WO2009064478A2 - Photonic based cross-correlation homodyne detection with low phase noise - Google Patents

Photonic based cross-correlation homodyne detection with low phase noise Download PDF

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Publication number
WO2009064478A2
WO2009064478A2 PCT/US2008/012815 US2008012815W WO2009064478A2 WO 2009064478 A2 WO2009064478 A2 WO 2009064478A2 US 2008012815 W US2008012815 W US 2008012815W WO 2009064478 A2 WO2009064478 A2 WO 2009064478A2
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WIPO (PCT)
Prior art keywords
signal
branch
photonic
oscillation signal
produce
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Application number
PCT/US2008/012815
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French (fr)
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WO2009064478A3 (en
Inventor
Danny Eliyahu
Nikolai Morozov
Lutfollah Maleki
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Oewaves, Inc.
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Application filed by Oewaves, Inc. filed Critical Oewaves, Inc.
Priority to EP08850317.2A priority Critical patent/EP2220794B1/en
Priority to CN200880119850.6A priority patent/CN101904115B/en
Publication of WO2009064478A2 publication Critical patent/WO2009064478A2/en
Publication of WO2009064478A3 publication Critical patent/WO2009064478A3/en

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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/60—Receivers
    • H04B10/61—Coherent receivers
    • H04B10/63—Homodyne, i.e. coherent receivers where the local oscillator is locked in frequency and phase to the carrier signal
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/60—Receivers
    • H04B10/61—Coherent receivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G01R31/2824—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits testing of oscillators or resonators

Definitions

  • This application relates to oscillators and characterization of oscillators, including oscillators in RF, microwave, or millimeter spectral range.
  • An oscillator is a device that produces an oscillation signal at a desired oscillation frequency.
  • the output of the oscillator may be used as a frequency reference for various applications and thus it is desirable that the noise of the oscillator be low and can be properly measured.
  • a measurement apparatus for characterizing an oscillator should have low noise .
  • this document provides an implementation of a system for characterizing an oscillator.
  • This system includes an input port that receives an oscillation signal from an oscillator under test; an input port signal splitter that splits the received oscillation signal into a first oscillation signal and a second oscillation signal; a first photonic signal processing branch circuit that processes the first oscillation signal to produce a first branch output signal; a second photonic signal processing branch circuit that processes the second oscillation signal to produce a second branch output signal; a dual channel signal analyzer that receives the first and second branch output signals to measure noise in the received oscillation signal; and a computer controller that controls the first and second photonic signal processing branch circuits and the dual channel signal analyzer to control measurements of the noise in the received oscillation signal.
  • the first photonic signal processing branch circuit includes a first signal splitter to splits the first oscillation signal into a first branch signal and a second branch signal; a photonic branch that receives the first branch signal and comprises a laser that produces a laser beam, an optical modulator that modulates the laser beam in response to the first branch signal to produce a modulated laser beam that carries the first branch signal, an optical delay unit that transmits the modulated laser beam to produce a delay in the modulated laser beam, and an optical detector that converts the modulated laser beam into a detector signal; an electrical branch that receives the second branch signal and comprises a voltage controlled phase shifter that receives the second branch signal and to changes a phase of the second branch signal to produce an output signal; and a signal mixer that mixes the detector signal and the output signal to produce the first branch output signal.
  • FIG. 1 shows an example for an automated opto-electronics cross-correlation homodyne phase noise setup to illustrate various technical features.
  • FIG. 1 shows an example for an automated opto-electronics cross-correlation homodyne phase noise setup to illustrate various technical features.
  • This exemplary setup is implemented via optical fiber serving as a long delay line.
  • the dual homodyne setup is then cross correlated at the signal analyzer to reduce the noise of each of the homodyne branches by averaging out noise that is not correlated with the oscillator under test.
  • phase noise measurements of microwave/RF oscillators generating high purity electro-magnetic signals requires low phase noise measurement setup.
  • the present technique can be used to reduce the noise floor of a single homodyne measurement setup by cross correlating the signals of two measurement setups. In this way, the uncorrelated noise from each of the setups is averaged out at the signal analyzer.
  • the phase noise floor of the cross-correlated dual systems can be improved by 201og(N) (in dB units), where N is the number of averages.
  • Each of the two measurement setups is an electro-optic homodyne setup with two signal branches. A signal splitter splits a received microwave/RF signal into the two branches.
  • the oscillator 101 under test is coupled to the input port of the system which includes an input port splitter 102.
  • the two signal branches include two branch signal splitters 102A and 102B, respectively. Each of the splitters 102A and 102B splits the received signal into two signals for two branches.
  • the first signal branch is a photonic signal branch which includes a high-speed optical modulator (MOD) 111 or 121 to modulate a CW laser beam from a laser 110 or 121 in response to the microwave/RF signal to produce a modulated optical signal that carries the microwave/RF signal.
  • the modulated optical signal is directed along an optical fiber which serves as a signal delay line 112 or 122, allowing for efficient discrimination of the noise.
  • the increase of the length of the fiber 112 or 122 leads to an increased delay of the signal and reduces the close-in phase noise of the setup.
  • the photodetector (PD) 113 or 123 converts the modulated light back into a microwave signal which is then amplified by an amplifier 114 or 124.
  • the second signal branch includes a voltage controlled phase shifter (VCP) 115 or 125 and a signal amplifier 116 or 126.
  • VCP voltage controlled phase shifter
  • a signal mixer 117 or 127 is used to combine the two branches together to mix the signals from the two branches to produce a beat signal.
  • a dual channel signal analyzer 130 is provided to receive the beat signals from the two measurement setups.
  • Such a system can be automated by using a voltage controlled phase shifters (VCPs) and a computer controller 140.
  • VCPs 115 and 125 are used for the calibration (voltage to phase) of the setup and for tuning the phase of the signal at the mixer (bring to quadrature) so it would be sensitive to phase noise.
  • the computer or microprocessor is used to carry out the measurement automatically.
  • the computer measures the calibration factor and put the mixer in quadrature.
  • the computer also controls the signal analyzer parameters, such as frequencies, the number of averages, the resolution, the bandwidth etc.
  • the computer plots the phase noise at the monitor and allows for saving the data.
  • a. The computer sweeps the bias voltage over the voltage controlled phase shifters (VCPs), and at the same time records the mixers output voltage response through an A/D card.
  • VCPs voltage controlled phase shifters
  • VVCP voltage controlled phase shifters
  • the computer tunes the VCPs bias voltage so that the mixers are at zero DC output. This sets the mixers at quadrature, which makes them phase noise sensitive (low sensitivity to amplitude noise at saturation) .
  • Phase noise measurements [0022] a. The computer controls the signal analyzer in terms of range of measurement frequencies, resolution bandwidth, number of averages (the user has control over these parameters through the user interface software) and other parameters.
  • the computer retrieves the mixer's voltage fluctuations FFT data from the signal analyzer.
  • the computer monitors the mixers voltage. If the voltage drifts over the allowable range due to oscillator frequency drift and/or the delay thermal drift, then the computer sets the signal analyzer on a pause mode, brings the system to quadrature again, and continues with the FFT measurements .
  • the noise floor of the system could be improved by increasing the number of FFT averages N.
  • the noise floor drops as 5-log(N) (in dB units) .
  • This setup has the advantage of direct phase noise measurements (no need for second oscillator and phase locking) .
  • the RF carrier frequency range is wide and usually limited by the RF amplifiers and VCPs. In our current setup it is between 6 to 12GHz.

