An internal voltage generating circuit is utilized to perform a TDBI (Test During Burn-in) operation for a semiconductor device. The internal voltage generating circuit produces an internal voltage at a high voltage level, as an internal voltage, in not only a standby section but also in an active section...http://www.google.com/patents/US7977966?utm_source=gb-gplus-sharePatent US7977966 - Internal voltage generating circuit for preventing voltage drop of internal voltage
