A technique for characterising variation in a performance parameter(s) of circuit cells within a circuit cell library with perturbations in manufacturing process parameters uses a statistical approach whereby the statistical distribution of performance parameter(s) resulting from a joint distribution...http://www.google.com/patents/US8103990?utm_source=gb-gplus-sharePatent US8103990 - Characterising circuit cell performance variability in response to perturbations in manufacturing process parameters