Abstract

In one aspect, this document provides an implementation of a system for characterizing an oscillator. This system includes an input port that receives an oscillation signal from an oscillator under test; an input port signal splitter that splits the received oscillation signal into a first oscillation signal and a second oscillation signal; a first photonic signal processing branch circuit that processes the first oscillation signal to produce a first branch output signal; a second photonic signal processing branch circuit that processes the second oscillation signal to produce a second branch output signal; a dual channel signal analyzer that receives the first and second branch output signals to measure noise in the received oscillation signal; and a computer controller that controls the first and second photonic signal processing branch circuits and the dual channel signal analyzer to control measurements of the noise in the received oscillation signal.

Description

PHOTONIC-BASED CROSS-CORRELATION HOMODYNE DETECTION WITH LOW
PHASE NOISE
Priority Claim and Related Application
[0001] This document claims the benefits of U.S. Provisional Application No. 61/002,918 entitled "PHOTONIC-BASED CROSS- CORRELATION HOMODYNE DETECTION WITH LOW PHASE NOISE" and filed November 13, 2007, the disclosure of which is incorporated by reference as part of the specification of this document.
Background
[0002] This application relates to oscillators and characterization of oscillators, including oscillators in RF, microwave, or millimeter spectral range.
[0003] An oscillator is a device that produces an oscillation signal at a desired oscillation frequency. The output of the oscillator may be used as a frequency reference for various applications and thus it is desirable that the noise of the oscillator be low and can be properly measured. A measurement apparatus for characterizing an oscillator should have low noise .
Summary
[0004] In one aspect, this document provides an implementation of a system for characterizing an oscillator. This system includes an input port that receives an oscillation signal from an oscillator under test; an input port signal splitter that splits the received oscillation signal into a first oscillation signal and a second oscillation signal; a first photonic signal processing branch circuit that processes the first oscillation signal to produce a first branch output signal; a second photonic signal processing branch circuit that processes the second oscillation signal to produce a second branch output signal; a dual channel signal analyzer that receives the first and second branch output signals to measure noise in the received oscillation signal; and a computer controller that controls the first and second photonic signal processing branch circuits and the dual channel signal analyzer to control measurements of the noise in the received oscillation signal. [0005] In one implementation of the above system, the first photonic signal processing branch circuit includes a first signal splitter to splits the first oscillation signal into a first branch signal and a second branch signal; a photonic branch that receives the first branch signal and comprises a laser that produces a laser beam, an optical modulator that modulates the laser beam in response to the first branch signal to produce a modulated laser beam that carries the first branch signal, an optical delay unit that transmits the modulated laser beam to produce a delay in the modulated laser beam, and an optical detector that converts the modulated laser beam into a detector signal; an electrical branch that receives the second branch signal and comprises a voltage controlled phase shifter that receives the second branch signal and to changes a phase of the second branch signal to produce an output signal; and a signal mixer that mixes the detector signal and the output signal to produce the first branch output signal. [0006] These and other features are described in greater detail in the drawings, the description and the claims.
Brief Description of Drawings
[0007] FIG. 1 shows an example for an automated opto-electronics cross-correlation homodyne phase noise setup to illustrate various technical features.
Detailed Description
[0008] This application describes techniques, apparatus and systems for characterizing oscillators in RF, microwave, or millimeter spectral range based on photonic components. [0009] FIG. 1 shows an example for an automated opto-electronics cross-correlation homodyne phase noise setup to illustrate various technical features. This exemplary setup is implemented via optical fiber serving as a long delay line. The dual homodyne setup is then cross correlated at the signal analyzer to reduce the noise of each of the homodyne branches by averaging out noise that is not correlated with the oscillator under test.
[0010] Phase noise measurements of microwave/RF oscillators generating high purity electro-magnetic signals requires low phase noise measurement setup. The present technique can be used to reduce the noise floor of a single homodyne measurement setup by cross correlating the signals of two measurement setups. In this way, the uncorrelated noise from each of the setups is averaged out at the signal analyzer. The phase noise floor of the cross-correlated dual systems can be improved by 201og(N) (in dB units), where N is the number of averages. [0011] Each of the two measurement setups is an electro-optic homodyne setup with two signal branches. A signal splitter splits a received microwave/RF signal into the two branches. The oscillator 101 under test is coupled to the input port of the system which includes an input port splitter 102. The two signal branches include two branch signal splitters 102A