Prior Publication Data
US 2007/0094561 Al Apr. 26, 2007
U.S. CI 714/739; 714/738
Field of Classification Search 714/739,
See application file for complete search history.
U.S. PATENT DOCUMENTS
* cited by examiner
Abramovici, Miron et al. "Digital Systems Testing and Testable Design". IEEE Press 1990 *
Primary Examiner—Kevin L Ellis
Assistant Examiner—Steve Nguyen
(74) Attorney, Agent, or Firm—Klarquist Sparkman LLP
As described herein, circuit testing algorithms, or portions thereof, can be executed in a distributed manner so that their execution can be over a network of processors. In one aspect, the results that are obtained by such distributed execution are ensured to be consistent with the results that would be obtained by executing them in a non-distributed manner. Thus, in one aspect, the algorithms, or portions thereof, have to be made distributable. The algorithms, or portions thereof, are made distributable by isolating any random number generation therewith to be independent of each other. This isolation applies to any random number generation associated with different call instances of the same algorithm as well. In one aspect, the isolation is accomplished by ensuring that the calculation of random number sequences for the algorithms, or portions thereof, is not dependent on random number sequences calculated for the others or between call instances of the same algorithm.
8 Claims, 14 Drawing Sheets