Disclosed is a process for analyzing the surface characteristics of opaque materials. The method comprises in one embodiment the use of a UV reflectometer to build a calibration matrix of data from a set of control samples and correlating a desired surface characteristic such as roughness or surface...http://www.google.com/patents/US6594013?utm_source=gb-gplus-sharePatent US6594013 - Reflectance method for evaluating the surface characteristics of opaque materials