and 102B, respectively. Each of the splitters 102A and 102B splits the received signal into two signals for two branches. [0012] The first signal branch is a photonic signal branch which includes a high-speed optical modulator (MOD) 111 or 121 to modulate a CW laser beam from a laser 110 or 121 in response to the microwave/RF signal to produce a modulated optical signal that carries the microwave/RF signal. The modulated optical signal is directed along an optical fiber which serves as a signal delay line 112 or 122, allowing for efficient discrimination of the noise. The increase of the length of the fiber 112 or 122 leads to an increased delay of the signal and reduces the close-in phase noise of the setup. The photodetector (PD) 113 or 123 converts the modulated light back into a microwave signal which is then amplified by an amplifier 114 or 124. The second signal branch includes a voltage controlled phase shifter (VCP) 115 or 125 and a signal amplifier 116 or 126. A signal mixer 117 or 127 is used to combine the two branches together to mix the signals from the two branches to produce a beat signal.
[0013] A dual channel signal analyzer 130 is provided to receive the beat signals from the two measurement setups. [0014] Such a system can be automated by using a voltage controlled phase shifters (VCPs) and a computer controller 140. The VCPs 115 and 125 are used for the calibration (voltage to phase) of the setup and for tuning the phase of the signal at the mixer (bring to quadrature) so it would be sensitive to phase noise. The computer or microprocessor is used to carry out the measurement automatically. The computer measures the calibration factor and put the mixer in quadrature. The computer also controls the signal analyzer parameters, such as frequencies, the number of averages, the resolution, the bandwidth etc. In addition, the computer plots the phase noise at the monitor and allows for saving the data.
[0015] Following is a tuning and calibration procedure for the cross-correlation homodyne phase noise set-up in FIG. 1. The computer can be operated to perform this procedure automatically. [0016] 1. Calibration:
[0017] a. The computer sweeps the bias voltage over the voltage controlled phase shifters (VCPs), and at the same time records the mixers output voltage response through an A/D card. [0018] b. Stored calibrated formulas for the voltage controlled phase shifters as a function of the VCP' s bias voltage, φ (VVCP), allow the computer to calculate the calibration responses between phases to the mixer voltage (Δφ/ΔVmixer at Vmixer=0) , for each of the two identical setups. [0019] 2. Quadrature setting:
[0020] a. The computer tunes the VCPs bias voltage so that the mixers are at zero DC output. This sets the mixers at quadrature, which makes them phase noise sensitive (low sensitivity to amplitude noise at saturation) . [0021] 3. Phase noise measurements: [0022] a. The computer controls the signal analyzer in terms of range of measurement frequencies, resolution bandwidth, number of averages (the user has control over these parameters through the user interface software) and other parameters.
[0023] b. The computer retrieves the mixer's voltage fluctuations FFT data from the signal analyzer.
[0024] c . At the same time, the computer monitors the mixers voltage. If the voltage drifts over the allowable range due to oscillator frequency drift and/or the delay thermal drift, then the computer sets the signal analyzer on a pause mode, brings the system to quadrature again, and continues with the FFT measurements .
[0025] d. The data is then converted to phase noise spectral density using the calibration value measured in section 1 and the fiber delay length factor.
[0026] e. The data is then plotted on the screen, and optionally could be stored into a file.
[0027] The noise floor of the system could be improved by increasing the number of FFT averages N. The noise floor drops as 5-log(N) (in dB units) .
[0028] The above procedure describes only one of the software modes of operation. Other modes allow to use only one of the two homodyne setups, or measure the mixer voltage spectral density directly (for active/passive device phase noise measurements) . The user also has control over the delay length.
[0029] This setup has the advantage of direct phase noise measurements (no need for second oscillator and phase locking) . The RF carrier frequency range is wide and usually limited by the RF amplifiers and VCPs. In our current setup it is between 6 to 12GHz.
[0030] In a recent build of a new cross correlation homodyne setup, the setup noise floor was improved and is currently better than: a. -HOdBc/Hz at 100Hz offset b. -140dBc/Hz at IkHz offset
3 "" c. -170dBc/Hz for >10kHz offsets
[0031] While this specification contains many specifics, these should not be construed as limitations on the scope of an invention or of what may be claimed, but rather as descriptions of features specific to particular embodiments of the invention. Certain features that are described in this specification in the context of separate embodiments can also be implemented in combination in a single embodiment. Conversely, various features that are described in the context of a single embodiment can also be implemented in multiple embodiments separately or in any suitable subcombination . Moreover, although features may be described above as acting in certain combinations and even initially claimed as such, one or more features from a claimed combination can in some cases be excised from the combination, and the claimed combination may be directed to a subcombination or a variation of a subcombination. [0032] Only a few implementations are disclosed. However, it is understood that variations and enhancements may be made .

