A system for testing a number of integrated circuit (IC) devices under test (DUTs) having interface circuitry coupled to a single or multi-channel tester for receiving data values from the tester and providing error information concerning the DUTs. The interface circuitry forwards data values (received...http://www.google.com/patents/US20030126534?utm_source=gb-gplus-sharePatent US20030126534 - Distributed interface for parallel testing of multiple devices using a single tester channel
