WO2011063292A3 - Semiconductor device having strain material - Google Patents

Semiconductor device having strain material Download PDF

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Publication number
WO2011063292A3
WO2011063292A3 PCT/US2010/057514 US2010057514W WO2011063292A3 WO 2011063292 A3 WO2011063292 A3 WO 2011063292A3 US 2010057514 W US2010057514 W US 2010057514W WO 2011063292 A3 WO2011063292 A3 WO 2011063292A3
Authority
WO
WIPO (PCT)
Prior art keywords
semiconductor device
source
strain material
drain
cell
Prior art date
Application number
PCT/US2010/057514
Other languages
French (fr)
Other versions
WO2011063292A2 (en
Inventor
Haining Yang
Original Assignee
Qualcomm Incorporated
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Incorporated filed Critical Qualcomm Incorporated
Priority to JP2012540112A priority Critical patent/JP5684280B2/en
Priority to CN201080061272.2A priority patent/CN102714183B/en
Priority to KR1020127015744A priority patent/KR101350846B1/en
Priority to EP10782788A priority patent/EP2502267A2/en
Publication of WO2011063292A2 publication Critical patent/WO2011063292A2/en
Publication of WO2011063292A3 publication Critical patent/WO2011063292A3/en

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Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B20/00—Read-only memory [ROM] devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
    • H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind
    • H01L27/085—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
    • H01L27/088—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02107—Forming insulating materials on a substrate
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
    • H01L21/4814—Conductive parts
    • H01L21/4846—Leads on or in insulating or insulated substrates, e.g. metallisation
    • H01L21/486—Via connections through the substrate with or without pins
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
    • H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
    • H01L21/8232—Field-effect technology
    • H01L21/8234—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
    • H01L21/8238—Complementary field-effect transistors, e.g. CMOS
    • H01L21/823807—Complementary field-effect transistors, e.g. CMOS with a particular manufacturing method of the channel structures, e.g. channel implants, halo or pocket implants, or channel materials
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H01L29/7842—Field effect transistors with field effect produced by an insulated gate means for exerting mechanical stress on the crystal lattice of the channel region, e.g. using a flexible substrate
    • H01L29/7843—Field effect transistors with field effect produced by an insulated gate means for exerting mechanical stress on the crystal lattice of the channel region, e.g. using a flexible substrate the means being an applied insulating layer
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B20/00—Read-only memory [ROM] devices
    • H10B20/27—ROM only
    • H10B20/30—ROM only having the source region and the drain region on the same level, e.g. lateral transistors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B99/00—Subject matter not provided for in other groups of this subclass
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/76—Making of isolation regions between components
    • H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
    • H01L21/76224—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using trench refilling with dielectric materials

Abstract

A semiconductor device having strain material is disclosed. In a particular embodiment, the semiconductor device includes a first cell including a first gate between a first drain and a first source. The semiconductor device also includes a second cell adjacent to the first cell. The second cell includes a second gate between a second drain and a second source. The semiconductor device further includes a shallow trench isolation area between the first source and the second source. A first amount of strain material over the first source and over the second source is greater than a second amount of strain material over the first drain and over the second drain.
PCT/US2010/057514 2009-11-19 2010-11-19 Semiconductor device having strain material WO2011063292A2 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2012540112A JP5684280B2 (en) 2009-11-19 2010-11-19 Semiconductor device with strained material
CN201080061272.2A CN102714183B (en) 2009-11-19 2010-11-19 Semiconductor device having strain material
KR1020127015744A KR101350846B1 (en) 2009-11-19 2010-11-19 Semiconductor device having strain material
EP10782788A EP2502267A2 (en) 2009-11-19 2010-11-19 Semiconductor device having strain material

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/621,736 US8159009B2 (en) 2009-11-19 2009-11-19 Semiconductor device having strain material
US12/621,736 2009-11-19

Publications (2)

Publication Number Publication Date
WO2011063292A2 WO2011063292A2 (en) 2011-05-26
WO2011063292A3 true WO2011063292A3 (en) 2012-07-05