Claims

ClaimsWhat is claimed is:
1. A system for characterizing an oscillator, comprising: an input port that receives an oscillation signal from an oscillator under test; an input port signal splitter that splits the received oscillation signal into a first oscillation signal and a second oscillation signal; a first photonic signal processing branch circuit that processes the first oscillation signal to produce a first branch output signal; a second photonic signal processing branch circuit that processes the second oscillation signal to produce a second branch output signal; a dual channel signal analyzer that receives the first and second branch output signals to measure noise in the received oscillation signal; and a computer controller that controls the first and second photonic signal processing branch circuits and the dual channel signal analyzer to control measurements of the noise in the received oscillation signal .
2. The system as in claim 1, wherein: the first photonic signal processing branch circuit comprises : a first signal splitter to splits the first oscillation signal into a first branch signal and a second branch signal; a photonic branch that receives the first branch signal and comprises a laser that produces a laser beam, an optical modulator that modulates the laser beam in response to the first branch signal to produce a modulated laser beam that carries the first branch signal, an optical delay unit that transmits the modulated laser beam to produce a delay in the modulated laser beam, and an optical detector that converts the modulated laser beam into a detector signal; an electrical branch that receives the second branch signal and comprises a voltage controlled phase shifter that receives the second branch signal and to changes a phase of the second branch signal to produce an output signal; and a signal mixer that mixes the detector signal and the output signal to produce the first branch output signal.
3. The system as in claim 2, wherein: the optical delay unit comprises a fiber delay line.
4. The system as in claim 2, wherein: the voltage controlled phase shifter is under a control of the computer controller.
5. The system as in claim 4, wherein: the computer controller controls the voltage controlled phase shifter to set a phase of the signal mixer at a quadrature condition.
PCT/US2008/012815 2007-11-13 2008-11-13 Photonic based cross-correlation homodyne detection with low phase noise WO2009064478A2 (en)

