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A probe assembly suitable for high-current measurements of an electrical device....
http://www.google.com/patents/US7498828?utm_source=gb-gplus-share
Patent US7498828 - Probe station with low inductance path
Probe station with low inductance path
John Dunklee et al
Overview
Abstract
Drawings
Description
Claims
Patent number
: 7498828
Filing date
: Jun 20, 2007
Issue date
: Mar 3, 2009
Application number
:
11/820,518
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