A method and apparatus for scan design architecture with non-scan testing cost is disclosed. In one embodiment, the method comprises: transforming a plurality of sequential cells for a sequential circuit to a plurality of controllable and observable cells for a combinational circuit; connecting said...http://www.google.com/patents/US6959426?utm_source=gb-gplus-sharePatent US6959426 - Cost-effective scan architecture and a test application scheme for scan testing with non-scan test power and test application cost