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EP08850317.2A EP2220794B1 (en) 2007-11-13 2008-11-13 Photonic based cross-correlation homodyne detection with low phase noise
CN200880119850.6A CN101904115B (en) 2007-11-13 2008-11-13 Photonic based cross-correlation homodyne detection with low phase noise

Applications Claiming Priority (2)

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US291807P 2007-11-13 2007-11-13
US61/002,918 2007-11-13

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8155914B2 (en) 2007-11-13 2012-04-10 Oewaves, Inc. Measuring phase noise in radio frequency, microwave or millimeter signals based on photonic delay
US8514400B2 (en) 2010-03-23 2013-08-20 Oewaves, Inc. Optical gyroscope sensors based on optical whispering gallery mode resonators
CN104137334A (en) * 2012-02-27 2014-11-05 高通股份有限公司 RF baseband beamforming
CN115865113A (en) * 2022-11-04 2023-03-28 华南理工大学 Millimeter wave self-homodyne receiver

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8571075B2 (en) 2010-11-29 2013-10-29 Imra America, Inc. Frequency comb source with large comb spacing
US7929589B1 (en) 2007-06-13 2011-04-19 Oewaves, Inc. Diffractive grating coupled whispering gallery mode resonators
US8094359B1 (en) 2008-05-15 2012-01-10 Oewaves, Inc. Electro-optic whispering-gallery-mode resonator devices
US8452139B1 (en) 2008-07-25 2013-05-28 Oewaves, Inc. Wide-band RF photonic receivers and other devices using two optical modes of different quality factors
US8331008B1 (en) 2008-10-14 2012-12-11 Oewaves, Inc. Photonic microwave and RF receivers based on electro-optic whispering-gallery-mode resonators
US8159736B2 (en) * 2008-11-13 2012-04-17 Oewaves, Inc. Tunable single sideband modulators based on electro-optic optical whispering gallery mode resonators and their applications
US9490894B2 (en) 2008-12-08 2016-11-08 Ciena Corporation Coherent probe and optical service channel systems and methods for optical networks
US8433192B2 (en) * 2008-12-08 2013-04-30 Ciena Corporation Dynamic performance monitoring systems and methods for optical networks
US8761603B1 (en) 2009-02-25 2014-06-24 Oewaves, Inc. Dynamically reconfigurable sensor arrays
US8498539B1 (en) 2009-04-21 2013-07-30 Oewaves, Inc. Dielectric photonic receivers and concentrators for radio frequency and microwave applications
US8417076B2 (en) 2009-06-22 2013-04-09 Oewaves, Inc. Tunable photonic microwave or radio frequency receivers based on electro-optic optical whispering gallery mode resonators
CN104764941B (en) * 2009-09-23 2018-01-09 光电波公司 Based on the phase noise in light delay measurement radio frequency, microwave or millimeter-wave signal
US8331409B1 (en) 2010-01-18 2012-12-11 Oewaves, Inc. Locking of a laser to an optical interferometer that is stabilized to a reference frequency
US8564869B1 (en) 2010-07-15 2013-10-22 Oewaves, Inc. Voltage controlled tunable single sideband modulators and devices based on electro-optic optical whispering gallery mode resonators
CN202373845U (en) 2010-08-10 2012-08-08 Oe电波公司 Self-injection locking of feedback enhancement of laser to optical resonator
JP5883503B2 (en) 2011-05-16 2016-03-15 オーイーウェイブス，インコーポレーテッド Generation of optical combs in single optical tones, RF oscillation signals and triple oscillator devices based on nonlinear optical resonators
US8804231B2 (en) 2011-06-20 2014-08-12 Oewaves, Inc. Stabilizing RF oscillator based on optical resonator
CN103733123B (en) 2011-06-23 2017-05-17 Oe电波公司 Parametric regenerative oscillators based on opto-electronic feedback and optical regeneration via nonlinear optical mixing in whispering gallery mode optical resonators
CN104040808B (en) 2011-06-30 2016-11-16 Oe电波公司 Compact optical atomic clock and the application being mixed based on the parametrization nonlinear optics in Whispering-gallery-mode optical resonantor
EP2831966A4 (en) 2012-03-27 2016-01-27 Oewaves Inc Tunable opto-electronic oscillator having optical resonator filter operating at selected modulation sideband
CN103424618B (en) * 2013-07-01 2015-12-23 闽南师范大学 A kind of photonic microwave frequency measurement and device
US9703266B2 (en) 2014-11-04 2017-07-11 Spectracom Corporation Independent fiber-optic reference apparatuses and methods thereof
WO2018044500A1 (en) 2016-09-01 2018-03-08 Imra America, Inc. Ultra low noise photonic phase noise measurement system for microwave signal
CN106771688B (en) * 2017-03-07 2019-06-21 张家港市欧微自动化研发有限公司 A kind of application method of ultra wide band phase noise measuring system
US11255893B2 (en) 2018-08-22 2022-02-22 Keysight Technologies, Inc. Measuring error in signal under test (SUT) using multiple channel measurement device
CN110837009A (en) * 2019-10-22 2020-02-25 上海交通大学 Phase noise measuring device and measuring method based on laser phase discrimination cross-correlation algorithm
CN110988510B (en) * 2019-12-18 2022-08-30 北京无线电计量测试研究所 Phase noise detection method and device based on radio over fiber

