An electronic device for use with a probe head in automated test equipment. The device includes a plurality of semiconductor devices arranged to provide at least one driver/receiver pair where the driver portion of the driver/receiver pair is configured to transmit a signal to at least one device under...http://www.google.com/patents/US7768278?utm_source=gb-gplus-sharePatent US7768278 - High impedance, high parallelism, high temperature memory test system architecture
