WO2008080155A3 - Programmable pattern matching device - Google Patents

Programmable pattern matching device Download PDF

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Publication number
WO2008080155A3
WO2008080155A3 PCT/US2007/088757 US2007088757W WO2008080155A3 WO 2008080155 A3 WO2008080155 A3 WO 2008080155A3 US 2007088757 W US2007088757 W US 2007088757W WO 2008080155 A3 WO2008080155 A3 WO 2008080155A3
Authority
WO
WIPO (PCT)
Prior art keywords
pixel
image
identified
string
pattern
Prior art date
Application number
PCT/US2007/088757
Other languages
French (fr)
Other versions
WO2008080155A2 (en
Inventor
Babak Forutanpour
Original Assignee
Qualcomm Inc
Babak Forutanpour
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc, Babak Forutanpour filed Critical Qualcomm Inc
Publication of WO2008080155A2 publication Critical patent/WO2008080155A2/en
Publication of WO2008080155A3 publication Critical patent/WO2008080155A3/en

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/80—Camera processing pipelines; Components thereof
    • H04N23/81—Camera processing pipelines; Components thereof for suppressing or minimising disturbance in the image signal generation
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
    • H04N25/683—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects by defect estimation performed on the scene signal, e.g. real time or on the fly detection

Abstract

A programmable pattern-matching device is provided that may perform bad pixel correction and image sharpening and smoothing (noise removal). Soft edges of an image are identified and adaptively sharpened. Soft edges are identified by subtracting adjacent pixel values along a diagonal, row and/or column, generating a pixel string pattern based on the pixel value differences, and comparing the pixel string pattern to predefined string patterns indicative of a soft edge. Similarly, hard edges are identified by comparing the pixel string pattern to predefined string patterns indicative of a hard edge, which are then excluded from a low pass filter applied to smooth the image in order to reduce image noise. Bad photosensors of an image sensor are detected by subtracting a pixel value for a first photosensor from its surrounding photosensors to obtain a pixel string pattern that is then compared to predefined string patterns indicative of a bad pixel.
PCT/US2007/088757 2006-12-22 2007-12-22 Programmable pattern matching device WO2008080155A2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/614,987 2006-12-22
US11/614,987 US7800661B2 (en) 2006-12-22 2006-12-22 Programmable pattern matching device

Publications (2)

Publication Number Publication Date
WO2008080155A2 WO2008080155A2 (en) 2008-07-03
WO2008080155A3 true WO2008080155A3 (en) 2008-09-12

Family

ID=39244688

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2007/088757 WO2008080155A2 (en) 2006-12-22 2007-12-22 Programmable pattern matching device

Country Status (3)

Country Link
US (1) US7800661B2 (en)
TW (1) TW200841712A (en)
WO (1) WO2008080155A2 (en)

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JP2007105352A (en) * 2005-10-17 2007-04-26 Fujifilm Corp Difference image display device, difference image display method, and program thereof
US20080273102A1 (en) * 2007-05-01 2008-11-06 Hoya Corporation Detection device for defective pixel in photographic device
KR100872253B1 (en) * 2007-08-23 2008-12-05 삼성전기주식회사 Method for eliminating noise of image generated by image sensor
KR101442242B1 (en) * 2007-12-12 2014-09-29 삼성전자주식회사 Defect and noise removal method
US8971659B2 (en) * 2008-08-05 2015-03-03 Qualcomm Incorporated Bad pixel cluster detection
US8310570B1 (en) * 2008-10-08 2012-11-13 Marvell International Ltd. Repairing defective pixels
JP5655355B2 (en) * 2009-11-02 2015-01-21 ソニー株式会社 Pixel defect correction device, imaging device, pixel defect correction method, and program
EP2354840A1 (en) * 2010-02-05 2011-08-10 Siemens Aktiengesellschaft An apparatus and a method for performing a difference measurement of an object image
EP2629519A1 (en) * 2010-02-05 2013-08-21 Siemens Aktiengesellschaft A method and an apparatus for difference measurement of an image
TWI407801B (en) * 2010-08-11 2013-09-01 Silicon Motion Inc Method and apparatus for performing bad pixel compensation
TWI488484B (en) * 2010-08-18 2015-06-11 Silicon Motion Inc Method and apparatus for performing de-noise processing
US8352642B2 (en) * 2010-11-02 2013-01-08 Himax Technologies Limited Method and apparatus of controlling an operational status of an electronic device
US20120200754A1 (en) * 2011-02-09 2012-08-09 Samsung Electronics Co., Ltd. Image Noise Reducing Systems And Methods Thereof
JP6291940B2 (en) * 2014-03-20 2018-03-14 株式会社ソシオネクスト Defective pixel correction device, imaging device, and defective pixel correction method
WO2015166518A1 (en) * 2014-04-28 2015-11-05 Eizo株式会社 Annotation line determining unit, annotation line removing unit, medical display, and method therefor
CN104935837B (en) * 2015-06-10 2018-02-06 无锡英斯特微电子有限公司 For optical imagery pointing device and the image processing method of optical video equipment

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EP1049041A2 (en) * 1999-04-30 2000-11-02 Seiko Epson Corporation Image processing apparatus and methods for pattern recognition
WO2001052188A2 (en) * 2000-01-12 2001-07-19 Koninklijke Philips Electronics N.V. Method and apparatus for edge detection
US20020097439A1 (en) * 2001-01-23 2002-07-25 Oak Technology, Inc. Edge detection and sharpening process for an image
US20020158977A1 (en) * 2001-02-19 2002-10-31 Eastman Kodak Company Correcting defects in a digital image caused by a pre-existing defect in a pixel of an image sensor
JP2003348456A (en) * 2002-03-20 2003-12-05 Ricoh Co Ltd Digital still camera
US20050010621A1 (en) * 2003-07-07 2005-01-13 Victor Pinto Dynamic identification and correction of defective pixels
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US20060132626A1 (en) * 2004-12-21 2006-06-22 Junzo Sakurai Pixel defect correction device

Also Published As

Publication number Publication date
TW200841712A (en) 2008-10-16
US7800661B2 (en) 2010-09-21
WO2008080155A2 (en) 2008-07-03
US20080152230A1 (en) 2008-06-26

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