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0747714A2 (en) 1995-06-06 1996-12-11 HE HOLDINGS, INC. dba HUGHES ELECTRONICS Noise measurement test system
US6580532B1 (en) 1999-01-28 2003-06-17 California Institute Of Technology Opto-electronic techniques for reducing phase noise in a carrier signal by carrier supression
US20050238094A1 (en) 2004-04-21 2005-10-27 Agilent Technologies, Inc. Method and an apparatus for measuring phase noise

Family Cites Families (71)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2179458B (en) * 1985-08-23 1988-11-09 Ferranti Plc Microwave noise measuring apparatus
US5172064A (en) * 1991-12-02 1992-12-15 The United States Of America As Represented By The Secretary Of Commerce Calibration system for determining the accuracy of phase modulation and amplitude modulation noise measurement apparatus
US5220292A (en) * 1992-01-02 1993-06-15 Raytheon Company Microwave oscillator with noise degeneration feedback circuit
US5204640A (en) * 1992-02-10 1993-04-20 California Institute Of Technology Widely tunable oscillator stabilization using analog fiber optic delay line
AUPM587094A0 (en) * 1994-05-25 1994-06-16 Poseidon Scientific Instruments Pty Ltd Microwave loop oscillators
US5495500A (en) * 1994-08-09 1996-02-27 Intermec Corporation Homodyne radio architecture for direct sequence spread spectrum data reception
US5723856A (en) * 1995-08-01 1998-03-03 California Institute Of Technology Opto-electronic oscillator having a positive feedback with an open loop gain greater than one
US5751747A (en) * 1995-12-20 1998-05-12 California Institute Of Technology Linear swept frequency generator
US5777778A (en) * 1996-01-23 1998-07-07 California Institute Of Technology Multi-Loop opto-electronic microwave oscillator with a wide tuning range
US6080586A (en) * 1996-04-05 2000-06-27 California Institute Of Technology Sub-micron chemical imaging with near-field laser desorption
US5929430A (en) * 1997-01-14 1999-07-27 California Institute Of Technology Coupled opto-electronic oscillator
US6178036B1 (en) * 1997-01-14 2001-01-23 California Institute Of Technology Opto-electronic devices and systems based on brillouin selective sideband amplification
US5917179A (en) * 1997-05-12 1999-06-29 California Institute Of Technology Brillouin opto-electronic oscillators
US5985166A (en) * 1997-10-29 1999-11-16 California Institute Of Technology Chemical etching of fiber probe
KR100288402B1 (en) * 1997-12-29 2001-05-02 윤종용 Method for confronting buffer underrun of optical disc drive
US7106917B2 (en) * 1998-11-13 2006-09-12 Xponent Photonics Inc Resonant optical modulators
US6317214B1 (en) * 1998-12-22 2001-11-13 Nortel Networks Limited Method and apparatus to determine a measurement of optical multiple path interference
AU3855300A (en) * 1999-01-26 2000-08-07 California Institute Of Technology Opto-electronic oscillators having optical resonators
US6389197B1 (en) * 1999-02-10 2002-05-14 California Institute Of Technology Coupling system to a microsphere cavity
US6473218B1 (en) * 1999-06-11 2002-10-29 California Institute Of Technology Light modulation in whispering-gallery-mode resonators
EP1228395A2 (en) * 1999-10-27 2002-08-07 California Institute of Technology Opto-electronic devices for processing and transmitting rf signals based on brillouin selective sideband amplification
US6476959B2 (en) * 2000-01-10 2002-11-05 California Institute Of Technology Optical pulse synthesis using brillouin selective sideband amplification
US6798947B2 (en) * 2000-02-10 2004-09-28 California Institute Of Technology Coupling system to a microsphere cavity
US6487233B2 (en) * 2000-02-23 2002-11-26 California Institute Of Technology Fiber-coupled microsphere laser
CA2402615C (en) * 2000-03-22 2007-03-20 California Institute Of Technology Non-spherical whispering-gallery-mode microactivity
DE60122154D1 (en) * 2000-06-09 2006-09-21 California Inst Of Techn ACCELERATING SENSITIVE OPTOELECTRONIC OSCILLATORS
JP2004503816A (en) 2000-06-15 2004-02-05 カリフォルニア　インスティテュート　オブ　テクノロジー Direct electro-optic conversion and light modulation in microwhispering gallery mode resonators
WO2002013337A1 (en) * 2000-08-08 2002-02-14 California Institute Of Technology Optical sensing based on whispering-gallery-mode microcavity
US20020085266A1 (en) * 2000-11-27 2002-07-04 Yao Xiaotian Steve Wavelength converter with an impedance matched electro-absorption modulator pair
KR100353641B1 (en) * 2000-12-21 2002-09-28 삼성전자 주식회사 Base station transmit antenna diversity apparatus and method in cdma communication system
US7283707B1 (en) * 2001-07-25 2007-10-16 Oewaves, Inc. Evanescently coupling light between waveguides and whispering-gallery mode optical resonators
US6853479B1 (en) * 2001-08-30 2005-02-08 Oewaves, Inc. Apparatus and method for coupling light between an optical resonator and a semiconductor chip with a minimum number of components and alignment steps
US6928091B1 (en) * 2001-09-26 2005-08-09 Oewaves, Inc. Opto-electronic oscillator including a tunable electro-optic filter
