A method is provided for analyzing the functionality of an integrated circuit (IC). The method includes the step of applying a built-in self test (BIST) to the integrated circuit. The BIST includes a plurality of tests that result in the integrated circuit passing and/or failing with respect to predefined...http://www.google.com/patents/US6625769?utm_source=gb-gplus-sharePatent US6625769 - Method for IC fault analysis using programmable built-in self test and optical emission
