A direct-current current-voltage (DCIV) method enables rapid evaluation of the degradation of deep-submicron nMOSTs and pMOSTs under channel hot carrier stress resulting from a p/n junction forward biased at a safe operating voltage level....http://www.google.com/patents/US6275059?utm_source=gb-gplus-sharePatent US6275059 - Method for testing and diagnosing MOS transistors
