A system for testing semiconductor devices on device test boards has a single tester channel connected to multiple DUTs in a loop. Outputs from DUTs are received at a comparator and latch after a period of Round Trip Delay (RTD). The comparator is connected in a parallel configuration with the return...http://www.google.com/patents/US6292415?utm_source=gb-gplus-sharePatent US6292415 - Enhancements in testing devices on burn-in boards
