Method and apparatus are disclosed for measuring the clock offset between a reference latch point and a subject latch point in a system. In the system, an associated latch point is provided on each chip which has a subject latch point, the clock offset to which is to be measured. Test data distribution...http://www.google.com/patents/US5003256?utm_source=gb-gplus-sharePatent US5003256 - Clock skew measurement technique
