The invention provides a number of related methods which improve the test and analysis of integrated circuit devices. A first method of the invention provides a method for pausing on a SCAN based test. A second method of the invention provides a method for using stimulations and responses of a known...http://www.google.com/patents/US7203877?utm_source=gb-gplus-sharePatent US7203877 - Failure analysis and testing of semi-conductor devices using intelligent software on automated test equipment (ATE)
