A method of deducing properties of the shape of a waveform comprises (a) generating a signal based on a periodic pattern of logic levels; (b) measuring a DC level that is proportional to the average level of the signal and a DC level that is proportional to the average of the signal level squared; (c)...http://www.google.com/patents/US20050229053?utm_source=gb-gplus-sharePatent US20050229053 - Circuit and method for low frequency testing of high frequency signal waveforms
