An I/O cell (101) becomes an output state according to a burn-in test mode signal M in a burn-in test and the output of a port output signal setting register (106) is selected in an output signal selecting circuit (105). An instruction for periodically alternately setting "H" and "L" in the port output...http://www.google.com/patents/US6832348?utm_source=gb-gplus-sharePatent US6832348 - Semiconductor integrated circuit having self-diagnosis test function and test method thereof
