Semiconductor testing equipment according to the present invention comprises: an algorithmic pattern generator for generating a test pattern for testing a memory under test and applying the pattern to the memory under test; a comparator for comparing a response signal from the memory under test and an...http://www.google.com/patents/US7137055?utm_source=gb-gplus-sharePatent US7137055 - Semiconductor testing equipment, testing method for semiconductor, fabrication method of semiconductor, and semiconductor memory