JP3672524B2 (en) * 2001-11-15 2005-07-20 住友電工ブレーキシステムズ株式会社 Power supply circuit for actuator of in-vehicle travel controller
US6906309B2 (en) * 2001-11-15 2005-06-14 Hrl Laboratories, Llc Injection-seeding of a multi-tone photonic oscillator
US6879752B1 (en) * 2002-04-03 2005-04-12 Oewaves, Inc. Film spacer for setting the gap between an optical coupler and a whispering-gallery mode optical resonator
ATE445922T1 (en) * 2002-04-09 2009-10-15 California Inst Of Techn ATOMIC CLOCK BASED ON AN OPTOELECTRONIC OSCILLATOR
US6922497B1 (en) * 2002-05-17 2005-07-26 California Institute Of Technology Whispering gallery mode resonators based on radiation-sensitive materials
US6987914B2 (en) * 2002-05-17 2006-01-17 California Institute Of Technology Optical filter having coupled whispering-gallery-mode resonators
US6901189B1 (en) * 2002-05-17 2005-05-31 California Institute Of Technology Graded-index whispering gallery mode resonators
US6943934B1 (en) * 2002-05-28 2005-09-13 California Institute Of Technology Nonlinear optical whispering gallery mode resonators
US7050212B2 (en) * 2002-11-22 2006-05-23 California Institute Of Technology Active mode-locked lasers and other photonic devices using electro-optic whispering gallery mode resonators
US7092591B2 (en) * 2003-02-03 2006-08-15 California Institute Of Technology Tunable optical filters having electro-optic whispering-gallery-mode resonators
US7133180B2 (en) * 2003-06-03 2006-11-07 Oewaves, Inc. Resonant impedance matching in microwave and RF device
US7248763B1 (en) * 2003-07-03 2007-07-24 Oewaves, Inc. Optical resonators with reduced OH-content
US7062131B2 (en) * 2003-07-03 2006-06-13 Oewaves, Inc. Optical coupling for whispering-gallery-mode resonators via waveguide gratings
US7400796B1 (en) * 2003-07-08 2008-07-15 Oewaves, Inc. Whispering-gallery-mode resonator architectures and manufacturing processes
WO2005017607A2 (en) * 2003-08-04 2005-02-24 California Institute Of Technology Opto-electronic feedback for stabilizing oscillators
WO2005033749A2 (en) * 2003-10-01 2005-04-14 California Institute Of Technology Tunable resonator-based devices for producing variable delays and narrow spectral linewidths
US7184451B2 (en) * 2003-10-15 2007-02-27 Oewaves, Inc. Continuously tunable coupled opto-electronic oscillators having balanced opto-electronic filters
US7187870B2 (en) 2003-10-15 2007-03-06 Oewaves, Inc. Tunable balanced opto-electronic filters and applications in opto-electronic oscillators
US7389053B1 (en) * 2003-10-15 2008-06-17 Oewaves, Inc. Tunable filtering of RF or microwave signals based on optical filtering in Mach-Zehnder configuration
CA2547966C (en) 2003-12-01 2010-08-17 Oewaves, Inc. Continuously tunable coupled opto-electronic oscillators having balanced opto-electronic filters
JP2007515904A (en) * 2003-12-23 2007-06-14 シリフィック ワイヤレス コーポレーション Method and apparatus for reduced noise band switching circuit
US7587144B2 (en) 2004-01-12 2009-09-08 Oewaves, Inc. Tunable radio frequency and microwave photonic filters
US7218662B1 (en) * 2004-02-12 2007-05-15 Oewaves, Inc. Coupled opto-electronic oscillators with low noise
US7356214B2 (en) * 2004-03-22 2008-04-08 Oewaves, Inc. Optical waveguide coupler for whispering-gallery-mode resonators
US7061335B2 (en) * 2004-04-15 2006-06-13 Oewaves, Inc. Processing of signals with regenerative opto-electronic circuits
US7362927B1 (en) * 2004-06-01 2008-04-22 Oewaves, Inc. Tunable RF or microwave photonic filters using temperature-balanced whispering gallery mode optical resonators
US7480425B2 (en) * 2004-06-09 2009-01-20 Oewaves, Inc. Integrated opto-electronic oscillators
US7260279B2 (en) * 2004-06-09 2007-08-21 Oewaves, Inc. Integrated opto-electronic oscillators
US7440651B1 (en) * 2004-11-17 2008-10-21 California Institute Of Technology Single mode whispering-gallery-mode resonator
WO2006076585A2 (en) 2005-01-13 2006-07-20 Oewaves, Inc. Tunable multi-loop opto-electronic oscillator with tunable rf or microwave filter based on optical filtering
CA2601576C (en) * 2005-03-17 2013-12-03 Oewaves, Inc. Coupled and non-coupled opto-electronic oscillators with enhanced performance
US8965727B2 (en) * 2005-05-20 2015-02-24 Omniphase Research Laboratories, Inc. Intelligent low noise design
JP4701928B2 (en) * 2005-09-01 2011-06-15 株式会社日立製作所 Optical electric field waveform observation device
WO2007143627A2 (en) 2006-06-02 2007-12-13 Oewaves, Inc. Integrated opto-electronic oscillators
WO2008030782A2 (en) * 2006-09-05 2008-03-13 Oewaves, Inc. Wideband receiver based on photonics technology
US7965745B2 (en) * 2007-06-13 2011-06-21 Oewaves, Inc. RF and microwave receivers based on electro-optic optical whispering gallery mode resonators
EP2162784B1 (en) * 2007-06-13 2017-08-09 Strobe, Inc. Tunable lasers locked to whispering gallery mode resonators
US7801189B2 (en) * 2007-11-13 2010-09-21 Oewaves, Inc. Cross modulation-based opto-electronic oscillator with tunable electro-optic optical whispering gallery mode resonator

