An IC testing apparatus excels in giving a DUT a unified press force toward a contact portion, which carries out a test by pressing input/output terminals of the DUT against contact pins 51 of a test head, and comprises a pusher base 34 provided movably and close to but away from the contact pins 51,...http://www.google.com/patents/US6304073?utm_source=gb-gplus-sharePatent US6304073 - IC testing apparatus
