An inspection apparatus includes a device which prepares a circumscribing line of an object to be inspected from pictured image information of the inspected object, and a device which judges the quality of the inspected object from the image information on a portion of the inspected object defined by...http://www.google.com/patents/US4969199?utm_source=gb-gplus-sharePatent US4969199 - Apparatus for inspecting the molded case of an IC device