Family

ID=43502595

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2010/057514 WO2011063292A2 (en) 2009-11-19 2010-11-19 Semiconductor device having strain material

Country Status (6)

Country Link
US (2) US8159009B2 (en)
EP (1) EP2502267A2 (en)
JP (1) JP5684280B2 (en)
KR (1) KR101350846B1 (en)
CN (1) CN102714183B (en)
WO (1) WO2011063292A2 (en)

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US8350253B1 (en) * 2010-01-29 2013-01-08 Xilinx, Inc. Integrated circuit with stress inserts
US8765491B2 (en) * 2010-10-28 2014-07-01 International Business Machines Corporation Shallow trench isolation recess repair using spacer formation process
US9564361B2 (en) 2013-09-13 2017-02-07 Qualcomm Incorporated Reverse self aligned double patterning process for back end of line fabrication of a semiconductor device
US9196613B2 (en) * 2013-11-19 2015-11-24 International Business Machines Corporation Stress inducing contact metal in FinFET CMOS
KR102219096B1 (en) * 2014-08-06 2021-02-24 삼성전자주식회사 Semiconductor device to which pattern structure for performance improvement is applied
KR102181686B1 (en) 2014-12-04 2020-11-23 삼성전자주식회사 Semiconductor devices and methods of manufacturing the same
US9362275B1 (en) * 2015-02-13 2016-06-07 Taiwan Semiconductor Manufacturing Co., Ltd. Semiconductor device with dummy gate structures
US9818873B2 (en) * 2015-10-09 2017-11-14 Globalfoundries Inc. Forming stressed epitaxial layers between gates separated by different pitches
US9991167B2 (en) * 2016-03-30 2018-06-05 Globalfoundries Inc. Method and IC structure for increasing pitch between gates
US9946674B2 (en) 2016-04-28 2018-04-17 Infineon Technologies Ag Scalable multi-core system-on-chip architecture on multiple dice for high end microcontroller
KR102629347B1 (en) * 2016-12-08 2024-01-26 삼성전자주식회사 Semiconductor device and method for manufacturing the same
US10331924B2 (en) 2016-12-14 2019-06-25 Reliant Immune Diagnostics, Inc. System and method for audiovisual response to retail diagnostic product
US11599908B2 (en) 2016-12-14 2023-03-07 Reliant Immune Diagnostics, Inc. System and method for advertising in response to diagnostic test
US10527555B2 (en) 2016-12-14 2020-01-07 Reliant Immune Disgnostics, Inc. System and method for visual trigger to perform diagnostic test
US11170877B2 (en) * 2016-12-14 2021-11-09 Reliant Immune Diagnostics, LLC System and method for correlating retail testing product to medical diagnostic code
US11594337B2 (en) 2016-12-14 2023-02-28 Reliant Immune Diagnostics, Inc. System and method for advertising in response to diagnostic test results
CN108574013B (en) * 2017-03-13 2021-07-30 中芯国际集成电路制造(上海)有限公司 Semiconductor device and method of operating the same
US10861553B2 (en) * 2018-09-27 2020-12-08 Taiwan Semiconductor Manufacturing Co., Ltd. Device-region layout for embedded flash
DE102019112410A1 (en) 2018-09-27 2020-04-02 Taiwan Semiconductor Manufacturing Co. Ltd. Device area layout for embedded flash memory
CN112151379B (en) * 2019-06-28 2023-12-12 中芯国际集成电路制造(上海)有限公司 Semiconductor structure and forming method thereof

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Also Published As

Publication number Publication date
US20130099851A1 (en) 2013-04-25
KR20120095433A (en) 2012-08-28
WO2011063292A2 (en) 2011-05-26
CN102714183A (en) 2012-10-03
JP5684280B2 (en) 2015-03-11
US20110115000A1 (en) 2011-05-19
EP2502267A2 (en) 2012-09-26
KR101350846B1 (en) 2014-01-13
US8159009B2 (en) 2012-04-17
CN102714183B (en) 2015-05-13
JP2013511850A (en) 2013-04-04

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