(12) United States Patent ao) Patent No.: Us 7,123,022 B2
Parker et al. (45) Date of Patent: Oct. 17,2006
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5,420,500 A 5/1995 Kerschner
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* cited by examiner
Primary Examiner—Walter Benson
A device for enabling testing of electrical paths through a circuit assembly is presented. The device may include a non-contact connector test probe for a testing a connector of the circuit assembly. A method for testing continuity of electrical paths through a circuit assembly is presented. In the method, one or more nodes of the circuit assembly are stimulated, connector pins of a connector on the circuit assembly are capacitively coupled to a non-contact connector test probe, and an electrical characteristic is measured by a tester coupled to the non-contact connector test probe to determine continuity of electrical paths through the circuit assembly.
7 Claims, 9 Drawing Sheets