State of test points on an integrated circuit are encapsulated in a telemetry frame that is wirelessly conveyed to a test system. Test points may be logic levels or analog levels converted into representative multi-bit values. Conveyance off the circuit may be by radio frequency or optical emission....http://www.google.com/patents/US6865503?utm_source=gb-gplus-sharePatent US6865503 - Method and apparatus for telemetered probing of integrated circuit operation
