Integrated circuit memories provided with redundancy means enable the lines or columns of defective cells to be repaired. In order to avoid incompatibility between the addressing modifications due to a "grouped test" and those due to placing a redundant column or line into service, means are provided...http://www.google.com/patents/US5247481?utm_source=gb-gplus-sharePatent US5247481 - Memory integrated circuit with redundancy and improved addressing in test mode
