(12) United States Patent ao) Patent No.: Us 7,551,274 Bi
Wornsonetal. (45) Date of Patent: Jun. 23,2009
(54) DEFECT DETECTION LIGHTING SYSTEM AND METHODS FOR LARGE GLASS SHEETS
(75) Inventors: Douglas P Wornson, Northfield, MN (US); Mark M Wornson, Dundas, MN (US); Eric L Hegstrom, Tucson, AZ (US)
(73) Assignee: Lite Sentry Corporation, Dundas, MN (US)
( * ) Notice: Subject to any disclaimer, the term of this patent is extended or adjusted under 35 U.S.C. 154(b) by 199 days.
(21) Appl.No.: 11/680,549
(22) Filed: Feb. 28, 2007
(51) Int. CI.
G01N 21/00 (2006.01)
(52) U.S. CI 356/239.1; 356/429
(58) Field of Classification Search 356/429,
356/239.1; 250/559.4; 348/86 See application file for complete search history.
(56) References Cited
U.S. PATENT DOCUMENTS
6,359,686 Bl 3/2002 Ariglio
6,437,312 Bl* 8/2002 Adleretal 250/216
6,437,351 Bl* 8/2002 Smicketal 250/492.21
6,437,357 Bl 8/2002 Weiss
6,616,393 Bl 12/2002 Paul
6,570,651 Bl 5/2003 Haubold
6,628,379 Bl * 9/2003 Sudo et al 356/237.1
6,683,695 Bl 1/2004 Simpson
6,704,441 Bl 3/2004 Inaguki
6,757,058 Bl* 6/2004 Carman et al 356/237.2
6,985,231 B2 1/2006 Redner
7,345,698 B2 * 3/2008 Abbott et al 348/86
2002/0005892 Al * 1/2002 Herre 348/86
2004/0207839 Al 10/2004 Gerstner et al.
FOREIGN PATENT DOCUMENTS
WO WO2005/073698 Al 8/2005
WO WO2005/116616 Al 12/2005
WO WO2006/121699 Al 12/2005
* cited by examiner
Primary Examiner—Tarifur Chowdhury
Assistant Examiner—Michael Lapage
(74) Attorney, Agent, or Firm—Edward Week
