Embodiments of the invention include on-chip characterization of transistor degradation. In one embodiment, includes one or more functional blocks to perform one or more functions and an integrated on-chip characterization circuit to perform on-chip characterization of transistor degradation. The integrated...http://www.google.com/patents/US7205854?utm_source=gb-gplus-sharePatent US7205854 - On-chip transistor degradation monitoring
