A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode. A probe and method of probing reduces signal distortion and power dissipation by transmitting a modulated signal to the device-under-test through an impedance matching resistor...http://www.google.com/patents/US20050024069?utm_source=gb-gplus-sharePatent US20050024069 - Probe for combined signals
