Publication number
WO2008067131A3
WO2008067131A3 PCT/US2007/084086 US2007084086W WO2008067131A3 WO 2008067131 A3 WO2008067131 A3 WO 2008067131A3 US 2007084086 W US2007084086 W US 2007084086W WO 2008067131 A3 WO2008067131 A3 WO 2008067131A3
Authority
WO
WIPO (PCT)
Prior art keywords
active station
power
power source
contact module
station
Prior art date
Application number
PCT/US2007/084086
Other languages
French (fr)
Other versions
WO2008067131A2 (en
Inventor
Kenneth V Almonte
Original Assignee
Electro Scient Ind Inc
Kenneth V Almonte
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electro Scient Ind Inc, Kenneth V Almonte filed Critical Electro Scient Ind Inc
Priority to CN2007800436786A priority Critical patent/CN101553740B/en
Priority to JP2009539398A priority patent/JP5300736B2/en
Priority to KR1020097012455A priority patent/KR101433984B1/en
Publication of WO2008067131A2 publication Critical patent/WO2008067131A2/en
Publication of WO2008067131A3 publication Critical patent/WO2008067131A3/en

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B3/00—Line transmission systems
    • H04B3/02—Details
    • H04B3/46—Monitoring; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • G01R31/013—Testing passive components
    • G01R31/016—Testing of capacitors
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02J—CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
    • H02J4/00—Circuit arrangements for mains or distribution networks not specified as ac or dc

Abstract

A power distribution system for a rotary capacitor electrical tester includes a power source, an active station having plurality of test channels powered by the power source through cables connected to one side an upper contact module of the active station, and an opposition side a lower contact module of the active station being connectable to a test measurement device. A separate additional cable conductor inlet is located on the active station for receiving power from the power source. The power supplied through the extra additional cable is passed through the upper contact module of the active station without connecting to test channel and presents a power conductor outlet interface to a passive station immediately adjacent to the active station in order to reduce the number of cables required to connect between the power source and the various passive stations incorporated into the rotary capacitor electrical tester.
PCT/US2007/084086 2006-11-30 2007-11-08 Passive station power distribution for cable reduction WO2008067131A2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
CN2007800436786A CN101553740B (en) 2006-11-30 2007-11-08 Passive station power distribution for cable reduction
JP2009539398A JP5300736B2 (en) 2006-11-30 2007-11-08 Passive station power distribution for cable reduction
KR1020097012455A KR101433984B1 (en) 2006-11-30 2007-11-08 Passive station power distribution for cable reduction

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/565,370 2006-11-30
US11/565,370 US7602192B2 (en) 2006-11-30 2006-11-30 Passive station power distribution for cable reduction

Publications (2)

Publication Number Publication Date
WO2008067131A2 WO2008067131A2 (en) 2008-06-05
WO2008067131A3 true WO2008067131A3 (en) 2008-08-07

Family

ID=39471666

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2007/084086 WO2008067131A2 (en) 2006-11-30 2007-11-08 Passive station power distribution for cable reduction

Country Status (6)

Country Link
US (1) US7602192B2 (en)
JP (2) JP5300736B2 (en)
KR (1) KR101433984B1 (en)
CN (1) CN101553740B (en)
TW (1) TWI430533B (en)
WO (1) WO2008067131A2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8327536B2 (en) 2010-06-30 2012-12-11 Apple Inc. Method of manufacturing high-speed connector inserts and cables
TWI450263B (en) * 2010-06-30 2014-08-21 Apple Inc Circuitry for active cable
US9112310B2 (en) 2010-06-30 2015-08-18 Apple Inc. Spark gap for high-speed cable connectors
KR101474097B1 (en) 2010-06-30 2014-12-17 애플 인크. Power distribution inside cable
US8966134B2 (en) 2011-02-23 2015-02-24 Apple Inc. Cross-over and bypass configurations for high-speed data transmission
DE102013104644B4 (en) 2013-05-06 2020-06-04 Polylc Gmbh & Co. Kg Layer electrode for touch screens

Citations (3)

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US6169406B1 (en) * 1998-05-02 2001-01-02 Stanley G. Peschel Very low frequency high voltage sinusoidal electrical testing method, systems and apparatus
US6605951B1 (en) * 2000-12-11 2003-08-12 Lsi Logic Corporation Interconnector and method of connecting probes to a die for functional analysis
US20050089027A1 (en) * 2002-06-18 2005-04-28 Colton John R. Intelligent optical data switching system

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JP2804766B2 (en) * 1988-10-31 1998-09-30 達雄 石川 Joint of ceramic and metal
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JP2760263B2 (en) 1993-08-20 1998-05-28 株式会社村田製作所 Screening method for early failure products of ceramic capacitors
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US6040705A (en) 1997-08-20 2000-03-21 Electro Scientific Industries, Inc. Rolling electrical contactor
JP3516251B2 (en) * 1997-09-17 2004-04-05 シーケーディ株式会社 Aging method for chip type capacitor and its device
US6100707A (en) 1998-09-25 2000-08-08 Electro Scientific Industries, Inc. Apparatus for testing multi-terminal electronic components
US6459707B1 (en) 1998-12-22 2002-10-01 National Instruments Corporation Relay multiplexer system and method for prevention of shock hazard
JP2000223377A (en) * 1999-02-03 2000-08-11 Matsushita Electric Ind Co Ltd Aging apparatus
US6677637B2 (en) 1999-06-11 2004-01-13 International Business Machines Corporation Intralevel decoupling capacitor, method of manufacture and testing circuit of the same
JP3548887B2 (en) 1999-12-20 2004-07-28 株式会社村田製作所 Method and apparatus for measuring insulation resistance
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Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6169406B1 (en) * 1998-05-02 2001-01-02 Stanley G. Peschel Very low frequency high voltage sinusoidal electrical testing method, systems and apparatus
US6605951B1 (en) * 2000-12-11 2003-08-12 Lsi Logic Corporation Interconnector and method of connecting probes to a die for functional analysis
US20050089027A1 (en) * 2002-06-18 2005-04-28 Colton John R. Intelligent optical data switching system

Also Published As

Publication number Publication date
US7602192B2 (en) 2009-10-13
TW200838085A (en) 2008-09-16
JP2013224952A (en) 2013-10-31
KR101433984B1 (en) 2014-08-25
CN101553740A (en) 2009-10-07
US20080129312A1 (en) 2008-06-05
JP5519062B2 (en) 2014-06-11
WO2008067131A2 (en) 2008-06-05
CN101553740B (en) 2012-01-11
TWI430533B (en) 2014-03-11
JP2010511867A (en) 2010-04-15
KR20090085108A (en) 2009-08-06
JP5300736B2 (en) 2013-09-25

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