ELECTRONIC IMAGE ANALYZING METHOD AND APPARATUS
 Inventors: Siamac Faani; Ralph M. Chambers, Jr., both of Ferguson; Jack R. Obst, Florissant; Robert L. Klamm, St.
Charles, all of Mo.
 Assignee: Barry-Wehmiller Company, St.
 Appl. No.: 636,440
 Filed: Dec. 1,1975
 Int. CU H04N 7/18
 U.S. CI 358/106; 358/107;
 Field of Search 178/6, 6.8, DIG. 37,
178/DIG. 33; 235/92 MT, 92 DN, 92 CA;
356/168; 250/563; 358/106, 107
 References Cited
U.S. PATENT DOCUMENTS
2,798,605 7/1957 Richards 178/6
3,740,466 6/1973 Marshall 178/6.8
3,751,582 8/1973 Wernikoff 358/257
3,777,169 12/1973 Walter 178/DIG. 37
3,836,710 9/1974 Takahashi 178/DIG. 33
3,932,703 1/1976 Bolsey 178/6.8
3,936,800 2/1976 Ejiri 178/DIG. 33
3,958,078 5/1976 Fowler 178/6.8
3,969,577 7/1976 Lloyd 358/136
4,002,823 1/1977 Van Oosterhout 358/106
4,006,296 2/1977 Peterson 358/106
Primary Examiner—Howard W. Britton
Attorney, Agent, or Firm—Gravely, Lieder & Woodruff
An electronic image analyzer which is adapted to inspect a given transparent object or a succession of similar objects by producing an illuminated image of the object on a photoelectronic sensor which is then electronically scanned for the purpose of inspecting the image within an electronic look window having the shape of a standard object contour, the shape having been previously stored electronically and capable of being called out through suitable circuits so as to be superimposed on the image. Further, arbitrarily shaped masks may be generated separately or in combination and superimposed on portions of the image within said electronic look window so as to obscure areas which interfere with the inspection process of other areas. Further, the analyzer may be adapted to compare the physical characteristics of a succession of dissimilar objects by superimposing the electronic look window on the images of the objects and rejecting those objects whose shapes or sizes do not conform with the stored standard contour information.
24 Claims, 12 Drawing Figures