United States Patent  [li] Patent Number: 4,975,079
Beaman et al.  Date of Patent: Dec. 4, 1990
 CONNECTOR ASSEMBLY FOR CHIP TESTING
 Inventors: Brian S. Beaman, Hyde Park; Keith E. Fogel, Bardonia; Jungihl Kim, Chappaqua; Wolfgang Mayr, Poughkeepsie, all of N.Y.; Jane M. Shaw, Ridgefield, Conn.; George F. Walker, New York, N.Y.
 Assignee: International Business Machines Corp., Armonk, N.Y.
 Appl. No.: 485,016
 Filed: Feb. 23, 1990
 Int. CI.* H01R 11/18
 U.S. CI 439/482; 324/158 P
 Field of Search 439/55, 65, 68, 69,
439/70, 71, 66, 482; 324/158 P, 158 F
 References Cited
U.S. PATENT DOCUMENTS
3,680,037 7/1972 Nellis et al 439/591
3,862,790 1/1975 Davies et al 439/66
4,373,778 2/1983 Adham 439/487
FOREIGN PATENT DOCUMENTS 3151933A1 12/1981 Fed. Rep. of Germany .
An electrical connector is described for making contact with a plurality of convex and deformable contacts on an electronic device. The electrical connector comprises a substrate having a plurality of conductors which extend above its surface. A polymeric material is disposed on the surface of the substrate and has openings which expose the conductors, each opening sized to receive one of the convex, deformable contacts, and to enable electrical connection between the exposed conductors and the deformable contacts. A mechanism is provided for urging the deformable contacts on the electronic device against the exposed conductors. The mechanism exerts sufficient force between the device and the conductors to cause some deformation of the convex contact areas by the conductors.
10 Claims, 3 Drawing Sheets