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0747714A2 (en) 1995-06-06 1996-12-11 HE HOLDINGS, INC. dba HUGHES ELECTRONICS Noise measurement test system
US6580532B1 (en) 1999-01-28 2003-06-17 California Institute Of Technology Opto-electronic techniques for reducing phase noise in a carrier signal by carrier supression
US20050238094A1 (en) 2004-04-21 2005-10-27 Agilent Technologies, Inc. Method and an apparatus for measuring phase noise

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of EP2220794A4

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8155914B2 (en) 2007-11-13 2012-04-10 Oewaves, Inc. Measuring phase noise in radio frequency, microwave or millimeter signals based on photonic delay
US9234937B2 (en) 2007-11-13 2016-01-12 Oewaves, Inc. Measuring phase noise in radio frequency, microwave or millimeter signals based on photonic delay
US8514400B2 (en) 2010-03-23 2013-08-20 Oewaves, Inc. Optical gyroscope sensors based on optical whispering gallery mode resonators
CN104137334A (en) * 2012-02-27 2014-11-05 高通股份有限公司 RF baseband beamforming
CN115865113A (en) * 2022-11-04 2023-03-28 华南理工大学 Millimeter wave self-homodyne receiver
CN115865113B (en) * 2022-11-04 2023-07-18 华南理工大学 Millimeter wave self-homodyne receiver

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US8155913B2 (en) 2012-04-10
EP2220794A4 (en) 2014-01-29
CN101904115A (en) 2010-12-01
WO2009064478A3 (en) 2009-07-09
US20090208205A1 (en) 2009-08-20
EP2220794A2 (en) 2010-08-25

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