A voltage stress testable embedded dual capacitor structure for use in an integrated circuit (IC). The voltage stress testable embedded dual capacitor structure includes a semiconductor substrate with an electrically insulating base layer thereon, a first embedded dual capacitor and a second embedded...http://www.google.com/patents/US6259268?utm_source=gb-gplus-sharePatent US6259268 - Voltage stress testable embedded dual capacitor structure and process for its testing
