(54) METHOD AND APPARATUS FOR STORING FAILING PART LOCATIONS IN A MODULE
(75) Inventors: David E. Charlton, Star, ID (US);
Sovandy N. Prak, Meridian, ID (US);
Keith E. Robinson, Caldwell, ID (US)
(73) Assignee: Micron Technology, Inc., Boise, ID
( * ) Notice: Subject to any disclaimer, the term of this patent is extended or adjusted under 35 U.S.C. 154(b) by 845 days.
This patent is subject to a terminal disclaimer.
(21) Appl.No.: 11/725,292
(22) Filed: Mar. 19, 2007
(65) Prior Publication Data
US 2007/0288805 Al Dec. 13, 2007
Related U.S. Application Data
(63) Continuation of application No. 09/548,826, filed on Apr. 13, 2000, now Pat. No. 7,269,765.
A non-volatile storage device on a memory module comprising a plurality of memory devices is used to store the locations of defective parts on the memory module, such as data query ("DQ") terminals, identified during a testing procedure. After testing, the non-volatile storage device, such as an electrically erasable programmable read only memory ("EEPROM"), may be accessed to determine specific memory devices such as dynamic random access memory ("DRAM") which need to be repaired or replaced rather than re-testing the specific memory module.
17 Claims, 2 Drawing Sheets