An arrangement and a method are provided for replacing defective units, which can be any desired unit of a chip (e.g., arithmetic and logic units), with a function unit. The arrangement and the method provide for performing self-tests more easily, less expensively and before or during a running of an...http://www.google.com/patents/US6697979?utm_source=gb-gplus-sharePatent US6697979 - Method of repairing integrated circuits
