RFID system utilizing parametric reflective technology

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US007460014B2

United States Patent

Pettus

(io) Patent No.: (45) Date of Patent:

US 7,460,014 B2 Dec. 2, 2008

RFID SYSTEM UTILIZING PARAMETRIC
REFLECTIVE TECHNOLOGY

Inventor: Michael Gregory Pettus, Aptos, CA
(US)

Assignee: Vubiq Incorporated, Aliso Viejo, CA
(US)

Notice: Subject to any disclaimer, the term of this patent is extended or adjusted under 35 U.S.C. 154(b) by 462 days.

Appl.No.: 11/158,624

Filed: Jun. 21, 2005

Prior Publication Data

US 2005/0280504 Al Dec. 22, 2005

Related U.S. Application Data

Provisional application No. 60/581,384, filed on Jun. 22, 2004.

Int. CI.

G08B 13/14 (2006.01)

U.S. CI 340/572.1; 340/572.4; 340/539.1;

340/10.1; 340/825.69; 340/825.72; 235/436;

235/462.13

Field of Classification Search 340/572.1,

340/572.4, 10.1, 10.4, 825.52, 825.54, 825.69, 340/825.72, 539.1; 235/380, 381, 436, 462.13, 235/489, 492, 487 See application file for complete search history.

References Cited

U.S. PATENT DOCUMENTS

340/572.5

A system and method for encoding and decoding information by use of radio frequency antennas. The system includes one or more interrogator devices and RFID data tags. The RFID data tags include a plurality of antenna elements which are formed on a substrate or directly on an object. The antenna elements are oriented and have dimensions to provide polarization and phase information, whereby this information represents the encoded information on the RFID tag. The interrogator device scans an area and uses radar imaging technology to create an image of a scanned area. The device receives re-radiated RF signals from the antenna elements on the data tags, whereby the data tags are preferably represented on the image. The re-radiated RF signals preferably include polarization and phase information of each antenna element, whereby the information is utilized using radar signal imaging algorithms to decode the information on the RF data tag.

10 Claims, 10 Drawing Sheets

DOCUMENTS

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FOREIGN PATENT DOCUMENTS

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OTHER PUBLICATIONS

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* cited by examiner