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A method and a system are described for managing the color quality of a calibrated output device. Measurement data from a strip output by the output device are analyzed. Based on the analysis, either it is indicated that the output device matches a reference output device, or a probable cause is indicated why the output device does not match the reference output device.

Inventors: Dirk Vansteenkiste, Stefan Livens, Marv Mahy
Current U.S. Classification: 700/108
International Classification: G06F019/00

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Referenced by

Citing PatentFiling dateIssue dateOriginal AssigneeTitle
US7502116Sep 9, 2003Mar 10, 2009Hewlett-Packard Development Company, L.P.Densitometers and methods for measuring optical density
US7593134Oct 23, 2006Sep 22, 2009Xerox CorporationColor rendering control system
US7619771Jan 28, 2005Nov 17, 2009Hewlett-Packard Development Company, L.P.Color calibration in a printer

Claims

1. A quality management method comprising:

obtaining measurement data of a strip output by a calibrated output device;
obtaining reference data from a reference output device;
analyzing said measurement data and said reference data;
indicating, based on said analysis
A. that said output device matches said reference output device; or
B. a probable cause why said output device does not match said reference output device.

2. The quality management method according to claim 1 wherein said output device is a proofer.

3. The quality management method according to claim 1 wherein said reference output device is a press standard.

4. The quality management method according to claim 1, further comprising outputting said strip by depositing an ink on a receiving substrate.

5. The quality management method according to claim 4, further comprising checking, based on said analysis, if said ink is a proper ink.

6. The quality management method according to claim 4, further comprising checking, based on said analysis, if said receiving substrate is a proper receiving substrate.

7. The quality management method according to claim 1 wherein said reference data are made up from data from a plurality of calibrated output devices.

8. The quality management method according to claim 7 wherein said reference data are an average of data from said plurality of calibrated output devices.

9. The quality management method according to claim 2 wherein said reference data are made up from data from a plurality of calibrated output devices.

10. The quality management method according to claim 9 wherein said reference data are an average of data from said plurality of calibrated output devices.

11. The quality management method according to claim 1 wherein said measurement data include a CIE L* value.

12. The quality management method according to claim 2 wherein said measurement data include a CIE L* value.

13. A data processing system comprising means for carrying out the method according to claim 1.

14. A computer program comprising computer program code means adapted to perform the method according to claim 1 when said program is run on a computer.

15. A computer readable medium comprising program code adapted to carry out the method according to claim 1 when run on a computer.

16. A data processing system comprising means for carrying out the method according to claim 2.

17. A computer program comprising computer program code means adapted to perform the method according to claim 2 when said program is run on a computer.

18. A computer readable medium comprising program code adapted to carry out the method according to claim 2 when run on a computer.

19. A quality management method comprising:

obtaining measurement data of a strip output by a calibrated output device;
obtaining reference data from a reference output device, wherein said reference data are a reference in time for said output device;
analyzing said measurement data and said reference data;
indicating, based on said analysis
A. that said output device is stable over time; or
B. a probable cause why said output device is not stable over time.

20. The quality management method according to claim 19 wherein said reference output device is said first output device and wherein the method further comprises:

obtaining said reference data from said first output device by measuring another strip output by said first output device at a point in time t1;
outputting said strip for obtaining said measurement data at a point in time t2 after said point in time t1.

21. The quality management method according to claim 19 wherein said reference data are made up from data from a plurality of calibrated output devices.

22. The quality management method according to claim 20 wherein said reference data are made up from data from a plurality of calibrated output devices.

23. The quality management method according to claim 19 wherein said measurement data include a CIE L* value.

24. The quality management method according to claim 20 wherein said measurement data include a CIE L* value.

25. A data processing system comprising means for carrying out the method according to claim 19.

26. A computer program comprising computer program code means adapted to perform the method according to claim 19 when said program is run on a computer.

27. A computer readable medium comprising program code adapted to carry out the method according to claim 19 when run on a computer.

28. A quality management method comprising:

obtaining measurement data of a strip output by a first, calibrated, proofer;
obtaining reference data from a second, calibrated, proofer, different from said first, calibrated, proofer;
analyzing said measurement data and said reference data;
indicating, based on said analysis
A. that said first proofer matches said second proofer; or
B. a probable cause why said first proofer does not match said second proofer.

29. The quality management method according to claim 28 wherein said second proofer is located remotely from said first proofer.

30. The quality management method according to claim 28 further comprising:

obtaining said reference data by measuring a second strip printed on said second proofer.

31. The quality management method according to claim 28 wherein said measurement data include a CIE L* value.

32. A data processing system comprising means for carrying out the method according to claim 28.

33. A computer program comprising computer program code means adapted to perform the method according to claim 28 when said program is run on a computer.

34. A computer readable medium comprising program code adapted to carry out the method according to claim 28 when run on a computer.

35. A quality management method comprising:

obtaining first measurement data of a strip output by a first, calibrated, proofer;
obtaining reference data from a reference output device;
making a first analysis of said first measurement data and said reference data;
obtaining second measurement data from a second, calibrated, proofer, different from said first proofer;
making a second analysis of said second measurement data and said reference data;
indicating, based on said first and said second analysis
A. that said second proofer matches said first proofer; or
B. a probable cause why said second proofer does not match said first proofer.

36. The quality management method according to claim 35 wherein said reference data are made up from data from a plurality of calibrated output devices.

37. The quality management method according to claim 35 wherein said measurement data include a CIE L* value.

38. A data processing system comprising means for carrying out the method according to claim 35.

39. A computer program comprising computer program code means adapted to perform the method according to claim 35 when said program is run on a computer.

40. A computer readable medium comprising program code adapted to carry out the method according to claim 35 when run on a computer.

41. A quality management method comprising:

obtaining measurement data of a strip output by a calibrated output device;
obtaining reference data from an offset printing press;
analyzing said measurement data and said reference data;
indicating, based on said analysis
A. that said output device matches said offset printing press; or
B. a probable cause why said output device does not match said offset printing press.

42. The quality management method according to claim 41 wherein said output device is a proofer.

43. The quality management method according to claim 41 further comprising obtaining said reference data by measuring a second strip printed on said offset printing press.

44. The quality management method according to claim 42 further comprising obtaining said reference data by measuring a second strip printed on said offset printing press.

45. The quality management method according to claim 41 wherein said measurement data include a CIE L* value.

46. A data processing system comprising means for carrying out the method according to claim 41.

47. A computer program comprising computer program code means adapted to perform the method according to claim 41 when said program is run on a computer.

48. A computer readable medium comprising program code adapted to carry out the method according to claim 41 when run on a computer.

49. A system comprising:

a calibrated output device for printing a strip;
an analyzing device for analyzing measurement data of said strip and reference data of a reference output device;
an indicator for indicating, based on said analysis of said measurement data and said reference data
A. that said calibrated output device matches said reference output device; or
B. a probable cause why said calibrated output device does not match said reference output device.

50. The system according to claim 49 wherein said calibrated output device is a proofer.

51. The system according to claim 49 further comprising a measurement device for obtaining said measurement data.

52. The system according to claim 50 further comprising a measurement device for obtaining said measurement data.