A memory device testing apparatus transfers at high speed a fail signal from a failure analysis memory unit 100 to a memory failure remedy analysis unit 200. The failure analysis memory unit 100 has a data storage memory 110 and a compact memory 120. The data storage memory 110 is divided into at least...http://www.google.com/patents/US6449704?utm_source=gb-gplus-sharePatent US6449704 - Memory failure analysis device that records which regions have at least one defect
