An easy and controllable method and system to attach a carbon nanotube to a scanning probe tip such as a scanning probe microscopy (SPM) tip using a focus ion beam (FIB) technique. The method and system includes selecting a carbon fiber by a Focus Ion Beam micromanipulator, picking up the carbon fiber...http://www.google.com/patents/US7847207?utm_source=gb-gplus-sharePatent US7847207 - Method and system to attach carbon nanotube probe to scanning probe microscopy tips
